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    • 1. 发明授权
    • Scanning electron microscope
    • 扫描电子显微镜
    • US07514683B2
    • 2009-04-07
    • US11655275
    • 2007-01-19
    • Kazuma TaniiYuji KasaiKatsuhiro SasadaEiichi Seya
    • Kazuma TaniiYuji KasaiKatsuhiro SasadaEiichi Seya
    • H01J37/28
    • G01N23/2251H01J37/28H01J2237/004H01J2237/216H01J2237/24564
    • Disclosed is a scanning electron microscope capable of performing speedy focusing by automatically measuring an electrostatic voltage of a surface of a wafer inside a specimen chamber in an accurate, and easy speedy manner, the wafer assuming different electrostatic voltages inside and outside the specimen chamber. The scanning electron microscope that controls optical systems measures an electrostatic voltage of the specimen according to an electrostatic capacitance between the both parts of the divided electrode plate, by dividing an electrode plate into two parts and switching potentials of electrodes obtained by the division with each other, an electrostatic voltage of the specimen based on an electrostatic capacitance between the both parts of the divided electrode plate. The electrode plate is used for applying a retarding voltage and arranged over a specimen.
    • 公开了一种扫描电子显微镜,其能够以准确且容易的方式自动测量样品室内的晶片表面的静电电压,从而在晶片内部和外部具有不同的静电电压来进行快速聚焦。 控制光学系统的扫描电子显微镜通过将电极板分成两部分并通过彼此分割获得的电极的切换电位来测量根据分隔电极板的两个部分之间的静电电容的样品的静电电压 基于分割电极板的两个部分之间的静电电容的试样的静电电压。 电极板用于施加延迟电压并且布置在试样上。
    • 2. 发明申请
    • Scanning electron microscope
    • 扫描电子显微镜
    • US20070235646A1
    • 2007-10-11
    • US11655275
    • 2007-01-19
    • Kazuma TaniiYuji KasaiKatsuhiro SasadaEiichi Seya
    • Kazuma TaniiYuji KasaiKatsuhiro SasadaEiichi Seya
    • G01N23/00
    • G01N23/2251H01J37/28H01J2237/004H01J2237/216H01J2237/24564
    • Disclosed is a scanning electron microscope capable of performing speedy focusing by automatically measuring an electrostatic voltage of a surface of a wafer inside a specimen chamber in an accurate, and easy speedy manner, the wafer assuming different electrostatic voltages inside and outside the specimen chamber. The scanning electron microscope that controls optical systems measures an electrostatic voltage of the specimen according to an electrostatic capacitance between the both parts of the divided electrode plate, by dividing an electrode plate into two parts and switching potentials of electrodes obtained by the division with each other, an electrostatic voltage of the specimen based on an electrostatic capacitance between the both parts of the divided electrode plate. The electrode plate is used for applying a retarding voltage and arranged over a specimen.
    • 公开了一种扫描电子显微镜,其能够以准确且容易的方式自动测量样品室内的晶片表面的静电电压,从而在晶片内部和外部具有不同的静电电压来进行快速聚焦。 控制光学系统的扫描电子显微镜通过将电极板分成两部分并通过彼此分割获得的电极的切换电位来测量根据分隔电极板的两个部分之间的静电电容的样品的静电电压 基于分割电极板的两个部分之间的静电电容的试样的静电电压。 电极板用于施加延迟电压并且布置在试样上。
    • 3. 发明授权
    • Digital data transmitting apparatus
    • 数字数据发送装置
    • US07583749B2
    • 2009-09-01
    • US10569274
    • 2004-09-07
    • Yuji KasaiMasahiro MurakawaTetsuya Higuchi
    • Yuji KasaiMasahiro MurakawaTetsuya Higuchi
    • H04L25/49
    • H04L27/368H04L5/14H04L25/03343
    • A transmitting circuit 10 converts transmission data to a multilevel analog signal suitable for transmission. The multilevel analog signal is output to a cable 21 via an amplifier and a hybrid circuit 12. In the transmitting circuit 10, a waveform which compensates waveform deterioration at the cable 21 is generated. A reception signal from the cable 21 is input to a mixer 14 via the hybrid circuit 12 and an amplifier 13. The mixer 14 mixes the reception signal and a cancel signal output from a cancel signal generation circuit 17 so as to remove undesired signals. In a receiving circuit 15, the signal output from the mixer 14 is sampled by use of a plurality of sample-hold circuits, and subjected to analog sum-of-product computation which is performed by a matrix circuit for distortion compensation. Subsequently, the sampled signals are converted to digital signals. The digital signals are collectively subjected to processing such as parallel-serial conversion, whereby reception data and an evaluation signal are obtained. An adjustment control circuit 18 includes a CPU, and adjusts the respective circuits on the basis of the evaluation signal such that data can be correctly transmitted and received.
    • 发送电路10将发送数据转换为适合于发送的多级模拟信号。 多电平模拟信号经由放大器和混合电路12输出到电缆21.在发送电路10中,产生补偿电缆21的波形恶化的波形。 来自电缆21的接收信号经由混合电路12和放大器13输入到混频器14.混频器14混合接收信号和从消除信号发生电路17输出的消除信号,以便去除不想要的信号。 在接收电路15中,通过使用多个采样保持电路对从混频器14输出的信号进行采样,并进行由用于失真补偿的矩阵电路执行的模拟和积计算。 随后,采样信号被转换成数字信号。 数字信号被集体地进行并行串行转换的处理,从而获得接收数据和评估信号。 调整控制电路18包括CPU,并且基于评估信号调整各个电路,使得可以正确地发送和接收数据。
    • 4. 发明申请
    • Parameter Adjustment Device and Parameter Adjustment Method
    • 参数调整装置及参数调整方法
    • US20080310492A1
    • 2008-12-18
    • US11630647
    • 2005-06-22
    • Yuji KasaiMasatoshi SatoTakashi Kamata
    • Yuji KasaiMasatoshi SatoTakashi Kamata
    • H03K5/159
    • H04B3/04H04L25/0272H04L25/0278H04L25/03885H04L25/4975
    • Transmission equipment that can be used up to a high frequency and simplifies a circuit design includes a THP preceding means on a transmitting side, and an equalizer means, wherein analog processing is carried out on a receiving side. Compensation of the frequency characteristic of a transmission channel is divided into the THP preceding means on the transmitting side and the equalizer means, so that due to compensation by the equalizer circuit, the absolute value of a THP coefficient becomes small, and a DAC with lower resolution, wherein stability of a loop of the THP increases, can be used. Detailed adjustment for adapting to the characteristic of a transmission channel is carried out by the THP, so that the equalizer circuit is only required to roughly compensate, and is not required to adjust. As a result, the equalizer circuit can be of a simple design.
    • 可以使用高频率并简化电路设计的传输设备包括发送侧的THP先前装置和均衡器装置,其中在接收侧执行模拟处理。 传输信道的频率特性的补偿被分成发送侧的THP先前装置和均衡装置,由于由均衡器电路补偿,THP系数的绝对值变小,并且具有较低的DAC 可以使用其中THP的环路的稳定性增加的分辨率。 通过THP进行适应传输通道的特性的详细调整,使均衡器电路只需要大致补偿,不需要调整。 结果,均衡器电路可以是简单的设计。
    • 10. 发明授权
    • Charged particle ray apparatus and pattern measurement method
    • 带电粒子装置和图案测量方法
    • US08890068B2
    • 2014-11-18
    • US14002275
    • 2012-01-27
    • Yuji KasaiMakoto SuzukiHiroshi Makino
    • Yuji KasaiMakoto SuzukiHiroshi Makino
    • H01J37/05H01J37/244H01J37/28G01N23/225G06T1/00
    • H01J37/05G01N23/2251G06T1/00H01J37/244H01J37/28H01J2237/24475H01J2237/24485H01J2237/2449H01J2237/24495
    • Provided is a technique to automatize a synthesis function of signal charged particles having different energies. A charged particle beam apparatus includes: a charged particle source configured to irradiate a sample with a primary charged particle ray; a first detector configured to detect a first signal electron having first energy from signal charged particles generated from the sample; a second detector configured to detect a second signal electron having second energy from signal charged particles generated from the sample; a first operation part configured to change a synthesis ratio of a signal intensity of the first signal electron and a signal intensity of the second signal electron and to generate a detected image corresponding to each synthesis ratio; a second operation part configured to calculate a ratio of signal intensities corresponding to predetermined two areas of the detected image generated for each synthesis ratio; and a third operation part configured to determine a mixture ratio to be used for acquisition of the detected image on a basis of a change of the ratio of signal intensities.
    • 提供了一种使具有不同能量的信号带电粒子的合成功能自动化的技术。 带电粒子束装置包括:带电粒子源,被配置为用一次带电粒子射线照射样品; 第一检测器,被配置为检测从所述样品产生的信号带电粒子的具有第一能量的第一信号电子; 第二检测器,被配置为检测从样品产生的信号带电粒子的具有第二能量的第二信号电子; 第一操作部,被配置为改变第一信号电子的信号强度和第二信号电子的信号强度的合成比,并且生成与每个合成比相对应的检测图像; 第二操作部,被配置为计算与针对每个合成比生成的检测图像的预定的两个区域相对应的信号强度的比率; 以及第三操作部件,被配置为基于信号强度比的变化来确定用于获取检测到的图像的混合比率。