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    • 6. 发明授权
    • Method for manufacturing a display device, and display device substrate
    • 显示装置的制造方法以及显示装置用基板
    • US06836140B2
    • 2004-12-28
    • US09983947
    • 2001-10-26
    • Takashi FujikawaYoshiharu KataokaHitoshi Matsumoto
    • Takashi FujikawaYoshiharu KataokaHitoshi Matsumoto
    • G01R3100
    • G02F1/1309G02F1/13452
    • A TEG (Test Element Group) block 1 includes a TFT (Thin Film Transistor) test element and a capacitance test element that are arranged adjacent to each other, and six test terminals. A TEG block 2 includes a resistance test element and a capacitance test element that are arranged adjacent to each other, and six test terminals. In these TEG blocks, the test terminals are arranged with the same pattern. Each of the test elements in each TEG block is connected to at least one of a plurality of test terminals included in that TEG block. The test elements can be efficiently formed on the substrate in view of the space on a display device substrate or the preference of characteristics to be evaluated. Moreover, characteristics of each test element can be conducted with a common probe regardless of the type of display device.
    • TEG(测试元件组)块1包括彼此相邻布置的TFT(薄膜晶体管)测试元件和电容测试元件,以及六个测试端子。 TEG模块2包括彼此相邻布置的电阻测试元件和电容测试元件,以及六个测试端子。 在这些TEG模块中,测试端子以相同的模式排列。 每个TEG块中的每个测试元件连接到包括在该TEG块中的多个测试终端中的至少一个测试元件。考虑到显示设备基板上的空间或者优选地,可以在衬底上有效地形成测试元件 的特征被评估。 此外,无论显示装置的类型如何,都可以使用普通探针来进行每个测试元件的特性。