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    • 1. 发明授权
    • Analog quantity display method, analog quantity measuring method, and digital/analog display type measuring instrument
    • 模拟量显示方法,模拟量测量方法以及数字/模拟显示型测量仪
    • US06412187B1
    • 2002-07-02
    • US09480998
    • 2000-01-11
    • Koji SasakiYoshitaka KujiYuichi IchikawaMikio SuzukiNorihide TsuyukiHiroyuki Ohta
    • Koji SasakiYoshitaka KujiYuichi IchikawaMikio SuzukiNorihide TsuyukiHiroyuki Ohta
    • G01B322
    • G01B3/004G01D7/002
    • The present invention provides an analog quantity display method of counting displacement of a probe disposed in contact with an object to be measured and analog-displaying the obtained count value by an analog display section as an analog quantity. If a peak value of the count value exceeds a possible analog-display range of the analog display section, an offset provided for the analog-displayed count value is updated in such a manner that the peak value is displayed within the possible analog-display range. Further, an analog quantity measuring method is provided, which comprises counting displacement of the probe, compares the obtained count value with a peak value of the count value, holds the count value as a new peak value depending upon a result of the comparison, and executes the comparison and the holding of the peak value again if the difference between the present peak value and the present count value exceeds a predetermined value. The analog quantity display and measuring methods are applicable to a digital/analog display type measuring instrument comprising a counter for counting the displacement of the probe in contact with the measured object, a digital display section for digitally displaying the count value, and an analog display section located adjacent to the digital display section, for displaying the count value as the bar graph comprising the large number of analog bars arranged in juxtaposition in one direction.
    • 本发明提供了一种模拟量显示方法,用于计数与待测物体接触的探针的位移,并以模拟量模拟显示所获得的计数值。 如果计数值的峰值超过模拟显示部分的可能的模拟显示范围,则为模拟显示的计数值提供的偏移被更新,使得峰值显示在可能的模拟显示范围内 。 此外,提供了一种模拟量测量方法,其包括计数探头的位移,将获得的计数值与计数值的峰值进行比较,根据比较结果将计数值保持为新的峰值,以及 如果当前峰值和当前计数值之间的差值超过预定值,则再次执行比较和峰值保持。 模拟量显示和测量方法适用于数字/模拟显示型测量仪器,其包括用于计数与测量对象接触的探头的位移的计数器,用于数字显示计数值的数字显示部分和模拟显示器 位于与数字显示部分相邻的部分,用于将计数值显示为包括以一个方向并列排列的大量模拟条的条形图。
    • 4. 发明授权
    • IC card and its manufacturing method
    • IC卡及其制造方法
    • US06554194B1
    • 2003-04-29
    • US09391089
    • 1999-09-16
    • Koji SasakiNaoto SaitoHideo MiuraHiroyuki OhtaKunio MatsumotoRyozo Yoshino
    • Koji SasakiNaoto SaitoHideo MiuraHiroyuki OhtaKunio MatsumotoRyozo Yoshino
    • G06K1906
    • G06K19/07728G06K19/077
    • An IC card has an IC chip and a circuit layer formed between layers of a base material that are adhered together by an adhesive. The IC card has a thickness of 0.25 to 0.76 mm and therefore the thickness of the IC chip needs to be about 0.2 mm, which requires grinding of the IC chip. In use, the IC card is subject to bending forces which apply a bending stress on the chip. In the process of grinding the IC chip, grinding flaws having sharp parts arise that reduce the bending strength of the chip. Also, during the dicing process of the wafer, chipping occurs that results in notches having sharp tip parts being formed in the chip. The grinding flaws that result from the grinding and the notches that result from the chipping are etched to remove their sharpness, which occurs at the tip part of the grinding flaw or the tip part of the notch. By rounding these sharp parts through the etching step, the bending strength of the IC chip increases and the durability of the IC card is ensured.
    • IC卡具有通过粘合剂粘合在一起的基底材料层之间形成的IC芯片和电路层。 IC卡的厚度为0.25〜0.76mm,因此IC芯片的厚度需要为0.2mm左右,需要研磨IC芯片。 在使用中,IC卡受到在芯片上施加弯曲应力的弯曲力。 在研磨IC芯片的过程中,产生具有尖锐部分的研磨缺陷会降低芯片的弯曲强度。 此外,在晶片的切割处理期间,发生切屑,导致在芯片中形成具有尖锐尖端部分的凹口。 由研磨产生的磨削缺陷和由切屑引起的切口被蚀刻以去除其在磨削缺口的尖端部分或凹口的尖端部分发生的锋利度。 通过蚀刻步骤对这些尖锐部分进行四舍五入,IC芯片的弯曲强度增加,并且确保了IC卡的耐久性。