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1. 发明专利

JP2012242874A Sales promotion article distribution device and sales promotion article distribution method 审中-公开
标题翻译：销售促销文章分发设备和销售促销文章分发方法
公开(公告)号：JP2012242874A
公开(公告)日：2012-12-10
申请号：JP2011109012
申请日：2011-05-16
申请人： Kazuhiro Sakaguchi , 和弘坂口 , Sang Jun Kim , 相俊金 , Tomizo Iwaya , 富三岩屋
发明人： SAKAGUCHI KAZUHIRO , KIM SANG JUN , IWAYA TOMIZO
IPC分类号： G06Q30/06 , G06Q30/02 , G07F9/00
摘要： PROBLEM TO BE SOLVED: To improve sales promotion effect by a sales promotion article distribution device.SOLUTION: A sales promotion article distribution device 200 attached to an automatic vending machine includes: a sales promotion article storage chamber 222 for storing sales promotion articles to which sales promotion information is attached; a delivery device 226 for conveying the sales promotion articles stored in the sales promotion article storage chamber 222 to a sales promotion article outlet 246; and a control device 280 for controlling the delivery device 226. The control device 280 controls the delivery device 226 such that the sales promotion articles are conveyed to the sales promotion article outlet 246 when receiving a purchase signal indicating that merchandise has been purchased from the automatic vending machine. Therefore, the sales promotion articles are automatically distributed from the sales promotion article distribution device 200 while being interlinked with the purchase of merchandise in the automatic vending machine. Thus, it is possible to improve sales promotion effect.
摘要翻译：要解决的问题：提高促销品分发装置的促销效果。＆lt; P＆gt;解决方案：附属于自动售货机的促销品分发装置200包括：销售促销品存储室222，用于存储销售促销信息所附的促销品; 用于将存储在促销用品存储室222中的促销用品传送到销售促销品出口246的送出装置226; 以及用于控制传送设备226的控制设备280.控制设备280控制传送设备226，使得销售促销物品在接收到指示已经从自动的购买中购买商品的购买信号时被传送到促销商品出口246 售货机。因此，销售促销品在与自动售货机中的商品的购买相互联系的同时自动从销售促销品分发装置200分发。因此，可以提高促销效果。版权所有（C）2013，JPO＆INPIT

2. 发明授权

US06996489B2 Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor 有权
公开(公告)号：US06996489B2
公开(公告)日：2006-02-07
申请号：US09796451
申请日：2001-03-02
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R31/28
CPC分类号： G01R31/31935 , G01R31/3004
摘要： An apparatus for sampling a power supply current value for performing frequency analysis of the power supply current flowing in an integrated circuit with a test signal applied to the integrated circuit has a power supply generating a prescribed supply of power for the integrated circuit (DUT: device under test), a current detection means for observing the power supply current value supplied from the power supply to the DUT, a test signal generation means for generating a prescribed test signal to be applied to an input/output terminal other than a power supply terminal of the DUT and for generating a test signal application signal during application of the test signal to the DUT, a sampling means for sampling the power supply current value signal, a sampling time determining means for instructing the sampling means with regard to the start and end timing for sampling, based on the test signal application signal, a sampling data storage means for storing data sampled by the sampling means, a Fourier transform means for performing a Fourier transformation calculation on the sampled data, and a main control means for outputting instructions to various other means and performing overall apparatus control.

3. 发明授权

US6058502A Diagnostic system analyzing frequency spectrum of electric power for diagnosing integrated circuit, method and information storage medium storing computer program for the method 有权
标题翻译：诊断系统分析电力频谱诊断集成电路，方法和信息存储介质存储计算机程序的方法
公开(公告)号：US6058502A
公开(公告)日：2000-05-02
申请号：US145236
申请日：1998-09-01
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R31/30 , G06F11/00 , G06F13/28
CPC分类号： G01R31/3004
摘要： A diagnosis system for a semiconductor integrated circuit repeatedly applies a test pattern at repetition periods so as to measure variation of electric power supplied to the semiconductor integrated circuit, and determines the magnitude of a spectral component at a fundamental frequency equal to the inverse of the repetition period and the magnitude of each spectral component at each harmonic of the fundamental frequency to see whether the spectral components fall within the magnitude ranges observed in an excellent semiconductor integrated circuit device so that the diagnosis is speedy and reliable.
摘要翻译：半导体集成电路的诊断系统在重复周期重复地施加测试图案，以便测量提供给半导体集成电路的电力的变化，并且确定基本频率等于重复的倒数的频谱分量的大小周期以及基频的每个谐波处的每个频谱分量的大小，以查看频谱分量是否落在在优秀的半导体集成电路器件中观察到的幅度范围内，从而诊断速度可靠。

4. 发明申请

US20110172941A1 SCREENING APPARATUS, SCREENING METHOD, AND PROGRAM 审中-公开
标题翻译：筛选设备，筛选方法和程序
公开(公告)号：US20110172941A1
公开(公告)日：2011-07-14
申请号：US13005972
申请日：2011-01-13
申请人： Kazuhiro SAKAGUCHI
发明人： Kazuhiro SAKAGUCHI
IPC分类号： G06F19/00
CPC分类号： G01R31/2894 , H01L22/20
摘要： A screening apparatus includes: a measurement unit measuring characteristics of a semiconductor device and reading an identification code allocated to the semiconductor device; a database storing a table representing a correspondence between an identification code and a fabrication condition of a semiconductor device; a conversion unit extracting, based on the identification code sent from the measurement unit, a corresponding fabrication condition from the database and associating the extracted fabrication condition with the characteristics corresponding to the fabrication condition; a characteristics reconstruction unit classifying the characteristics according to the fabrication condition sent from the conversion unit; and an evaluation and analysis unit evaluating and analyzing the characteristics classified by the characteristics reconstruction unit according to the fabrication condition in a predetermined manner and determining a semiconductor device to be screened.
摘要翻译：筛选装置包括：测量单元，测量半导体器件的特性并读取分配给半导体器件的识别码; 数据库，存储表示半导体器件的识别码和制造条件之间的对应关系的表; 转换单元，基于从测量单元发送的识别码，从数据库提取相应的制造条件，并将提取的制造条件与对应于制造条件的特性相关联; 特征重建单元，根据从转换单元发送的制造条件对特性进行分类; 以及评估和分析单元，以预定方式根据制造条件评估和分析由特征重建单元分类的特性，并确定要被筛选的半导体器件。

5. 发明授权

US06766485B1 Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program 失效
标题翻译：集成电路故障测试仪，集成电路故障测试方法和记录介质记录故障测试控制程序
公开(公告)号：US06766485B1
公开(公告)日：2004-07-20
申请号：US09669113
申请日：2000-09-25
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R3128
CPC分类号： G01R31/31924 , G01R31/3004 , G01R31/31721
摘要： A unit test signal having duration T is repeatedly supplied from an LSI tester to an IC under test and, simultaneously, a power source current is supplied from the LSI tester through a current detection unit to the IC under test. The power source current is monitored by the current detection unit and a current information obtained by the monitoring is analyzed by a spectrum analyzer unit. Since the repetition period of the test signal is T, the power source current having a period nT flows through the IC under test along with a state shift of the IC under test, where n is an integer. When the IC under test has a fault, the power source current flows with a period n′T, where n′ is an integer different from n, or an abnormal power source current flows with the period nT, due to a change of the state shift of the IC under test. A decision unit performs a fault decision of the IC under test by judging an existence of abnormal power source current or the change of the state shift of the IC under test on the basis of values of spectral power in the vicinity of a frequency 1/nT and high harmonics thereof of the power source current or existence or absence of peak having such period.
摘要翻译：具有持续时间T的单元测试信号从LSI测试器重复地提供给被测试的IC，同时，从LSI测试器通过电流检测单元将电源电流提供给被测IC。由电流检测单元监视电源电流，并通过频谱分析仪单元分析通过监视获得的电流信息。由于测试信号的重复周期为T，所以具有周期nT的电源电流随着被测试IC的状态偏移而流经所测试的IC，其中n是整数。当被测IC处于故障状态时，由于状态的变化，电源电流以不是n的整数而不是n的整数周期流动，或异常的电源电流以期间nT流动移动IC被测试。决定单元通过根据频率1 / nT附近的频谱功率的值判断异常电源电流的存在或被测IC的状态偏移的变化来进行被测IC的故障判定其电源电流的高次谐波或具有这种周期的峰的存在或不存在。

6. 发明授权

US06694274B2 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 有权
标题翻译：检测集成电路故障的集成电路的方法，进行该集成电路故障的装置以及进行该集成电路的记录介质的存储程序
公开(公告)号：US06694274B2
公开(公告)日：2004-02-17
申请号：US10320441
申请日：2002-12-17
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R2316
CPC分类号： G01R31/2851 , G01R31/3004 , G01R31/31721
摘要： Detecting failed integrated circuit among integrated circuits, by (a) assuming that all integrated circuits under test define under-test set, and testing each one of the integrated circuits in the under-test set, (b) removing integrated circuits judged to be in failure in step (a) from the under-test set, (c) measuring spectrum of a current supplied from a power source into each one of integrated circuits in under-test set, (d) calculating both mean value and standard deviation of spectrum for under-test set, (e) judging whether an integrated circuit is in failure or not, based on both the mean value and the standard deviation of the spectrum, (f) removing integrated circuits having been judged to be in failure in step (e), from the under-test set, and (g) judging under-test set to be in no failure. Thus, it possible to find failed integrated circuits without preparing data of integrated circuit in no failure, as a reference.
摘要翻译：检测集成电路中的故障集成电路，方法是：（a）假设所有被测试集成电路定义欠载测试集，并测试欠测试集中的每一个集成电路，（b）去除被认为在步骤（a）从欠测试组中失败，（c）测量从电源提供给电流不足的集成电路中的电流的频谱，（d）计算频谱的平均值和标准偏差（e）基于频谱的平均值和标准偏差来判断集成电路是否发生故障，（f）去除已经被判断为失败的集成电路（步骤 e），来自不足的测试集，（g）判断测试集不会失败。因此，可以在没有故障的情况下找到集成电路的数据而找到故障的集成电路，作为参考。

7. 发明授权

US06684170B2 Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same 有权
标题翻译：检测集成电路故障的集成电路的方法，进行该集成电路故障的装置以及进行该集成电路的记录介质的存储程序
公开(公告)号：US06684170B2
公开(公告)日：2004-01-27
申请号：US10320499
申请日：2002-12-17
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R2316
CPC分类号： G01R31/2851 , G01R31/3004 , G01R31/31721
摘要： There is provided a method of detecting an integrated circuit in failure among integrated circuits, based on spectrum which is a result of analyzing a frequency of a current running through an integrated circuit when a test signal is applied to the integrated circuit, comprising the steps of (a) assuming that all integrated circuits under test define a under-test integrated circuit set, and testing each one of the integrated circuits in the under-test integrated circuit set in a conventional manner, (b) removing integrated circuits having been judged to be in failure in the step (a), from the under-test integrated circuit set, (c) measuring spectrum of a current supplied from a power source into each one of the integrated circuits in the under-test integrated circuit set, (d) calculating both a mean value and standard deviation of the spectrum for the under-test integrated circuit set, (e) judging whether an integrated circuit is in failure or in no failure, based on both the mean value and the standard deviation of the spectrum, (f) removing integrated circuits having been judged to be in failure in the step (e), from the under-test integrated circuit set, and (g) judging the under-test integrated circuit set to be in no failure. The method makes it possible to find integrated circuits in failure without preparing data of an integrated circuit in no failure, as a reference.
摘要翻译：通过（a）假定所有被测试集成电路定义欠载测试集，并测试被测设备中的每一个集成电路，（b）去除被判断为故障的集成电路，检测集成电路中的故障集成电路在步骤（a）中，（c）测试从电源提供给电流不足的集成电路中的电流的频谱，（d）计算频谱的平均值和标准偏差（e）基于频谱的平均值和标准偏差来判断集成电路是否发生故障，（f）在步骤（e）中去除被判断为失败的集成电路），来自测试下的集合，（g）判断测试集不会失败。因此，可以在不准备集成电路的数据的情况下找到故障的集成电路，作为参考。

8. 发明授权

US06480011B2 Screening of semiconductor integrated circuit devices 失效
标题翻译：半导体集成电路器件的筛选
公开(公告)号：US06480011B2
公开(公告)日：2002-11-12
申请号：US09859478
申请日：2001-05-18
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G01R3128
CPC分类号： G01R31/319
摘要： A method of screening LSIs is provided, which makes it possible to screen out faulty LSIs before potential failure existing therein is elicited. A specific power supply voltage is supplied to LSIs to be tested while applying a specific test signal to the LSIs at a specific period. Power supply currents of the LSIs are observed. Sets of power spectrum data of the power supply currents are generated corresponding to the test signal. The distributions of the sets of power spectrum data are generated. whether or not the distributions of the sets of power spectrum data of the power supply currents are equal to or greater than a specific reference value is judged. When the distribution of the set of power spectrum data of the power supply current of one of the devices is equal is to or greater than the reference value, the device in question is regarded as a faulty one.
摘要翻译：提供了一种屏蔽LSI的方法，可以在其中存在潜在的故障之前屏蔽有缺陷的LSI。特定电源电压被提供给要测试的LSI，同时在特定的周期向LSI施加特定的测试信号。观察到LSI的电源电流。根据测试信号生成电源电流的功率谱数据集。产生功率谱数据集的分布。判断电源电流的功率谱数据组的分布是否等于或大于特定参考值。当一个设备的电源电流的功率谱数据集合的分布等于或大于参考值时，被认为是有问题的设备。

9. 发明申请

US20130057311A1 SCREENING METHOD, SCREENING DEVICE AND PROGRAM 有权
标题翻译：筛选方法，筛选装置和程序
公开(公告)号：US20130057311A1
公开(公告)日：2013-03-07
申请号：US13558980
申请日：2012-07-26
申请人： Kazuhiro SAKAGUCHI
发明人： Kazuhiro SAKAGUCHI
IPC分类号： G01R31/26
CPC分类号： G01R31/2894 , G01R31/31718 , H01L22/14 , H01L22/20
摘要： This invention is to detect defective products of semiconductor devices with high accuracy even when the characteristics of the semiconductor devices vary according to their positions on each of wafers. A screening method includes the steps of measuring respective electrical characteristic values of a plurality of semiconductor devices included in a wafer; acquiring respective positional information of the semiconductor devices over the wafer; subtracting components relatively gently varying over the surface of the wafer, of variations in the electrical characteristic values of the semiconductor devices from the respective electrical characteristic values of the semiconductor devices to thereby correct the respective electrical characteristic values of the semiconductor devices; generating distributions of the post-correction electrical characteristic values with respect to the semiconductor devices; and detecting semiconductor devices in which the post-correction electrical characteristic values assume outliers, out of the semiconductor devices, based on the distributions.
摘要翻译：本发明即使当半导体器件的特性根据其在每个晶片上的位置而变化时，也可以高精度地检测半导体器件的缺陷产物。筛选方法包括测量包括在晶片中的多个半导体器件的各个电特性值的步骤; 获取晶片上半导体器件的位置信息; 从半导体器件的各个电特性值减去半导体器件的电特性值的变化，从而校正半导体器件的各个电特性值; 产生相对于半导体器件的校正后电气特性值的分布; 以及基于所述分布，检测所述后校正电特性值在所述半导体器件中呈现离群值的半导体器件。

10. 发明授权

US08011011B2 Method and apparatus for processing data 有权
标题翻译：处理数据的方法和装置
公开(公告)号：US08011011B2
公开(公告)日：2011-08-30
申请号：US11007398
申请日：2004-12-08
申请人： Kazuhiro Sakaguchi
发明人： Kazuhiro Sakaguchi
IPC分类号： G06F7/04
CPC分类号： G06F21/10 , G06F21/6218 , G06F21/74 , G06F21/78 , G06F2221/2105
摘要： A data processing apparatus for processing and protecting data stored in a removable storage medium, including a medium monitoring unit configured to monitor the state of the removable storage medium, an information storage unit configured to store information, and a controller configured to move the data from the removable storage medium to the information storage unit in accordance with the monitoring result of the medium monitoring unit.
摘要翻译：一种用于处理和保护存储在可移动存储介质中的数据的数据处理装置，包括被配置为监视可移动存储介质的状态的介质监视单元，被配置为存储信息的信息存储单元和被配置为将数据从所述可移动存储介质根据所述介质监视单元的监视结果传送到所述信息存储单元。

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