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1. 发明授权

US06996489B2 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor 有权
公开(公告)号：US06996489B2
公开(公告)日：2006-02-07
申请号：US09796451
申请日：2001-03-02
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R31/28
CPC分类号： G01R31/31935 , G01R31/3004
摘要： An apparatus for sampling a power supply current value for performing frequency analysis of the power supply current flowing in an integrated circuit with a test signal applied to the integrated circuit has a power supply generating a prescribed supply of power for the integrated circuit (DUT: device under test), a current detection means for observing the power supply current value supplied from the power supply to the DUT, a test signal generation means for generating a prescribed test signal to be applied to an input/output terminal other than a power supply terminal of the DUT and for generating a test signal application signal during application of the test signal to the DUT, a sampling means for sampling the power supply current value signal, a sampling time determining means for instructing the sampling means with regard to the start and end timing for sampling, based on the test signal application signal, a sampling data storage means for storing data sampled by the sampling means, a Fourier transform means for performing a Fourier transformation calculation on the sampled data, and a main control means for outputting instructions to various other means and performing overall apparatus control.

2. 发明授权

US6058502A Diagnostic system analyzing frequency spectrum of electric power for diagnosing integrated circuit, method and information storage medium storing computer program for the method 有权
标题翻译：诊断系统分析电力频谱诊断集成电路，方法和信息存储介质存储计算机程序的方法
公开(公告)号：US6058502A
公开(公告)日：2000-05-02
申请号：US145236
申请日：1998-09-01
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R31/30 , G06F11/00 , G06F13/28
CPC分类号： G01R31/3004
摘要： A diagnosis system for a semiconductor integrated circuit repeatedly applies a test pattern at repetition periods so as to measure variation of electric power supplied to the semiconductor integrated circuit, and determines the magnitude of a spectral component at a fundamental frequency equal to the inverse of the repetition period and the magnitude of each spectral component at each harmonic of the fundamental frequency to see whether the spectral components fall within the magnitude ranges observed in an excellent semiconductor integrated circuit device so that the diagnosis is speedy and reliable.
摘要翻译：半导体集成电路的诊断系统在重复周期重复地施加测试图案，以便测量提供给半导体集成电路的电力的变化，并且确定基本频率等于重复的倒数的频谱分量的大小周期以及基频的每个谐波处的每个频谱分量的大小，以查看频谱分量是否落在在优秀的半导体集成电路器件中观察到的幅度范围内，从而诊断速度可靠。

3. 发明授权

US08011011B2 Method and apparatus for processing data 有权
标题翻译：处理数据的方法和装置
公开(公告)号：US08011011B2
公开(公告)日：2011-08-30
申请号：US11007398
申请日：2004-12-08
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G06F7/04
CPC分类号： G06F21/10 , G06F21/6218 , G06F21/74 , G06F21/78 , G06F2221/2105
摘要： A data processing apparatus for processing and protecting data stored in a removable storage medium, including a medium monitoring unit configured to monitor the state of the removable storage medium, an information storage unit configured to store information, and a controller configured to move the data from the removable storage medium to the information storage unit in accordance with the monitoring result of the medium monitoring unit.
摘要翻译：一种用于处理和保护存储在可移动存储介质中的数据的数据处理装置，包括被配置为监视可移动存储介质的状态的介质监视单元，被配置为存储信息的信息存储单元和被配置为将数据从所述可移动存储介质根据所述介质监视单元的监视结果传送到所述信息存储单元。

4. 发明授权

US06510289B2 Image formation system, control method of image formation system, image formation apparatus and storage medium thereof 有权
标题翻译：图像形成系统，图像形成系统的控制方法，图像形成装置及其存储介质
公开(公告)号：US06510289B2
公开(公告)日：2003-01-21
申请号：US09875964
申请日：2001-06-08
申请人： Yoshihide Terao , Kazuhiro Sakaguchi , Tetsuya Yokoyama
发明人： Yoshihide Terao , Kazuhiro Sakaguchi , Tetsuya Yokoyama
IPC分类号： G03G1500
CPC分类号： H04N1/32678 , G03G15/5087 , G03G15/6508 , G03G2215/00734 , H04N1/2307 , H04N1/2338 , H04N1/2353 , H04N1/32635
摘要： The present invention relates to an image formation system for forming images of read original images, a control method of the image formation system, image formation apparatuses, a storage medium thereof. According to the present invention, sheets of which size corresponds to an attribute of the images are selected, and it is detected whether or not the image formation apparatus has the sheets selected by the image formation apparatus. When it is detected that the image formation apparatus does not have the selected sheets, sheets other than the selected sized sheets are selected as sheets used in forming images by the image formation apparatus, and it is controlled that another image formation apparatus performs an image formation using the sheets other than the selected sized sheets.
摘要翻译：本发明涉及一种用于形成读取的原始图像的图像的图像形成系统，图像形成系统的控制方法，图像形成装置，其存储介质。根据本发明，选择尺寸对应于图像的属性的片材，并且检测图像形成装置是否具有由图像形成装置选择的片材。当检测到图像形成装置不具有所选择的片材时，除了所选择的尺寸的片材之外的片材被选择为由图像形成装置形成图像所使用的片材，并且被控制为另一个图像形成装置执行图像形成使用除了所选尺寸的纸张之外的纸张。

5. 发明授权

US06766485B1 Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program 失效
标题翻译：集成电路故障测试仪，集成电路故障测试方法和记录介质记录故障测试控制程序
公开(公告)号：US06766485B1
公开(公告)日：2004-07-20
申请号：US09669113
申请日：2000-09-25
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R3128
CPC分类号： G01R31/31924 , G01R31/3004 , G01R31/31721
摘要： A unit test signal having duration T is repeatedly supplied from an LSI tester to an IC under test and, simultaneously, a power source current is supplied from the LSI tester through a current detection unit to the IC under test. The power source current is monitored by the current detection unit and a current information obtained by the monitoring is analyzed by a spectrum analyzer unit. Since the repetition period of the test signal is T, the power source current having a period nT flows through the IC under test along with a state shift of the IC under test, where n is an integer. When the IC under test has a fault, the power source current flows with a period n′T, where n′ is an integer different from n, or an abnormal power source current flows with the period nT, due to a change of the state shift of the IC under test. A decision unit performs a fault decision of the IC under test by judging an existence of abnormal power source current or the change of the state shift of the IC under test on the basis of values of spectral power in the vicinity of a frequency 1/nT and high harmonics thereof of the power source current or existence or absence of peak having such period.
摘要翻译：具有持续时间T的单元测试信号从LSI测试器重复地提供给被测试的IC，同时，从LSI测试器通过电流检测单元将电源电流提供给被测IC。由电流检测单元监视电源电流，并通过频谱分析仪单元分析通过监视获得的电流信息。由于测试信号的重复周期为T，所以具有周期nT的电源电流随着被测试IC的状态偏移而流经所测试的IC，其中n是整数。当被测IC处于故障状态时，由于状态的变化，电源电流以不是n的整数而不是n的整数周期流动，或异常的电源电流以期间nT流动移动IC被测试。决定单元通过根据频率1 / nT附近的频谱功率的值判断异常电源电流的存在或被测IC的状态偏移的变化来进行被测IC的故障判定其电源电流的高次谐波或具有这种周期的峰的存在或不存在。

6. 发明授权

US06694274B2 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 有权
标题翻译：检测集成电路故障的集成电路的方法，进行该集成电路故障的装置以及进行该集成电路的记录介质的存储程序
公开(公告)号：US06694274B2
公开(公告)日：2004-02-17
申请号：US10320441
申请日：2002-12-17
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R2316
CPC分类号： G01R31/2851 , G01R31/3004 , G01R31/31721
摘要： Detecting failed integrated circuit among integrated circuits, by (a) assuming that all integrated circuits under test define under-test set, and testing each one of the integrated circuits in the under-test set, (b) removing integrated circuits judged to be in failure in step (a) from the under-test set, (c) measuring spectrum of a current supplied from a power source into each one of integrated circuits in under-test set, (d) calculating both mean value and standard deviation of spectrum for under-test set, (e) judging whether an integrated circuit is in failure or not, based on both the mean value and the standard deviation of the spectrum, (f) removing integrated circuits having been judged to be in failure in step (e), from the under-test set, and (g) judging under-test set to be in no failure. Thus, it possible to find failed integrated circuits without preparing data of integrated circuit in no failure, as a reference.
摘要翻译：检测集成电路中的故障集成电路，方法是：（a）假设所有被测试集成电路定义欠载测试集，并测试欠测试集中的每一个集成电路，（b）去除被认为在步骤（a）从欠测试组中失败，（c）测量从电源提供给电流不足的集成电路中的电流的频谱，（d）计算频谱的平均值和标准偏差（e）基于频谱的平均值和标准偏差来判断集成电路是否发生故障，（f）去除已经被判断为失败的集成电路（步骤 e），来自不足的测试集，（g）判断测试集不会失败。因此，可以在没有故障的情况下找到集成电路的数据而找到故障的集成电路，作为参考。

7. 发明授权

US06684170B2 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 有权
标题翻译：检测集成电路故障的集成电路的方法，进行该集成电路故障的装置以及进行该集成电路的记录介质的存储程序
公开(公告)号：US06684170B2
公开(公告)日：2004-01-27
申请号：US10320499
申请日：2002-12-17
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R2316
CPC分类号： G01R31/2851 , G01R31/3004 , G01R31/31721
摘要： There is provided a method of detecting an integrated circuit in failure among integrated circuits, based on spectrum which is a result of analyzing a frequency of a current running through an integrated circuit when a test signal is applied to the integrated circuit, comprising the steps of (a) assuming that all integrated circuits under test define a under-test integrated circuit set, and testing each one of the integrated circuits in the under-test integrated circuit set in a conventional manner, (b) removing integrated circuits having been judged to be in failure in the step (a), from the under-test integrated circuit set, (c) measuring spectrum of a current supplied from a power source into each one of the integrated circuits in the under-test integrated circuit set, (d) calculating both a mean value and standard deviation of the spectrum for the under-test integrated circuit set, (e) judging whether an integrated circuit is in failure or in no failure, based on both the mean value and the standard deviation of the spectrum, (f) removing integrated circuits having been judged to be in failure in the step (e), from the under-test integrated circuit set, and (g) judging the under-test integrated circuit set to be in no failure. The method makes it possible to find integrated circuits in failure without preparing data of an integrated circuit in no failure, as a reference.
摘要翻译：通过（a）假定所有被测试集成电路定义欠载测试集，并测试被测设备中的每一个集成电路，（b）去除被判断为故障的集成电路，检测集成电路中的故障集成电路在步骤（a）中，（c）测试从电源提供给电流不足的集成电路中的电流的频谱，（d）计算频谱的平均值和标准偏差（e）基于频谱的平均值和标准偏差来判断集成电路是否发生故障，（f）在步骤（e）中去除被判断为失败的集成电路），来自测试下的集合，（g）判断测试集不会失败。因此，可以在不准备集成电路的数据的情况下找到故障的集成电路，作为参考。

8. 发明授权

US06480011B2 Screening of semiconductor integrated circuit devices 失效
标题翻译：半导体集成电路器件的筛选
公开(公告)号：US06480011B2
公开(公告)日：2002-11-12
申请号：US09859478
申请日：2001-05-18
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R3128
CPC分类号： G01R31/319
摘要： A method of screening LSIs is provided, which makes it possible to screen out faulty LSIs before potential failure existing therein is elicited. A specific power supply voltage is supplied to LSIs to be tested while applying a specific test signal to the LSIs at a specific period. Power supply currents of the LSIs are observed. Sets of power spectrum data of the power supply currents are generated corresponding to the test signal. The distributions of the sets of power spectrum data are generated. whether or not the distributions of the sets of power spectrum data of the power supply currents are equal to or greater than a specific reference value is judged. When the distribution of the set of power spectrum data of the power supply current of one of the devices is equal is to or greater than the reference value, the device in question is regarded as a faulty one.
摘要翻译：提供了一种屏蔽LSI的方法，可以在其中存在潜在的故障之前屏蔽有缺陷的LSI。特定电源电压被提供给要测试的LSI，同时在特定的周期向LSI施加特定的测试信号。观察到LSI的电源电流。根据测试信号生成电源电流的功率谱数据集。产生功率谱数据集的分布。判断电源电流的功率谱数据组的分布是否等于或大于特定参考值。当一个设备的电源电流的功率谱数据集合的分布等于或大于参考值时，被认为是有问题的设备。

9. 发明授权

US07970817B2 Information processing device, information processing method, and control program 有权
标题翻译：信息处理装置，信息处理方法和控制程序
公开(公告)号：US07970817B2
公开(公告)日：2011-06-28
申请号：US11123953
申请日：2005-05-06
申请人： Tadashi Hagiuda , Masao Hayashi , Kentaro Saito , Yoichi Takaragi , Akio Ito , Kazuhiro Sakaguchi
发明人： Tadashi Hagiuda , Masao Hayashi , Kentaro Saito , Yoichi Takaragi , Akio Ito , Kazuhiro Sakaguchi
IPC分类号： G06F15/16
CPC分类号： G06Q10/10 , G06F2216/17 , H04L51/14 , H04L51/28
摘要： An information processing method includes a storing step of storing a correspondence between destination names and e-mail addresses in a storage unit; a setting step of setting a destination name to which a document is to be transmitted; and an upload step of uploading the document to a document management server for a network printing in accordance with an e-mail address corresponding to the set destination name, a document being uploaded to the document management server and then being output in response to an output request from an owner of the e-mail address in the network printing. The uploaded document can be downloaded from the document management server to a printer through a communication medium and can be printed.
摘要翻译：信息处理方法包括存储步骤，用于在存储单元中存储目的地名称和电子邮件地址之间的对应关系; 设置要发送文档的目的地名称的设置步骤; 以及上传步骤，根据与设定的目的地名称相对应的电子邮件地址将文档上传到文档管理服务器进行网络打印，将文档上传到文档管理服务器，然后响应于输出而被输出在网络打印中请求电子邮件地址的所有者。上传的文件可以通过通信介质从文件管理服务器下载到打印机，并可以打印。

10. 发明申请

US20060059093A1 Data processing apparatus, data processing method, and computer program 审中-公开
标题翻译：数据处理装置，数据处理方法和计算机程序
公开(公告)号：US20060059093A1
公开(公告)日：2006-03-16
申请号：US11217272
申请日：2005-09-01
申请人： Yoichi Takaragi , Masao Hayashi , Kentaro Saito , Akio Ito , Tadashi Hagiuda , Kazuhiro Sakaguchi
发明人： Yoichi Takaragi , Masao Hayashi , Kentaro Saito , Akio Ito , Tadashi Hagiuda , Kazuhiro Sakaguchi
IPC分类号： H04L9/00
CPC分类号： G11B20/00086 , G06F21/608 , G06F2221/2111 , H04L9/0872 , H04L9/12 , H04L2209/805
摘要： A data processing apparatus includes a position-information acquisition unit adapted to acquire position information of the data processing apparatus, a key-generation unit adapted to generate a key dependent on the position information acquired by the position-information acquisition unit, an encryption unit adapted to generate encrypted data by encrypting data using the key generated by the key-generation unit, a recording unit adapted to record the encrypted data onto an external recording medium, and a decryption unit adapted to decrypt the encrypted data recorded onto the external recording medium by using a key that is dependent on the position information acquired by the position-information acquisition unit and that is generated by the key-generation unit.
摘要翻译：数据处理装置包括位置信息获取单元，适于获取数据处理装置的位置信息;密钥生成单元，用于根据由位置信息获取单元获取的位置信息生成密钥;加密单元，通过使用由密钥生成单元生成的密钥对数据进行加密来生成加密数据，适于将加密数据记录到外部记录介质上的记录单元，以及解密单元，其适于通过以下方式解密记录在外部记录介质上的加密数据：使用取决于位置信息获取单元获取并由密钥生成单元生成的位置信息的密钥。

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