会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Protection diode
    • 保护二极管
    • US08907424B2
    • 2014-12-09
    • US13739042
    • 2013-01-11
    • Koichi Fujita
    • Koichi Fujita
    • H01L23/62H01L27/02
    • H01L29/7808H01L27/0248H01L27/0255
    • A protection diode includes: a semiconductor substrate; a well region of a first conductivity type in the semiconductor substrate; a gate side diffusion region of a second conductivity type in the semiconductor substrate and joined to the well region; a grounding side diffusion region of the second conductivity type in the semiconductor substrate, separated from the gate side diffusion region, and joined to the well region; a gate side electrode connected between a gate of a transistor and the gate side diffusion region; and a grounding electrode connected to the grounding side diffusion region. Dopant impurity concentration in the grounding side diffusion region is lower than dopant impurity concentration in the gate side diffusion region.
    • 保护二极管包括:半导体衬底; 半导体衬底中的第一导电类型的阱区; 半导体衬底中的第二导电类型的栅极侧扩散区,并连接到阱区; 半导体衬底中的与栅极侧扩散区分离的第二导电类型的接地侧扩散区,并与阱区连接; 连接在晶体管的栅极和栅极侧扩散区之间的栅极电极; 以及连接到接地侧扩散区的接地电极。 接地侧扩散区域中的掺杂剂杂质浓度低于栅极侧扩散区域中的掺杂剂杂质浓度。
    • 7. 发明授权
    • Acceleration detecting device
    • 加速度检测装置
    • US6093898A
    • 2000-07-25
    • US210992
    • 1998-12-15
    • Kazunori SakamotoTateki KawamuraTsutomu TakeuchiKoichi Fujita
    • Kazunori SakamotoTateki KawamuraTsutomu TakeuchiKoichi Fujita
    • G01P15/00B60R21/16G01P15/04G01P15/135H01H35/14
    • H01H35/14G01P15/04G01P15/135
    • An acceleration detecting device includes a housing, a weight pivotally mounted inside the housing for rotating along a locus in response to an applied acceleration, a spring provided between the housing and the weight to apply a biasing force to the weight against the applied acceleration, and a contact assembly located outside the locus of the weight. The contact assembly is adapted to be electrically closed by the rotation of the weight. An arc-shaped circumference of the weight maintains the same distance between the weight and the contact assembly during the rotation of the weight. When an excessive acceleration is applied to the device, the weight rotates from an initial position against the biasing force of the spring to electrically close the contact assembly. The weight is returned to the initial position by the biasing force of the spring to electrically open the contact assembly when the excess acceleration is no longer present. Because the spring which applies the biasing force is separated from the contact assembly, the biasing force is reliably maintained for a longer period. Further, the weight can rotate without any interference to the contact assembly because the arc-shaped outer circumference of the weight maintains the contact assembly spaced from the locus of the weight.
    • 一种加速度检测装置,包括壳体,枢转地安装在壳体内的重物,用于响应于施加的加速度沿着轨迹旋转;弹簧,设置在壳体和重物之间,以抵抗施加的加速度向重物施加偏置力;以及 位于重量轨迹外的接触组件。 接触组件适于通过重物的旋转而电闭合。 在重量的旋转期间,重物的弧形圆周保持重量和接触组件之间的相同距离。 当对装置施加过大的加速度时,重量将克服弹簧的偏压力从初始位置旋转以电闭合接触组件。 当超过加速度不再存在时,重物通过弹簧的偏置力返回到初始位置,以电接触组件。 由于施加偏压力的弹簧与接触组件分离,因此可靠地保持偏压力较长的时间。 此外,由于重物的弧形外周保持接触组件与重物的轨迹间隔开,所以重量可以旋转而不会对接触组件产生任何干扰。