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1. 发明授权

US08977580B2 Defect classification apparatus 有权
标题翻译：缺陷分类仪
公开(公告)号：US08977580B2
公开(公告)日：2015-03-10
申请号：US13703536
申请日：2011-06-08
申请人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
发明人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
IPC分类号： G06F15/18 , G06N99/00 , G01N21/892 , G01N21/952 , G06T7/00 , G01N21/89
CPC分类号： G06N99/005 , G01N21/892 , G01N21/952 , G01N2021/8918 , G06T7/0004 , G06T2207/20081 , G06T2207/30136
摘要： The present invention has its objective to provide a defect classification apparatus which suppresses over-fitting and accurately classify the defect type of a defect. A defect classification apparatus is provided in which a data point indicating feature information of a defect to be classified having an unknown defect type is mapped to a point in a mapping space having a dimensional number higher than the number of features constituting the feature information, and the defect type of the defect to be classified is classified based on in which of two regions of defect type, which are formed by separating the mapping space by a decision boundary, the mapped point is located, wherein a discriminant function indicating the decision boundary is determined by adopting a weight which minimizes the sum of the classification error, which corresponds to the accuracy in classifying a training defect dataset, and a regularization term, which has a positive correlation with the dimensional number of the decision boundary, as the weight for each feature constituting the discriminant function.
摘要翻译：本发明的目的是提供一种缺陷分类装置，其能够抑制缺陷的缺陷类型的过度拟合和精确分类。提供了一种缺陷分类装置，其中指示具有未知缺陷类型的要分类的缺陷的特征信息的数据点被映射到具有高于构成特征信息的特征数的维度数的映射空间中的点，以及基于通过将映射空间分离为决策边界而形成的两个缺陷类型区域中的哪一个进行分类的缺陷类型，映射点位于其中，其中指示判定边界的判别函数为通过采用最小化对应于训练缺陷数据集的分类精度的分类误差和与决策边界的维数有正相关关系的正则化项的权重作为每个特征构成判别函数。

2. 发明申请

US20130173508A1 DEFECT CLASSIFICATION APPARATUS 有权
标题翻译：缺陷分类设备
公开(公告)号：US20130173508A1
公开(公告)日：2013-07-04
申请号：US13703536
申请日：2011-06-08
申请人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
发明人： Kazunori Anayama , Tetsuya Yadoguchi , Toshiyuki Suzuma , Eiji Honda , Takahiro Okada , Shinya Yoshikawa , Tamotsu Nishimine
IPC分类号： G06N99/00
CPC分类号： G06N99/005 , G01N21/892 , G01N21/952 , G01N2021/8918 , G06T7/0004 , G06T2207/20081 , G06T2207/30136
摘要： The present invention has its objective to provide a defect classification apparatus which suppresses over-fitting and accurately classify the defect type of a defect. A defect classification apparatus is provided in which a data point indicating feature information of a defect to be classified having an unknown defect type is mapped to a point in a mapping space having a dimensional number higher than the number of features constituting the feature information, and the defect type of the defect to be classified is classified based on in which of two regions of defect type, which are formed by separating the mapping space by a decision boundary, the mapped point is located, wherein a discriminant function indicating the decision boundary is determined by adopting a weight which minimizes the sum of the classification error, which corresponds to the accuracy in classifying a training defect dataset, and a regularization term, which has a positive correlation with the dimensional number of the decision boundary, as the weight for each feature constituting the discriminant function.
摘要翻译：本发明的目的是提供一种缺陷分类装置，其能够抑制缺陷的缺陷类型的过度拟合和精确分类。提供了一种缺陷分类装置，其中指示具有未知缺陷类型的要分类的缺陷的特征信息的数据点被映射到具有高于构成特征信息的特征数的维度数的映射空间中的点，以及基于通过将映射空间分离为决策边界而形成的两个缺陷类型区域中的哪一个进行分类的缺陷类型，映射点位于其中，其中指示判定边界的判别函数为通过采用最小化对应于训练缺陷数据集的分类精度的分类误差和与决策边界的维数有正相关关系的正则化项的权重作为每个特征构成判别函数。

3. 发明申请

US20130248505A1 WELDING QUALITY CLASSIFICATION APPARATUS 审中-公开
标题翻译：焊接质量分类装置
公开(公告)号：US20130248505A1
公开(公告)日：2013-09-26
申请号：US13878917
申请日：2011-10-12
申请人： Kazunori Anayama , Toshiyuki Suzuma , Hitomi Nishibata , Hiroki Fujimoto , Kiyoyuki Fukui , Masato Uchihara
发明人： Kazunori Anayama , Toshiyuki Suzuma , Hitomi Nishibata , Hiroki Fujimoto , Kiyoyuki Fukui , Masato Uchihara
IPC分类号： B23K9/095
CPC分类号： B23K9/095 , B23K11/115 , B23K31/125
摘要： The welding quality classification apparatus relating to the present invention is an apparatus, wherein a data point indicating feature information of a welded joint to be classified whose welding quality is unknown is mapped to a point in a mapping space which has a dimensional number higher than the number of the features constituting the feature information, and the welding quality of a welded joint to be classified is classified based on which of regions of two welding qualities, which are formed by separating the mapping space with a decision boundary, contains the mapped point, and wherein a discriminant function is determined by adopting a weight which minimizes the sum of the classification error corresponding to classification accuracy of a training dataset and a regularization term having a positive correlation with the dimensional number of the discriminant function as weight for each feature constituting the discriminant function indicating the decision boundary.
摘要翻译：关于本发明的焊接质量分类装置是一种装置，其中指示焊接质量未知的待分类的焊接接头的特征信息的数据点被映射到具有高于基于通过将映射空间与判定边界分离而形成的两个焊接质量的区域中的哪一个包含映射点来分类构成特征信息的特征的数量和待分类的焊接接头的焊接质量，并且其中通过采用最小化对应于训练数据集的分类精度的分类误差和与判别函数的维数成正相关的正则化项的正则化项的权重作为构成每个特征的每个特征的权重来确定判别函数判别函数表示决策边界。

4. 发明授权

US09121833B2 Defect inspecting apparatus 有权
标题翻译：缺陷检查装置
公开(公告)号：US09121833B2
公开(公告)日：2015-09-01
申请号：US13551014
申请日：2012-07-17
申请人： Kazunori Anayama , Toshiyuki Suzuma , Yoshiyuki Nakao , Masami Ikeda , Kenta Sakai
发明人： Kazunori Anayama , Toshiyuki Suzuma , Yoshiyuki Nakao , Masami Ikeda , Kenta Sakai
IPC分类号： H04N7/18 , G01N21/952
CPC分类号： G01N21/952
摘要： A defect inspecting apparatus includes a first light source, a first image capture device that receives the reflection light emitted from the first light source and reflected by the outer peripheral surface of a lip part to grab the image of the outer peripheral surface of the lip part, a second light source, a second image capture device 8 that receives the reflection light emitted from the second light source and reflected by a load face to grab the image of the load face, a third light source, a third image capture device that receives the reflection light emitted from the third light source and reflected by a thread bottom face inspection zone 106 to grab the image of the thread bottom face inspection zone, and an inspection device for inspecting defects by processing the captured images grabbed by the first to third image capture devices.
摘要翻译：缺陷检查装置包括第一光源，第一图像捕获装置，其接收从第一光源发射并被唇部的外周面反射的反射光，以抓住唇部的外周面的图像，第二光源，第二图像捕获装置8，其接收从第二光源发射并被负载面反射以吸收负载面的图像的反射光;第三光源;第三图像捕获装置，其接收从第三光源发射并由线底面检查区域106反射的反射光，以抓取线底面检查区域的图像;以及检查装置，用于通过处理由第一至第三图像抓取的捕获图像来检查缺陷捕获设备。

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