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    • 9. 发明授权
    • Magnetic random access memory (MRAM) read with reduced disturb failure
    • 磁性随机存取存储器(MRAM)以减少的干扰故障读取
    • US08570797B2
    • 2013-10-29
    • US13035006
    • 2011-02-25
    • Jung Pill KimTae Hyun KimKangho Lee
    • Jung Pill KimTae Hyun KimKangho Lee
    • G11C11/14
    • G11C11/1673G11C11/1693
    • Magnetic tunnel junctions (MTJs) in magnetic random access memory (MRAM) are subject to read disturb events when the current passing through the MTJ causes a spontaneous switching of the MTJ due to spin transfer torque (STT) from a parallel state to an anti-parallel state or from an anti-parallel state to a parallel state. Because the state of the MTJ corresponds to stored data, a read disturb event may cause data loss in MRAM devices. Read disturb events may be reduced by controlling the direction of current flow through the MTJ. For example, the current direction through a reference MTJ may be selected based on the state of the reference MTJ. In another example, the current direction through a data or reference MTJ may be alternated such that the MTJ is only subject to read disturb events during approximately half the read operations on the MTJ.
    • 磁流体随机存取存储器(MRAM)中的磁隧道结(MTJ)在经过MTJ的电流导致由于自旋转移转矩(STT)从平行状态到抗反射的MTJ自发切换时,受到读取干扰事件, 平行状态或从反平行状态到并行状态。 因为MTJ的状态对应于存储的数据,读取干扰事件可能导致MRAM设备中的数据丢失。 通过控制通过MTJ的电流的方向可以减少读取干扰事件。 例如,可以基于参考MTJ的状态来选择通过参考MTJ的当前方向。 在另一示例中,可以交替通过数据或参考MTJ的当前方向,使得MTJ仅在MTJ上的大约一半的读取操作期间经受读取干扰事件。