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1. 发明授权

US07801070B2 Mobile communication system, mobile terminal transfer device, and mobile communication method 有权
标题翻译：移动通信系统，移动终端传输设备和移动通信方式
公开(公告)号：US07801070B2
公开(公告)日：2010-09-21
申请号：US10677386
申请日：2003-10-03
申请人： Koji Omae , Ryoichi Kobayashi , Hideaki Takahashi , Takehiro Ikeda , Masahiro Inoue , Ichiro Okajima , Narumi Umeda
发明人： Koji Omae , Ryoichi Kobayashi , Hideaki Takahashi , Takehiro Ikeda , Masahiro Inoue , Ichiro Okajima , Narumi Umeda
IPC分类号： H04B7/14 , H04L12/28 , H04L12/56
CPC分类号： H04W40/02 , H04W8/02 , H04W8/065 , H04W8/085 , H04W36/0011 , H04W48/16 , H04W80/00 , H04W80/04 , Y02D70/30
摘要： A mobile communication system comprises a plurality of transfer devices configured to transfer packets to a visited position of a mobile terminal, a plurality of connection management devices arranged in a network and configured to connect to the mobile terminal, and a mobile terminal including a detection unit configured to detect the transfer device, and a communication unit configured to connect to the connection management device, and transmit/receive packets to/from the transfer device detected by the detection unit via the connection management device.
摘要翻译：一种移动通信系统，包括被配置为将分组传送到移动终端的访问位置的多个传送设备，布置在网络中并被配置为连接到移动终端的多个连接管理设备，以及包括检测单元的移动终端被配置为检测所述传送设备，以及通信单元，被配置为连接到所述连接管理设备，以及经由所述连接管理设备向所述检测单元检测到的传送设备发送/接收分组。

2. 发明申请

US20090179605A1 Resolver Abnormality Detection Circuit 审中-公开
标题翻译：分解异常检测电路
公开(公告)号：US20090179605A1
公开(公告)日：2009-07-16
申请号：US12350567
申请日：2009-01-08
申请人： Nobuyasu KANEKAWA , Ryoichi Kobayashi , Tomonobu Koseki
发明人： Nobuyasu KANEKAWA , Ryoichi Kobayashi , Tomonobu Koseki
IPC分类号： H02P6/12 , G01R31/02
CPC分类号： G01D5/24461 , G01D5/20
摘要： An abnormality detection circuit for a resolver outputs a rotation angle signal corresponding to a rotation angle of a rotor from a resolver winding. In the abnormality detection circuit, the resolver abnormality detection circuit applies a specified signal to one terminal of the resolver winding, determines whether the specified signal is superimposed on the rotation angle signal outputted by an other terminal of the resolver winding, and detects abnormalities of the resolver based on results of the determination.
摘要翻译：用于分解器的异常检测电路从旋转变压器绕组输出对应于转子旋转角度的旋转角度信号。在异常检测电路中，解算器异常检测电路对分解器绕组的一个端子施加规定的信号，判定指定信号是否叠加在旋转变压器绕组的另一端子输出的旋转角度信号上，基于确定结果的解算器。

3. 发明授权

US07169961B2 Process for producing low polymer of α-olefin 有权
标题翻译：生产α-烯烃低聚物的方法
公开(公告)号：US07169961B2
公开(公告)日：2007-01-30
申请号：US10487728
申请日：2002-08-21
申请人： Ryoichi Kobayashi , Shigeki Kura
发明人： Ryoichi Kobayashi , Shigeki Kura
IPC分类号： C07C2/06
CPC分类号： C08F2/00 , C08F10/00 , C08F10/02 , C08F110/02 , Y10S585/901 , C08F2/06 , C08F2500/02
摘要： A process for producing an α-olefin oligomer by oligomerization of an α-olefin in a presence of a Ziegler-based catalyst, the process comprising introducing at least a portion of a reaction product which is taken out of a reactor and has a temperature of 115° C. or higher into an external heat exchanger, cooling the introduced reaction product, maintaining an oligomerization solution taken out of the external heat exchanger at a temperature of 110° C. or higher and returning at least a portion of the oligomerization solution to the reactor. In the production of an α-olefin oligomer, precipitation and adhesion of polymers at the inside of manufacturing apparatuses such as the external heat exchanger and troubles caused thereby can be prevented and a stable continuous operation can be continued for a long time.
摘要翻译：一种在齐格勒基催化剂存在下通过α-烯烃低聚生产α-烯烃低聚物的方法，该方法包括将至少一部分从反应器中取出的反应产物引入并具有 115℃以上进入外部热交换器，冷却引入的反应产物，将从外部热交换器取出的低聚溶液在110℃以上的温度下保持，并将至少一部分低聚溶液返回到反应堆。在α-烯烃低聚物的制备中，可以防止诸如外部热交换器的制造装置内部的聚合物的沉淀和粘附以及由此引起的故障，并且可以长时间持续稳定的连续操作。

4. 发明授权

US06576721B2 Process for producing low polymer of ethylene 有权
标题翻译：生产乙烯低聚物的方法
公开(公告)号：US06576721B2
公开(公告)日：2003-06-10
申请号：US10182703
申请日：2002-08-07
申请人： Ryoichi Kobayashi , Shigeki Kura
发明人： Ryoichi Kobayashi , Shigeki Kura
IPC分类号： C08F206
CPC分类号： C07C2/30 , C07C2531/12 , Y02P20/584
摘要： There is disclosed a process for producing an ethylenic oligomer which comprises subjecting ethylene to oligomerization reaction in an organic solvent in the presence of a Ziegler based catalyst, and recyclingly using for the oligomerization reaction, the organic solvent separated by distilling the resultant oligomerization reaction product, wherein the water concentration in the oligomerization reaction system is at most 8 ppm by weight, or the concentration of olefins which have at least 3 carbon atoms and which are contained in the organic solvent to be recycled in the oligomerization reaction system is at most 2% by weight. The process of the present invention can maintain the catalytic activity of the catalyst at a high level.
摘要翻译：公开了一种乙烯类低聚物的制造方法，该方法包括在齐格勒型催化剂存在下，使乙烯在有机溶剂中进行低聚反应，再循环使用低聚反应，通过蒸馏生成的低聚反应产物而分离的有机溶剂，其中低聚反应体系中的水浓度为至多8重量ppm，或者在低聚反应体系中待循环的有机溶剂中含有至少3个碳原子的烯烃的浓度为至多2重量％重量。本发明的方法可以将催化剂的催化活性保持在较高的水平。

5. 发明授权

US4911016A Semiconductor strain gauge bridge circuit 失效
标题翻译：半导体应变仪桥式电路
公开(公告)号：US4911016A
公开(公告)日：1990-03-27
申请号：US310018
申请日：1989-02-13
申请人： Atsushi Miyazaki , Ryoichi Kobayashi
发明人： Atsushi Miyazaki , Ryoichi Kobayashi
IPC分类号： G01B7/00 , G01B7/16 , G01D3/028 , G01L1/22 , G01L9/00 , G01L9/06 , H01L41/00
CPC分类号： G01L19/148 , G01L1/2281 , G01L19/0038 , G01L9/0054 , G01L9/065
摘要： A semiconductor strain gauge bridge circuit device is disclosed to include a bridge circuit of semiconductor strain gauges, a first zero-point temperature compensation circuit connected to one of a pair of output terminals of the bridge circuit and including a voltage-dividing resistor circuit generating a voltage substantially equal to a potential appearing at the one output terminal at a predetermined temperature, and a second zero-point temperature compensation circuit connected to the other of the output terminals and including a resistive element having a temperature characteristic similar to that of the semiconductor strain gauges.
摘要翻译：公开了一种半导体应变计桥电路装置，其包括半导体应变计的桥接电路，第一零点温度补偿电路，连接到桥接电路的一对输出端中的一个，并且包括分压电阻电路，电压基本上等于在预定温度下出现在一个输出端子处的电位;以及第二零点温度补偿电路，连接到另一个输出端子，并且包括具有类似于半导体应变的温度特性的电阻元件量规

6. 发明授权

US4813272A Semiconductor pressure sensor 失效
标题翻译：半导体压力传感器
公开(公告)号：US4813272A
公开(公告)日：1989-03-21
申请号：US080102
申请日：1987-07-31
申请人： Atsushi Miyazaki , Ryoichi Kobayashi
发明人： Atsushi Miyazaki , Ryoichi Kobayashi
IPC分类号： H01L29/84 , G01L9/00 , G01L9/04 , G01L9/06 , G01B7/16 , G01L7/08 , G01L9/08
CPC分类号： G01L9/0054 , G01L9/065
摘要： There is a bridge circuit which is driven by a constant-current including a thermistor. The bridge circuit is constituted by strain gages defined by P-type diffused layers. Strain gages which constitute in combination the bridge circuit are defined by diffused resistor layers having a surface impurity concentration which is set so as to fall within the range from 2.3.times.10.sup.18 to 2.5.times.10.sup.18 atoms/cm.sup.3. The B constant of the thermistor is selected so as to fall within the range from 1400K to 2400K.
摘要翻译：存在由包括热敏电阻的恒定电流驱动的桥接电路。桥式电路由由P型扩散层限定的应变计构成。构成桥电路组合的应变片由具有表面杂质浓度设定为在2.3×1018〜2.5×1018原子/ cm3的范围内的扩散电阻层限定。热敏电阻的B常数选择为在1400K至2400K的范围内。

7. 发明授权

US4550612A Integrated pressure sensor 失效
标题翻译：集成压力传感器
公开(公告)号：US4550612A
公开(公告)日：1985-11-05
申请号：US615524
申请日：1984-05-31
申请人： Kazuji Yamada , Shigeyuki Kobori , Satoshi Shimada , Ryosaku Kanzawa , Ryoichi Kobayashi , Hideo Sato
发明人： Kazuji Yamada , Shigeyuki Kobori , Satoshi Shimada , Ryosaku Kanzawa , Ryoichi Kobayashi , Hideo Sato
IPC分类号： G01L9/04 , G01L9/00 , H01L29/84 , G01L9/06
CPC分类号： H01L29/84 , G01L9/0054
摘要： In an integrated pressure sensor, a silicon chip for pressure detection and a substrate for supporting the silicon chip are made of the same material, the silicon chip has a thin diaphragm portion and a peripheral fixed portion thicker than the diaphragm portion, and the silicon chip is bonded to the substrate through a thin insulating film.
摘要翻译：在集成压力传感器中，用于压力检测的硅芯片和用于支撑硅芯片的基板由相同的材料制成，硅芯片具有薄膜部分和比膜部分厚的周边固定部分，硅芯片通过薄的绝缘膜与基板结合。

8. 发明授权

US08738232B2 Electronic control apparatus 有权
标题翻译：电子控制装置
公开(公告)号：US08738232B2
公开(公告)日：2014-05-27
申请号：US13704864
申请日：2011-06-15
申请人： Nobuyasu Kanekawa , Ryoichi Kobayashi , Tomonobu Koseki , Keisuke Honda , Atsushi Uehara
发明人： Nobuyasu Kanekawa , Ryoichi Kobayashi , Tomonobu Koseki , Keisuke Honda , Atsushi Uehara
IPC分类号： B62D6/10 , B62D5/00
CPC分类号： B62D6/08 , B60R16/033 , B62D5/0481 , B62D5/0484 , H02J1/00 , Y02T10/92 , Y10T307/50 , Y10T307/685
摘要： An electronic control apparatus includes a control unit 2; a plurality of power supply units 1-1, 1-2 for supplying the control unit 2 with power; and a power supply fault detector unit 3 for detecting a fault in the plurality of power supply units 1-1, 1-2. The control unit 2 operates in a normal mode on electric power supplied from the plurality of power supply units 1-1, 1-2, when none of the plurality of power supply units 1-1, 1-2 is faulty. If at least one of the plurality of power supply units 1-1, 1-2 is faulty, the control unit 2 operates in an energy saving mode in which less power is consumed on electric power supplied from the power supply unit that remains fully operational. Thereby an electronic control apparatus is obtained that enables continued operation during a faulty condition, while preventing circuit scale, dimensions, weight, and cost from increasing.
摘要翻译：电子控制装置包括控制单元2; 用于向控制单元2供电的多个电源单元1-1,1-2; 以及用于检测多个电源单元1-1,1-2中的故障的电源故障检测器单元3。当多个电源单元1-1,1-2中没有一个发生故障时，控制单元2以正常模式操作从多个电源单元1-1,1-2提供的电力。如果多个电源单元1-1,1-2中的至少一个出现故障，则控制单元2以节能模式工作，其中从供电单元供电的电力消耗的功率较少，该功率保持完全可操作。从而获得能够在故障状态下继续运转的电子控制装置，同时防止电路规模，尺寸，重量和成本增加。

9. 发明授权

US07969229B2 On-chip redundancy high-reliable system and method of controlling the same 有权
标题翻译：片上冗余高可靠系统及其控制方法
公开(公告)号：US07969229B2
公开(公告)日：2011-06-28
申请号：US12389194
申请日：2009-02-19
申请人： Nobuyasu Kanekawa , Ryoichi Kobayashi , Tomonobu Koseki , Katsuya Oyama
发明人： Nobuyasu Kanekawa , Ryoichi Kobayashi , Tomonobu Koseki , Katsuya Oyama
IPC分类号： G06F11/16
CPC分类号： G06F11/1645 , G06F11/1641 , G06F11/165
摘要： A comparator circuit for comparing outputs of an on-chip redundant system is mounted on a second semiconductor chip that is separate from the on-chip redundant system. The second semiconductor chip which preferably contains a power source circuit for supplying power to the on-chip redundant system, a driver circuit for driving an output circuit, and the like are mounted. With this configuration, the influence of a failure occurring in the on-chip redundancy system can be prevented from being exerted on the comparator measure.
摘要翻译：用于比较片上冗余系统的输出的比较器电路安装在与片上冗余系统分离的第二半导体芯片上。优选地，包含用于向片上冗余系统供电的电源电路的第二半导体芯片，用于驱动输出电路的驱动电路等。利用这种配置，可以防止在片上冗余系统中发生的故障对比较器测量的影响。

10. 发明申请

US20100207681A1 ON-CHIP REDUNDANCY HIGH-RELIABLE SYSTEM AND METHOD OF CONTROLLING THE SAME 有权
标题翻译：片上冗余高可靠性系统及其控制方法
公开(公告)号：US20100207681A1
公开(公告)日：2010-08-19
申请号：US12389194
申请日：2009-02-19
申请人： Nobuyasu Kanekawa , Ryoichi Kobayashi , Tomonobu Koseki , Katsuya Oyama
发明人： Nobuyasu Kanekawa , Ryoichi Kobayashi , Tomonobu Koseki , Katsuya Oyama
IPC分类号： G06F11/16
CPC分类号： G06F11/1645 , G06F11/1641 , G06F11/165
摘要： The present invention is directed to improve reliably of an on-chip redundancy system by preventing influence of a physical failure exerted on an entire semiconductor chip. A comparator measure for comparing outputs of an on-chip redundancy system is mounted on a semiconductor chip different from the on-chip redundancy system. The another semiconductor chip is, preferably, mounted on a semiconductor chip on which a power source circuit for supplying power to the on-chip redundancy system redundantly having the comparing function in the chip, a driver circuit for driving an output circuit, and the like are mounted. With the configuration, the influence of a failure occurring in the on-chip redundancy system can be prevented from being exerted on the comparator measure.
摘要翻译：本发明旨在通过防止对整个半导体芯片施加的物理故障的影响来可靠地提高片上冗余系统。用于比较片上冗余系统的输出的比较器测量装置安装在不同于片上冗余系统的半导体芯片上。另一半导体芯片优选地安装在半导体芯片上，在半导体芯片上，用于向片上冗余系统供电的电源电路冗余地具有芯片中的比较功能，用于驱动输出电路的驱动电路等被安装。利用该配置，可以防止在片上冗余系统中发生的故障的影响施加在比较器测量上。

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