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    • 2. 发明授权
    • Memory device, memory module and electronic device
    • 存储设备,内存模块和电子设备
    • US08421081B2
    • 2013-04-16
    • US13331645
    • 2011-12-20
    • Kiyoshi KatoJun KoyamaToshihiko SaitoShunpei Yamazaki
    • Kiyoshi KatoJun KoyamaToshihiko SaitoShunpei Yamazaki
    • H01L21/02
    • H01L27/1156G11C11/404H01L27/1225
    • The first transistor includes first and second electrodes which are a source and a drain, and a first gate electrode overlapping with a first channel formation region with an insulating film provided therebetween. The second transistor includes third and fourth electrodes which are a source and a drain, and a second channel formation region which is provided between a second gate electrode and a third gate electrode with insulating films provided between the second channel formation region and the second gate electrode and between the second channel formation region and the third gate electrode. The first and second channel formation regions contain an oxide semiconductor, and the second electrode is connected to the second gate electrode.
    • 第一晶体管包括作为源极和漏极的第一和第二电极,以及与第一沟道形成区域重叠的第一栅电极,其间设置有绝缘膜。 第二晶体管包括作为源极和漏极的第三和第四电极以及设置在第二栅电极和第三栅极之间的第二沟道形成区,其中设置在第二沟道形成区和第二栅电极之间的绝缘膜 并且在第二通道形成区域和第三栅电极之间。 第一和第二沟道形成区域包含氧化物半导体,并且第二电极连接到第二栅电极。