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1. 发明授权

US5738048A Cooling apparatus for cooling an engine 失效
标题翻译：用于冷却发动机的冷却装置
公开(公告)号：US5738048A
公开(公告)日：1998-04-14
申请号：US791776
申请日：1997-01-29
申请人： Kazutaka Suzuki , Yasutoshi Yamanaka , Yoshimitsu Inoue , Hiroyuki Fukunaga
发明人： Kazutaka Suzuki , Yasutoshi Yamanaka , Yoshimitsu Inoue , Hiroyuki Fukunaga
IPC分类号： F01P7/16 , F16K11/16 , F01P7/14
CPC分类号： F01P7/167 , F01P2023/08 , F01P2025/04 , F01P2025/32 , F01P2070/06
摘要： According to the present invention, the cooling apparatus is equipped with a thermostat for opening or closing a water passage between a radiator and a water-cooled engine and a cooling water passage switching valve for switching a water introducing passage for introducing the cooling water around a thermosensitive member of the thermostat. When the engine is in a high-load operating condition and when the temperature of the cooling water is equal to or higher than a predetermined temperature, the cooling water immediately after having flowed out of the water-cooled engine flows into around the thermosensitive member of the thermostat by the operation of the cooling water passage switching valve. As a result, the thermostat is operated in response to the temperature of the high temperature cooling water having flowed out of the water-cooled engine, and the set temperature of the cooling water by the thermostat can be shifted to a lower temperature. In this way, it is possible to prevent preferably an excessive rise in the temperature of the cooling water not only when the engine is in a high-load operating condition but also when the engine is in a state of hot soak such as in idling after the vehicle has travelled on an upward slope with a low speed.
摘要翻译：根据本发明，冷却装置配备有用于打开或关闭散热器和水冷发动机之间的水通道的恒温器和用于切换用于将冷却水引入周围的冷却水引入的冷却水通道切换阀恒温器的热敏元件。当发动机处于高负载运行状态时，当冷却水的温度等于或高于预定温度时，刚刚从水冷发动机流出的冷却水流入水冷发动机的热敏部件周围恒温器通过冷却水通道切换阀的操作。结果，恒温器响应于从水冷发动机流出的高温冷却水的温度而工作，并且恒温器的冷却水的设定温度可以转换到较低的温度。这样，不仅在发动机处于高负荷运转状态的情况下，也可以优选防止冷却水的温度过度升高，而且在发动机处于闷热状态之后，车辆以低速行驶在向上的斜坡上。

2. 发明授权

US5749330A Cooling system for an internal combustion engine 失效
标题翻译：内燃机冷却系统
公开(公告)号：US5749330A
公开(公告)日：1998-05-12
申请号：US607349
申请日：1996-02-26
申请人： Yoshimitsu Inque , Yasutoshi Yamanaka , Ryuichi Matsushiro, deceased , Hikaru Sugi , Takayuki Hayashi , Tatsuo Sugimoto , Koichi Ito , Hiroyuki Fukunaga , Tokio Kohama , Toshihiko Igashira
发明人： Yoshimitsu Inque , Yasutoshi Yamanaka , Ryuichi Matsushiro, deceased , Hikaru Sugi , Takayuki Hayashi , Tatsuo Sugimoto , Koichi Ito , Hiroyuki Fukunaga , Tokio Kohama , Toshihiko Igashira
IPC分类号： B60H1/00 , F01P7/14 , F01P7/16 , F01P11/20 , F28D20/00
CPC分类号： B60H1/00492 , F01P11/20 , F28D20/0034 , F01P2007/146 , F01P2011/205 , F01P2025/62 , F01P2025/70 , F01P2060/08 , F01P2070/06 , F01P7/16 , Y02E60/142
摘要： By using a small heat accumulator installed in a cooling water system, malfunction of exhaust emission during warming up is prevented. Such a cooling system includes a cooling water passage for returning cooling water flowing from a cooling water outlet of an automotive engine to a cooling water inlet through a radiator, a first bypass passage for returning the cooling water just after flowing from the cooling water outlet to the cooling water inlet through the radiator, a second bypass passage for returning the cooling water just after flowing out from the cooling water outlet of the engine to the cooling water inlet through the radiator by supplying the cooling water near a heat-sensing portion of a thermostat, a flowing amount adjusting valve for enlarging a cooling water flowing ratio to the first bypass passage with respect to the second bypass passage corresponding to a reduction of a load of the engine and the heat accumulator installed through the first bypass passage.
摘要翻译：通过使用安装在冷却水系统中的小型蓄热器，可以防止在预热期间排气的故障。这样的冷却系统包括：冷却水通道，用于将从汽车发动机的冷却水出口流出的冷却水返回到通过散热器的冷却水入口;第一旁通通道，用于使冷却水刚刚从冷却水出口流出后返回到通过散热器的冷却水入口，第二旁路通道，用于使冷却水刚好从发动机的冷却水出口流出到通过散热器的冷却水入口之后，将冷却水通过散热器的热传感部分恒温器，用于相应于通过第一旁路通道安装的发动机和蓄热器的负载减小而相对于第二旁路通道扩大与第一旁通通道的冷却水流量比的流量调节阀。

3. 发明授权

US5404842A Internal combustion engine cooling apparatus 失效
标题翻译：内燃机冷却装置
公开(公告)号：US5404842A
公开(公告)日：1995-04-11
申请号：US165882
申请日：1993-12-14
申请人： Ryuichi Matsushiro , Toshihiko Igashira , Hiroyuki Fukunaga , Yasutoshi Yamanaka
发明人： Ryuichi Matsushiro , Toshihiko Igashira , Hiroyuki Fukunaga , Yasutoshi Yamanaka
IPC分类号： F01P7/16 , F01P7/02
CPC分类号： F01P7/167 , F01P2025/62 , F01P2070/06
摘要： A cooling apparatus for cooling an internal combustion engine having a coolant passing through the engine is provided. A heat exchanger performs a heat-energy exchange and a heat exchanger bypass passage prevents part of the coolant flowing out from the engine from flowing into the heat exchanger. A coolant combination device forms a mix of coolant which flows in a passage bypassing a thermostat with coolant which flows in a passage through the thermostat, while a flow rate ratio adjusting valve continuously adjusts the ratio of the flow rate of the part of the coolant which bypasses the thermostat to the part of the coolant which passes through the thermostat in accordance with a temperature of the coolant. Accordingly, the higher the temperature is, the larger the ratio is. Moreover, the temperature is controlled in accordance with a load of the engine so that the larger the load is, the higher the temperature is.
摘要翻译：提供一种用于冷却通过发动机的冷却剂的内燃机的冷却装置。热交换器执行热能交换，并且热交换器旁路通道防止从发动机流出的部分冷却剂流入热交换器。冷却剂组合装置形成冷却剂的混合物，其在绕过恒温器的通道中流动，其中冷却剂在通过恒温器的通道中流动，而流量比调节阀连续地调节冷却剂部分的流量比将恒温器绕过根据冷却剂的温度通过恒温器的冷却剂部分。因此，温度越高，比例越大。此外，根据发动机的负载来控制温度，使得负载越大温度越高。

4. 发明授权

US07081758B2 Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure 有权
公开(公告)号：US07081758B2
公开(公告)日：2006-07-25
申请号：US11037131
申请日：2005-01-19
申请人： Eiichi Umemura , Hiroyuki Fukunaga , Hiroyuki Nakayashiki
发明人： Eiichi Umemura , Hiroyuki Fukunaga , Hiroyuki Nakayashiki
IPC分类号： G01R31/02 , H01L23/58
CPC分类号： H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： An inspection pattern, an inspection method, and an inspection system for detection of a latent defect of a multi-layer wiring structure formed on the semiconductor wafer. The inspection pattern includes lower-layer wiring portions, upper-layer wiring portions, an insulating layer provided between them, contact units connecting them to form a contact chain, and electrode terminals. The inspection method includes the steps of acquiring an applied-voltage versus measured-current characteristic or an elapsed-time versus measured-voltage characteristic of the inspection pattern, and judging presence or absence of a latent defect of the inspection pattern on the basis of the acquired characteristic. The inspection system includes a voltage-applying/current-measuring device or a constant-current-feeding/voltage-measuring device, and a judging device for judging presence or absence of a latent defect of the inspection pattern.

5. 发明申请

US20050164453A1 Method of manufacturing nonvolatile semiconductor storage device 失效
标题翻译：制造非易失性半导体存储装置的方法
公开(公告)号：US20050164453A1
公开(公告)日：2005-07-28
申请号：US10761223
申请日：2004-01-22
申请人： Hiroyuki Fukunaga
发明人： Hiroyuki Fukunaga
IPC分类号： H01L21/28 , H01L21/336
CPC分类号： H01L29/66825 , H01L21/28273
摘要： In a method of manufacturing a nonvolatile semiconductor storage device, an element isolation region (12 in FIG. 1) is formed in a semiconductor substrate (11), a tunnel oxide film (13) and a polysilicon layer to become a floating gate (14) later are successively formed on the resulting semiconductor substrate, and nitrogen ions are thereafter implanted into the front surface of the polysilicon layer so as to stay in only this front surface. The polysilicon layer is patterned to form the floating gate (14), and this floating gate (14) is thermally oxidized to form an inter-gate insulating film (15). Since the thermal oxidation is suppressed by the nitrogen ions, the inter-gate insulating film (15) can be made thicker at the side surfaces of the floating gate (14) than at the front surface thereof. Thus, the inter-gate insulating film (15) at the edge part of the floating gate (14) can be formed as designed, so that the nonvolatile semiconductor storage device is free from bad influence on its electrical programming and erasing and is capable of retaining charges for a long time.
摘要翻译：在制造非易失性半导体存储装置的方法中，元件隔离区域（图1中的12）形成在半导体衬底（11）中，隧道氧化物膜（13）和多晶硅层成为浮栅（14））随后在所得到的半导体衬底上依次形成，然后将氮离子注入到多晶硅层的前表面中，仅留在该前表面。图案化多晶硅层以形成浮置栅极（14），并且该浮置栅极（14）被热氧化以形成栅极间绝缘膜（15）。由于通过氮离子抑制热氧化，所以可以使栅极间绝缘膜（15）在浮动栅极（14）的侧表面比在其前表面处更厚。因此，浮置栅极（14）的边缘部分处的栅极间绝缘膜（15）可以按照设计形成，使得非易失性半导体存储装置对其电编程和擦除没有不良影响，并且能够长期保留费用。

6. 发明授权

US07329577B2 Method of manufacturing nonvolatile semiconductor storage device 失效
标题翻译：制造非易失性半导体存储装置的方法
公开(公告)号：US07329577B2
公开(公告)日：2008-02-12
申请号：US10761223
申请日：2004-01-22
申请人： Hiroyuki Fukunaga
发明人： Hiroyuki Fukunaga
IPC分类号： H01L21/336
CPC分类号： H01L29/66825 , H01L21/28273
摘要： In a method of manufacturing a nonvolatile semiconductor storage device, an element isolation region is formed in a semiconductor substrate, a tunnel oxide film and a polysilicon layer are successively formed on the semiconductor substrate, and nitrogen ions are thereafter implanted into the front surface of the polysilicon layer so as to stay in the front surface only. The polysilicon layer is patterned to form a floating gate, which is then thermally oxidized to form an inter-gate insulating film. Since thermal oxidation is suppressed by nitrogen ions, the inter-gate insulating film is thicker at the side surfaces of the floating gate than at the front surface. The inter-gate insulating film at the edge of the floating gate can be formed as designed, so that the storage device is free from bad influence during electrical programming and erasing, and can retain charge longer.
摘要翻译：在制造非易失性半导体存储装置的方法中，在半导体衬底中形成元件隔离区，在半导体衬底上依次形成隧道氧化物膜和多晶硅层，然后将氮离子注入到多晶硅层只能留在前表面。将多晶硅层图案化以形成浮栅，然后将其热氧化以形成栅间绝缘膜。由于氮氧离子抑制了热氧化，因此栅极间绝缘膜在浮动栅极的侧表面处比在前表面处更厚。浮栅边缘的栅极间绝缘膜可以按照设计形成，使得存储装置在电气编程和擦除过程中没有不良影响，并且可以更长时间地保持电荷。

7. 发明申请

US20070191203A1 LEAD-FREE GLASS MATERIAL FOR USE IN SEALING AND, SEALED ARTICLE AND METHOD FOR SEALING USING THE SAME 审中-公开
标题翻译：用于密封的无铅玻璃材料，以及使用其密封的密封品和密封方法
公开(公告)号：US20070191203A1
公开(公告)日：2007-08-16
申请号：US11736681
申请日：2007-04-18
申请人： Masahiro Yoshida , Yasuo Hatate , Tsugumitsu Sarata , Yoshimitsu Uemura , Tomoyuki Honda , Hiroyuki Fukunaga , Masahiro Iwashita
发明人： Masahiro Yoshida , Yasuo Hatate , Tsugumitsu Sarata , Yoshimitsu Uemura , Tomoyuki Honda , Hiroyuki Fukunaga , Masahiro Iwashita
IPC分类号： C03C8/24
CPC分类号： C04B35/547 , C03C3/122 , C03C3/14 , C03C8/04 , C03C8/14 , C03C8/24 , C03C27/044 , C04B35/01 , C04B35/453 , C04B35/495 , C04B35/653 , C04B2235/3215 , C04B2235/3239 , C04B2235/3284 , C04B2235/3298 , C04B2235/3409 , C04B2235/9607
摘要： Provided with a glass composition including a network-former oxide composed of any one of or both of B2O3 and V2O5 of 20-80% by weight, ZnO of 0-60% by weight and BaO of 0-80% by weight, wherein at least one of ZnO and BaO is included as an essential ingredient. The present invention is a glass material for use in sealing, which is of lead-free series, can be used for sealing at a low processing temperature and within a wide temperature range, has a low thermal expansion coefficient, superior adhesion, superior sealing processability, superior adherence, superior chemical stability, superior strength and the like and comprises sufficient practical performance to substitute for lead glass.
摘要翻译：提供一种玻璃组合物，其包含由B 2 O 3 O 3和V 2 O O 2中的任何一种或两者构成的网络形成剂氧化物 > 20重量％，ZnO为0-60重量％，BaO为0-80重量％，其中包括ZnO和BaO中的至少一种作为必要成分。本发明是一种无铅系列密封用玻璃材料，能够在低温加工温度范围内进行密封，热膨胀系数低，密封性优异，密封加工性优异优越的附着力，优异的化学稳定性，优异的强度等，并且包括足够的实际性能来代替铅玻璃。

8. 发明申请

US20050233885A1 Lead-free glass material for use in sealing and, sealed article and method for sealing using the same 有权
标题翻译：用于密封的无铅玻璃材料和密封制品及使用其的密封方法
公开(公告)号：US20050233885A1
公开(公告)日：2005-10-20
申请号：US11158258
申请日：2005-06-21
申请人： Masahiro Yoshida , Yasuo Hatate , Tsugumitsu Sarata , Yoshimitsu Uemura , Tomoyuki Honda , Hiroyuki Fukunaga , Masahiro Iwashita
发明人： Masahiro Yoshida , Yasuo Hatate , Tsugumitsu Sarata , Yoshimitsu Uemura , Tomoyuki Honda , Hiroyuki Fukunaga , Masahiro Iwashita
IPC分类号： C03C8/24 , C04B35/453 , C04B35/495 , C04B35/547 , C04B35/653 , C03C3/12 , C03C3/14
CPC分类号： C04B35/547 , C03C3/122 , C03C3/14 , C03C8/04 , C03C8/14 , C03C8/24 , C03C27/044 , C04B35/01 , C04B35/453 , C04B35/495 , C04B35/653 , C04B2235/3215 , C04B2235/3239 , C04B2235/3284 , C04B2235/3298 , C04B2235/3409 , C04B2235/9607
摘要： Provided with a glass composition including a network-former oxide composed of any one of or both of B2O3 and V2O5 of 20-80% by weight, ZnO of 0-60% by weight and BaO of 0-80% by weight, wherein at least one of ZnO and BaO is included as an essential ingredient. The present invention is a glass material for use in sealing, which is of lead-free series, can be used for sealing at a low processing temperature and within a wide temperature range, has a low thermal expansion coefficient, superior adhesion, superior sealing processability, superior adherence, superior chemical stability, superior strength and the like and comprises sufficient practical performance to substitute for lead glass.
摘要翻译：提供一种玻璃组合物，其包含由B 2 O 3 O 3和V 2 O O 2中的任何一种或两者构成的网络形成剂氧化物 > 20重量％，ZnO为0-60重量％，BaO为0-80重量％，其中包括ZnO和BaO中的至少一种作为必要成分。本发明是一种无铅系列密封用玻璃材料，能够在低温加工温度范围内进行密封，热膨胀系数低，密封性优异，密封加工性优异优越的附着力，优异的化学稳定性，优异的强度等，并且包括足够的实际性能来代替铅玻璃。

9. 发明申请

US20070184963A1 LEAD-FREE GLASS MATERIAL FOR USE IN SEALING AND, SEALED ARTICLE AND METHOD FOR SEALING USING THE SAME 审中-公开
公开(公告)号：US20070184963A1
公开(公告)日：2007-08-09
申请号：US11736663
申请日：2007-04-18
申请人： Masahiro Yoshida , Yasuo Hatate , Tsugumitsu Sarata , Yoshimitsu Uemura , Tomoyuki Honda , Hiroyuki Fukunaga , Masahiro Iwashita
发明人： Masahiro Yoshida , Yasuo Hatate , Tsugumitsu Sarata , Yoshimitsu Uemura , Tomoyuki Honda , Hiroyuki Fukunaga , Masahiro Iwashita
IPC分类号： C03C8/24 , C03C3/12 , C03C3/14
CPC分类号： C04B35/547 , C03C3/122 , C03C3/14 , C03C8/04 , C03C8/14 , C03C8/24 , C03C27/044 , C04B35/01 , C04B35/453 , C04B35/495 , C04B35/653 , C04B2235/3215 , C04B2235/3239 , C04B2235/3284 , C04B2235/3298 , C04B2235/3409 , C04B2235/9607
摘要： Provided with a glass composition including a network-former oxide composed of any one of or both of B2O3 and V2O5 of 20-80% by weight, ZnO of 0-60% by weight and BaO of 0-80% by weight, wherein at least one of ZnO and BaO is included as an essential ingredient. The present invention is a glass material for use in sealing, which is of lead-free series, can be used for sealing at a low processing temperature and within a wide temperature range, has a low thermal expansion coefficient, superior adhesion, superior sealing processability, superior adherence, superior chemical stability, superior strength and the like and comprises sufficient practical performance to substitute for lead glass.

10. 发明授权

US06884637B2 Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure 有权
公开(公告)号：US06884637B2
公开(公告)日：2005-04-26
申请号：US10216447
申请日：2002-08-12
申请人： Eiichi Umemura , Hiroyuki Fukunaga , Hiroyuki Nakayashiki
发明人： Eiichi Umemura , Hiroyuki Fukunaga , Hiroyuki Nakayashiki
IPC分类号： G01R31/28 , H01L21/66 , H01L21/768 , H01L21/822 , H01L23/522 , H01L23/544 , H01L27/04 , H01L21/36
CPC分类号： H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： An inspection pattern, an inspection method, and an inspection system for detection of a latent defect of a multi-layer wiring structure formed on the semiconductor wafer. The inspection pattern includes lower-layer wiring portions, upper-layer wiring portions, an insulating layer provided between them, contact units connecting them to form a contact chain, and electrode terminals. The inspection method includes the steps of acquiring an applied-voltage versus measured-current characteristic or an elapsed-time versus measured-voltage characteristic of the inspection pattern, and judging presence or absence of a latent defect of the inspection pattern on the basis of the acquired characteristic. The inspection system includes a voltage-applying/current-measuring device or a constant-current-feeding/voltage-measuring device, and a judging device for judging presence or absence of a latent defect of the inspection pattern.

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