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1. 发明申请

US20100002838A1 HIGH PRECISION POSTURE CONTROL METHOD OF X-RAY MIRROR 有权
标题翻译： X射线镜的高精度控制方法
公开(公告)号：US20100002838A1
公开(公告)日：2010-01-07
申请号：US12374137
申请日：2007-07-17
申请人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
发明人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
IPC分类号： G21K1/06
CPC分类号： G21K1/06 , G02B5/10
摘要： A high precision posture control method for sustaining the posture of an X-ray optical element constantly at 1 μrad or less. A longitudinal condensation mirror (5) and a lateral condensation mirror, each having a condensation plane band (7) consisting of an elliptical reflective surface, are arranged perpendicularly to each other to form a K-B mirror arrangement. Fresnel mirrors are respectively constituted of a pair of planar reflective surfaces (9, 10) formed in the vicinities of the incident side end and the exit side end of the condensation plane band of each condensation mirror. Interference fringe (13) by the Fresnel mirror of each condensation mirror is independently monitored at a position insusceptible to a condensation beam by the condensation plane band, and variation in interference fringe is detected electrically and its detection signal is used as a feedback signal for posture control of each condensation mirror.
摘要翻译：一种高精度姿态控制方法，用于将X射线光学元件的姿势恒定地维持在1个以下。每个具有由椭圆形反射表面组成的冷凝平面带（7）的纵向冷凝镜（5）和横向冷凝镜彼此垂直布置以形成K-B反射镜装置。菲涅耳镜分别由形成在每个冷凝镜的冷凝平面带的入射侧端部和出射侧端部附近的一对平面反射面（9,10）构成。每个冷凝镜的菲涅尔镜的干涉条纹（13）在凝结平面带不受凝结光束影响的位置独立地监测，并且电磁检测干涉条纹的变化，其检测信号用作姿势的反馈信号控制每个冷凝镜。

2. 发明授权

US07936860B2 X-ray condensing method and its device using phase restoration method 有权
标题翻译： X射线冷凝法及其装置采用相位恢复法
公开(公告)号：US07936860B2
公开(公告)日：2011-05-03
申请号：US12440121
申请日：2007-12-27
申请人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
发明人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
IPC分类号： G21K1/06 , G01D18/00 , G01N23/04
CPC分类号： G21K1/06 , G02B5/0891 , G02B5/10 , G21K2201/067
摘要： An X-ray condensing method and its device are provided with an X-ray mirror that has a wavefront adjustable function to finely adjust a wavefront of a reflecting X-ray, measure an X-ray intensity distribution in the vicinity of a focus, measure an X-ray intensity distribution in the vicinity of the X-ray mirror or use a known X-ray intensity distribution of an incident X-ray, calculate a complex amplitude distribution at the reflective surface by using a phase restoration method from the X-ray intensity distribution in the vicinity of the focus and the X-ray intensity distribution in the vicinity of the reflective surface, calculate a wavefront aberration of an X-ray condensing optical system from the complex amplitude distribution, and control the reflective surface of the X-ray mirror with the wavefront adjustable function so that the wavefront aberration is minimized.
摘要翻译： X射线聚焦方法及其装置设置有具有波前可调功能的X射线镜，以精细地调整反射X射线的波前，测量焦点附近的X射线强度分布，测量在X射线反射镜附近的X射线强度分布或使用已知的入射X射线的X射线强度分布，通过使用来自X射线透镜的相位恢复方法计算出反射面上的复振幅分布，在焦点附近的射线强度分布和反射面附近的X射线强度分布，从复振幅分布计算出X射线聚光光学系统的波前像差，并控制X的反射面具有波前可调功能的光镜，使波前像差最小化。

3. 发明申请

US20100183122A1 X-RAY CONDENSING METHOD AND ITS DEVICE USING PHASE RESTORATION METHOD 有权
标题翻译： X射线冷凝方法及其使用相位恢复方法的装置
公开(公告)号：US20100183122A1
公开(公告)日：2010-07-22
申请号：US12440121
申请日：2007-12-27
申请人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
发明人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
IPC分类号： G21K1/06
CPC分类号： G21K1/06 , G02B5/0891 , G02B5/10 , G21K2201/067
摘要： An X-ray condensing method and its device are provided with an X-ray mirror that has a wavefront adjustable function to finely adjust a wavefront of a reflecting X-ray, measure an X-ray intensity distribution in the vicinity of a focus, measure an X-ray intensity distribution in the vicinity of the X-ray mirror or use a known X-ray intensity distribution of an incident X-ray, calculate a complex amplitude distribution at the reflective surface by using a phase restoration method from the X-ray intensity distribution in the vicinity of the focus and the X-ray intensity distribution in the vicinity of the reflective surface, calculate a wavefront aberration of an X-ray condensing optical system from the complex amplitude distribution, and control the reflective surface of the X-ray mirror with the wavefront adjustable function so that the wavefront aberration is minimized.
摘要翻译： X射线聚焦方法及其装置设置有具有波前可调功能的X射线镜，以精细地调整反射X射线的波前，测量焦点附近的X射线强度分布，测量在X射线反射镜附近的X射线强度分布或使用已知的入射X射线的X射线强度分布，通过使用来自X射线透镜的相位恢复方法计算出反射面上的复振幅分布，在焦点附近的射线强度分布和反射面附近的X射线强度分布，从复振幅分布计算出X射线聚光光学系统的波前像差，并控制X的反射面具有波前可调功能的光镜，使波前像差最小化。

4. 发明授权

US08744046B2 Method and apparatus of precisely measuring intensity profile of X-ray nanobeam 有权
标题翻译：精确测量X射线纳米粒子强度分布的方法和装置
公开(公告)号：US08744046B2
公开(公告)日：2014-06-03
申请号：US13203095
申请日：2009-03-19
申请人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
发明人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
IPC分类号： G01N23/20
CPC分类号： G01N23/201 , G21K2201/06 , G21K2207/00
摘要： Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector.
摘要翻译：提供了一种精确测量x射线nanobeam的强度分布的方法和装置，其可以用一个刀刃测量具有不同波长的x射线，并且可以执行对应于x射线束的焦深的最佳测量以及使用暗场测量方法的其他测量装置的条件，其能够使用刀刃精确测量X射线束的轮廓并使用衍射和透射的x射线。刀刃（4）由重金属形成，其使穿过其的X射线的相位前进，并且以这样的方式制造，使得厚度可以在纵向方向上连续地或以逐步的方式改变。刀刃（4）被设定为使得X射线束可以在这样的厚度位置处横穿刀刃（4），以在其中透射的x射线和衍射的X射线衍射的范围内实现相移在刀刃的端部可以彼此加强，并且通过x射线检测器测量衍射X射线和透射的X射线的叠加X射线。

5. 发明申请

US20110305317A1 METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM 有权
标题翻译： X射线纳米粒子精密测量强度分布的方法与装置
公开(公告)号：US20110305317A1
公开(公告)日：2011-12-15
申请号：US13203095
申请日：2009-03-19
申请人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
发明人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
IPC分类号： G01N23/207
CPC分类号： G01N23/201 , G21K2201/06 , G21K2207/00
摘要： Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge (4) is formed of a heavy metal which advances the phase of an x-ray passing therethrough and is fabricated in such a manner that the thickness may change in the longitudinal direction continuously or in a stepwise fashion. The knife edge (4) is so set that an x-ray beam may traverse the knife edge (4) at such a thickness position as to achieve a phase shift in a range wherein a transmitted x-ray and a diffracted x-ray diffracted at the end of the knife edge may reinforce each other, and a superposed x-ray of the diffracted x-ray and the transmitted x-ray is measured by an x-ray detector.
摘要翻译：提供了一种精确测量x射线nanobeam的强度分布的方法和装置，其可以用一个刀刃测量具有不同波长的x射线，并且可以执行对应于x射线束的焦深的最佳测量以及使用暗场测量方法的其他测量装置的条件，其能够使用刀刃精确测量X射线束的轮廓并使用衍射和透射的x射线。刀刃（4）由重金属形成，其使穿过其的X射线的相位前进，并且以这样的方式制造，使得厚度可以在纵向方向上连续地或以逐步的方式改变。刀刃（4）被设定为使得X射线束可以在这样的厚度位置处横穿刀刃（4），以在其中透射的x射线和衍射的X射线衍射的范围内实现相移在刀刃的端部可以彼此加强，并且通过x射线检测器测量衍射X射线和透射的X射线的叠加X射线。

6. 发明授权

US08000443B2 High precision posture control method of X-ray mirror 有权
标题翻译： X射线镜高精度姿态控制方法
公开(公告)号：US08000443B2
公开(公告)日：2011-08-16
申请号：US12374137
申请日：2007-07-17
申请人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
发明人： Kazuto Yamauchi , Hidekazu Mimura , Hiromi Okada
IPC分类号： G21K1/08 , G02B5/08 , G02B7/182
CPC分类号： G21K1/06 , G02B5/10
摘要： A high precision posture control method for sustaining the posture of an X-ray optical element constantly at 1 μrad or less. A longitudinal condensation mirror and a lateral condensation mirror, each having a condensation plane band consisting of an elliptical reflective surface, are arranged perpendicularly to each other to form a K-B mirror arrangement. Fresnel mirrors are respectively constituted of a pair of planar reflective surfaces formed in the vicinities of the incident side end and the exit side end of the condensation plane band of each condensation mirror. Interference fringe by the Fresnel mirror of each condensation mirror is independently monitored at a position insusceptible to a condensation beam by the condensation plane band, and variation in interference fringe is detected electrically and its detection signal is used as a feedback signal for posture control of each condensation mirror.
摘要翻译：一种用于将X射线光学元件的姿势持续保持在1μrad以下的高精度姿势控制方法。每个具有由椭圆形反射表面组成的冷凝平面带的纵向冷凝镜和横向冷凝镜彼此垂直布置以形成K-B反射镜装置。菲涅尔镜分别由形成在每个冷凝镜的冷凝平面带的入射侧端和出射侧端附近的一对平面反射表面构成。每个冷凝镜的菲涅耳镜的干涉条纹在冷凝平面带不受凝结光束影响的位置处被独立地监测，并且电磁检测干涉条纹的变化，其检测信号用作每个冷凝镜的姿势控制的反馈信号冷凝镜。

7. 发明授权

US5405129A Detecting device for detecting presence of items in a multiple supply arrangement 失效
标题翻译：用于检测多个供应装置中的物品的存在的检测装置
公开(公告)号：US5405129A
公开(公告)日：1995-04-11
申请号：US147223
申请日：1993-11-03
申请人： Takashi Mihara , Seiji Kikuchi , Masaki Tsuchiya , Junichiro Higuma , Hiromi Okada
发明人： Takashi Mihara , Seiji Kikuchi , Masaki Tsuchiya , Junichiro Higuma , Hiromi Okada
IPC分类号： B65H7/02 , B65H1/28 , B65H7/04 , G01V9/00 , G03G15/00 , B65H7/08 , B65H3/44
CPC分类号： B65H1/28 , B65H7/04 , B65H2511/212 , B65H2511/51 , B65H2553/612
摘要： A detecting device is adapted for detecting the presence of an item and includes a shaft rotatably supported on a frame, a first contacting member attached to the shaft and operable to come into contact with an item; a second contacting member attached to the shaft and operable to come into contact with an item, the second contacting member being spaced away from the first contacting member in an axial direction of the shaft by a specified distance, a pivotal member, a detector for detecting whether the pivotal member is at a specified detecting position, and a transmission device for transmitting a rotation of either the first or second contacting member to the pivotal member to rotate the pivotal member to the specified detecting position.
摘要翻译：一种检测装置，用于检测物品的存在，并且包括可旋转地支撑在框架上的轴;第一接触构件，其附接到所述轴并可操作以与物品接触; 第二接触构件，其附接到所述轴并且可操作以与物品接触，所述第二接触构件在所述轴的轴向方向上与所述第一接触构件间隔开特定距离，枢转构件，用于检测的检测器枢轴构件是否在指定的检测位置，以及传动装置，用于将第一或第二接触构件的旋转传递到枢转构件，以将枢转构件旋转到指定的检测位置。

8. 发明授权

US5107131A Method and apparatus for edge detection of transparent films 失效
标题翻译：用于边缘检测透明膜的方法和装置
公开(公告)号：US5107131A
公开(公告)日：1992-04-21
申请号：US528509
申请日：1990-05-25
申请人： Hiromi Okada , Masuo Kabutomori , Hiroshi Ikeno , Tamio Saitou
发明人： Hiromi Okada , Masuo Kabutomori , Hiroshi Ikeno , Tamio Saitou
IPC分类号： G01B11/00 , B65H7/14 , B65H23/02 , B65H23/188 , B65H26/02 , G01N21/21 , G01V8/10
CPC分类号： B65H23/0216 , G01N21/21 , B65H2557/516 , B65H2701/1712
摘要： A method for detection of the edge and/or shape of transparent films, wherein the incident rays from a light source enter a polarizer to yield the linearly polarized light for irradiation to a transparent film with a property of rotatory polarization, and the rotatorily polarized light therefrom is transmitted through an analyzer with a polarization axis orthogonal to that of the polarizer, allowing the transmitted light to indicate the edge position and/or shape of the transparent film. An apparatus for detection of the edge and/or shape of transparent films, which is furnished with a polarizer, analyzer and detector to utilize the property of rotatory polarization of a transparent film placed between the polarizer and the analyzer, wherein the polarizer linearly polarizes the incident rays from a light source, emitting the light to be fed to the analyzer, a polarization axis of which is orthogonal to that of the polarizer, and the detector recognizes the output of the analyzer.
摘要翻译：一种用于检测透明膜的边缘和/或形状的方法，其中来自光源的入射光线进入偏振器以产生用于照射具有旋转偏振性的透明膜的线性偏振光，并且旋转偏振光通过分析仪透射具有与偏振片的偏振轴正交的偏振轴，允许透射光指示透明膜的边缘位置和/或形状。一种用于检测透明膜的边缘和/或形状的装置，其配备有偏振器，分析器和检测器，以利用位于偏振器和分析器之间的透明膜的旋转偏振特性，其中偏振器线性偏振来自光源的入射光，发射要馈送到分析器的光，其偏振轴与偏振片的偏振轴正交，并且检测器识别分析仪的输出。

9. 发明申请

US20120083029A1 ROTATING CULTURE VESSEL AND AUTOMATIC CELL CULTURE APPARATUS USING SAME 审中-公开
标题翻译：旋转文化船和使用相同的自动细胞培养装置
公开(公告)号：US20120083029A1
公开(公告)日：2012-04-05
申请号：US13375606
申请日：2010-06-09
申请人： Takashi Tsumura , Hiromi Okada , Toshimasa Uemura , Yoshimi Oyabu
发明人： Takashi Tsumura , Hiromi Okada , Toshimasa Uemura , Yoshimi Oyabu
IPC分类号： C12M1/10
CPC分类号： C12M21/08 , C12M27/10 , C12M27/12
摘要： Disclosed is a rotating culture vessel based on a rotating culture technology using an RWV, by which cell seeding, liquid medium exchange, quality control and so on can be automated and degassing can be conducted simultaneously with liquid medium exchange without disturbing the cells under culture. Also disclosed is an automatic cell culture apparatus using the same. A rotating culture vessel, which contains cells and a liquid culture medium, to be attached to a horizontal rotating shaft of a rotating culture device to three-dimensionally culture the cells, wherein one or more inlets/outlets for supplying cells and a liquid culture medium at the early stage and then taking out the cultured cells, are formed at appropriate position of a flat cylindrical culture container; at least one pair of a supply port and a discharge port for liquid medium exchange is provided on the outer circumferential cylindrical face of the culture container.
摘要翻译：公开了一种基于使用RWV的旋转培养技术的旋转培养容器，其可以自动进行细胞接种，液体培养基交换，质量控制等，并且可以与液体培养基交换同时进行脱气，而不会干扰培养下的细胞。还公开了使用该细胞培养装置的自动细胞培养装置。一种旋转培养容器，其包含细胞和液体培养基，附着到旋转培养装置的水平旋转轴上以三维培养细胞，其中一个或多个用于供应细胞的入口/出口和液体培养基在早期阶段，然后取出培养的细胞，在平坦的圆筒培养容器的适当位置形成; 在培养容器的外周圆筒面上设置至少一对供给口和液体介质更换用排出口。

10. 发明授权

US5532731A Method and apparatus for adjusting image forming positions to allow plural images to be formed on plural recording sheets 失效
标题翻译：用于调整图像形成位置以允许在多个记录片材上形成多个图像的方法和装置
公开(公告)号：US5532731A
公开(公告)日：1996-07-02
申请号：US156896
申请日：1993-11-24
申请人： Takashi Mihara , Masaki Tsuchiya , Junichiro Higuma , Seiji Kikuchi , Hiromi Okada
发明人： Takashi Mihara , Masaki Tsuchiya , Junichiro Higuma , Seiji Kikuchi , Hiromi Okada
IPC分类号： B41J2/44 , G02B26/10 , G03G15/04 , H04N1/053 , H04N1/113 , H04N1/12 , H04N1/203 , H04N1/21
CPC分类号： H04N1/2038 , H04N1/053 , H04N1/203 , H04N1/1135 , H04N1/12 , H04N2201/0471 , H04N2201/04755 , H04N2201/04786
摘要： The present invention is applied to an apparatus in which laser light corresponding to images to be formed scans a photoconductor at an approximately constant velocity in order to write a plurality of images arranged along a scanning direction of the laser light, in parallel. A scanning velocity of the laser light is varied to adjust a writing position of the image to be written last among the plurality of images by the laser light.
摘要翻译：本发明应用于其中对应于要形成的图像的激光以大致恒定的速度扫描光电导体以平行地沿着激光的扫描方向写入多个图像的装置。改变激光的扫描速度，以通过激光调整多个图像中最后写入的图像的写入位置。

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