会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明授权
    • Semiconductor integrated circuit device for providing series regulator
    • 用于提供串联调节器的半导体集成电路器件
    • US07906946B2
    • 2011-03-15
    • US12076451
    • 2008-03-19
    • Shinichirou TaguchiYasuyuki IshikawaAkira SuzukiHideaki Ishihara
    • Shinichirou TaguchiYasuyuki IshikawaAkira SuzukiHideaki Ishihara
    • G05F1/00
    • G05F1/56
    • A semiconductor integrated circuit device for controlling an external output transistor is provided. The semiconductor integrated circuit device comprises: a first power supply circuit including an output circuit and providing a first series regulator in cooperation with the output external transistor; and a plurality of terminals. The plurality of terminals includes a control signal output terminal and high and low electric potential side power supply terminals for supplying electric power to the first power supply circuit. At least one of the high and low electric potential side power supply terminals is arranged adjacent to the control signal output terminal and defined as a first terminal. Short-circuiting between the control signal output terminal and the first terminal causes the external output transistor to switch into an off state.
    • 提供一种用于控制外部输出晶体管的半导体集成电路器件。 所述半导体集成电路装置包括:第一电源电路,包括输出电路,并与所述输出外部晶体管配合提供第一串联调节器; 和多个终端。 多个端子包括用于向第一电源电路供电的控制信号输出端子和高低电位侧电源端子。 高电压侧电源端子和低电位侧电源端子中的至少一个被配置为与控制信号输出端子相邻并被定义为第一端子。 控制信号输出端子与第一端子之间的短路导致外部输出晶体管切换到断开状态。
    • 7. 发明申请
    • Semiconductor integrated circuit device for providing series regulator
    • 用于提供串联调节器的半导体集成电路器件
    • US20080303497A1
    • 2008-12-11
    • US12076451
    • 2008-03-19
    • Shinichirou TaguchiYasuyuki IshikawaAkira SuzukiHideaki Ishihara
    • Shinichirou TaguchiYasuyuki IshikawaAkira SuzukiHideaki Ishihara
    • G05F1/00
    • G05F1/56
    • A semiconductor integrated circuit device for controlling an external output transistor is provided. The semiconductor integrated circuit device comprises: a first power supply circuit including an output circuit and providing a first series regulator in cooperation with the output external transistor; and a plurality of terminals. The plurality of terminals includes a control signal output terminal and high and low electric potential side power supply terminals for supplying electric power to the first power supply circuit. At least one of the high and low electric potential side power supply terminals is arranged adjacent to the control signal output terminal and defined as a first terminal. Short-circuiting between the control signal output terminal and the first terminal causes the external output transistor to switch into an off state.
    • 提供一种用于控制外部输出晶体管的半导体集成电路器件。 所述半导体集成电路装置包括:第一电源电路,包括输出电路,并与所述输出外部晶体管配合提供第一串联调节器; 和多个终端。 多个端子包括用于向第一电源电路供电的控制信号输出端子和高低电位侧电源端子。 高电压侧电源端子和低电位侧电源端子中的至少一个被配置为与控制信号输出端子相邻并被定义为第一端子。 控制信号输出端子与第一端子之间的短路导致外部输出晶体管切换到断开状态。
    • 8. 发明申请
    • Reset detection circuit in semiconductor integrated circuit
    • 半导体集成电路中的复位检测电路
    • US20070210834A1
    • 2007-09-13
    • US11714203
    • 2007-03-06
    • Yasuyuki IshikawaAkira SuzukiHideaki Ishihara
    • Yasuyuki IshikawaAkira SuzukiHideaki Ishihara
    • H03K5/153
    • H03K5/19H03K5/24
    • A reset detection circuit for a logic circuit and a RAM includes a first determining circuit, a second determining circuit and a reset signal generating circuit. The first determining circuit operates with a first voltage and determines whether a second voltage is equal to or higher than a reset voltage for the logic circuit. The second determining circuit operates with the first voltage and determines whether the first voltage is equal to or higher than a minimum operating voltage as a guarantee voltage for an operation of the first determining circuit. The reset signal generating circuit outputs a reset signal for resetting the logic circuit and the RAM, when the first voltage is lower than the minimum operating voltage and the second voltage is lower than the reset voltage.
    • 用于逻辑电路和RAM的复位检测电路包括第一确定电路,第二确定电路和复位信号发生电路。 第一确定电路以第一电压工作,并确定第二电压是否等于或高于逻辑电路的复位电压。 第二确定电路以第一电压工作,并且确定第一电压是否等于或高于最小工作电压,作为用于第一确定电路的操作的保证电压。 当第一电压低于最小工作电压并且第二电压低于复位电压时,复位信号发生电路输出用于复位逻辑电路和RAM的复位信号。
    • 9. 发明授权
    • Clamp circuit
    • 钳位电路
    • US06737905B1
    • 2004-05-18
    • US10374695
    • 2003-02-26
    • Shinichi NodaHideaki IshiharaAkira Suzuki
    • Shinichi NodaHideaki IshiharaAkira Suzuki
    • H03K508
    • H03K5/08G05F3/242
    • The clamp circuit clamps an input voltage at prescribed higher and lower clamp voltages which are stabilized under a temperature fluctuation. Transistors Q12 and Q14 are switched on in their linear region. In a lower voltage clamp circuit 18, an Vin detecting circuit 20 outputs Va1 by level-shifting Vin by Q13 and voltage-divides by series resistance circuit 23 the level-shifted Vin, while a reference voltage generating circuit 21 outputs Vr1 by level-shifting 0 V by Q15 and voltage-divides by series resistance circuit 25 the level-shifted voltage. Q11 is switched on, when a comparator 22 determines that Va1 descends and goes across Vr1. Here, Q12 is of the same characteristics as Q14, while Q13is of the same characteristics as Q15. Further, the resistance of the circuits 23 is the same as that of the circuit 25. The higher voltage clamp circuit 19 is similar to the circuit 18.
    • 钳位电路以在温度波动下稳定的规定的较高和较低钳位电压来钳位输入电压。 晶体管Q12和Q14在它们的线性区域中导通。 在较低电压钳位电路18中,Vin检测电路20通过电平移位Vin输出Va1,并通过串联电阻电路23对电平移位的Vin进行电压分压,而参考电压产生电路21通过电平移位输出Vr1 0 V由Q15和电压分压由串联电阻电路25的电平转换电压。 当比较器22确定Va1下降并经过Vr1时,Q11接通。 这里,Q12具有与Q14相同的特性,而Q13具有与Q15相同的特性。 此外,电路23的电阻与电路25的电阻相同。较高电压钳位电路19类似于电路18。