专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

WO2017162677A1 LASER SENSOR FOR ULTRA-FINE PARTICLE SIZE DETECTION 审中-公开
标题翻译：用于超细微粒尺寸检测的激光传感器
公开(公告)号：WO2017162677A1
公开(公告)日：2017-09-28
申请号：PCT/EP2017/056702
申请日：2017-03-21
申请人： KONINKLIJKE PHILIPS N.V.
发明人： SPRUIT, Johannes, Hendrikus, Maria , VAN DER LEE, Alexander, Marc , JUTTE, Petrus, Theodorus , RONDA, Cornelis, Reinder , DE GRAAF, Pascal , MOENCH, Holger , HELLMIG, Joachim, Wilhelm
IPC分类号： G01N15/02 , G01B9/02 , G01N15/14 , G01N15/00
摘要： The invention describes a laser sensor module (100) for detecting ultra-fine particles (10) with a particle size of 300 nm or less, more preferably 200 nm or less, most preferably 100 nm or less, the laser sensor module (100) comprising: - at least one laser (110) being adapted to emit laser light to at least one focus region in reaction to signals provided by at least one electrical driver (130), - at least one detector (120) being adapted to determine a self-mixing interference signal of an optical wave within a laser cavity of the at least one laser (110), wherein the self-mixing interference signal is caused by reflected laser light reentering the laser cavity, the reflected laser light being reflected by a particle receiving at least a part of the laser light, - the laser sensor module (100) being arranged to perform at least one self- mixing interference measurement, - the laser sensor module (100) being adapted to determine a first particle size distribution function with a first sensitivity by means of at least one measurement result determined based on the at least one self-mixing interference measurement, the laser sensor module being further adapted to determine a second particle size distribution function with the second sensitivity, the second sensitivity being different from the first sensitivity, - the at least one evaluator (140) being adapted to determine a particle measure of the particle size of 300 nm or less by subtracting the second particle size distribution function multiplied with a calibration factor q from the first particle size distribution function. The invention further describes a corresponding method and computer program product. The invention enables a simple and low-cost particle detection module or particle detector based on laser self-mixing interference which can detect particles with a size of 100 nm or even less.
摘要翻译：本发明描述了用于检测粒径为300nm或更小，更优选200nm或更小，最优选100nm或更小的超细颗粒（10）的激光传感器模块（100），所述激光传感器模块（100）包括： - 至少一个激光器（110），其适于响应于由至少一个电驱动器（130）提供的信号而将激光发射到至少一个聚焦区域， - 至少一个检测器（120）适于确定所述至少一个激光器（110）的激光腔内的光波的自混合干涉信号，其中所述自混合干涉信号由重新进入所述激光腔的反射激光引起，所述反射的激光被接收激光的至少一部分的粒子反射， - 激光传感器模块（100）被设置为执行至少一个自混合干涉测量， - 激光传感器模块（100）适于确定第一粒度分布函数借助于基于所述至少一个自混合干涉测量确定的至少一个测量结果以第一灵敏度接通，所述激光传感器模块还适于利用所述第二灵敏度确定第二粒度分布函数，所述第二灵敏度为不同于第一灵敏度， - 所述至少一个评估器（140）适于通过从第一粒度减去与校准因子q相乘的第二粒度分布函数来确定300nm或更小的粒度的粒子测量分配功能。本发明进一步描述了相应的方法和计算机程序产品。本发明能够实现简单且低成本的基于激光自混合干涉的粒子检测模块或粒子检测器，其可以检测尺寸为100nm或更小的粒子。

2. 发明申请

WO2017055160A1 LIGHT EMITTING DEVICE 审中-公开
标题翻译：发光装置
公开(公告)号：WO2017055160A1
公开(公告)日：2017-04-06
申请号：PCT/EP2016/072498
申请日：2016-09-22
申请人： KONINKLIJKE PHILIPS N.V.
发明人： GRONENBORN, Stephan , MILLER, Michael , DANNBERG, Peter , SCHUERMANN, Mark , MOENCH, Holger
IPC分类号： H01S5/183 , H01S5/00 , H01S5/02 , H01S5/028
CPC分类号： H01S5/18388 , H01S5/0042 , H01S5/0201 , H01S5/0283 , H01S2301/17
摘要： The invention describes a light emitting device (100). The light emitting device (100) comprises at least one light emitting structure (110), at least one processing layer (120) and at least one optical structure (130). The optical structure (130) comprises at least one material processed by means of processing light (150). The at least one processing layer (120) is arranged to reduce reflection of the processing light (150) ina direction of the optical structure (130) at least by 50%, preferably at least by 80%, more preferably at least by 95% and most preferably at least by 99% during processing of the material by means of the processing light (150). It is a basic idea of thepresent invention to incorporate a non-or low- reflective processing layer (120) on top of a light emitting structure (110) like a VCSEL array in order to enable on wafer processing of light emitting structures (130) like microlens arrays. The invention further describes a method of manufacturing such a light emitting device (100).
摘要翻译：本发明描述了一种发光器件（100）。发光器件（100）包括至少一个发光结构（110），至少一个处理层（120）和至少一个光学结构（130）。光学结构（130）包括通过处理光（150）处理的至少一种材料。所述至少一个处理层（120）被布置成减少所述光学结构（130）的方向上的所述加工光（150）的反射至少50％，优选至少80％，更优选至少95％并且最优选至少99％，在通过处理光（150）处理材料期间。本发明的基本思想是在诸如VCSEL阵列的发光结构（110）的顶部上并入非反射或低反射的处理层（120），以便能够对发光结构（130）进行晶片处理，像微透镜阵列。本发明还描述了一种制造这种发光器件（100）的方法。

3. 发明申请

WO2017016888A1 LASER SENSOR FOR PARTICLE DENSITY DETECTION 审中-公开
标题翻译：激光传感器用于颗粒密度检测
公开(公告)号：WO2017016888A1
公开(公告)日：2017-02-02
申请号：PCT/EP2016/066754
申请日：2016-07-14
申请人： KONINKLIJKE PHILIPS N.V.
发明人： VAN DER LEE, Alexander, Marc , HELLMIG, Joachim, Wilhelm , SPRUIT, Johannes, Hendrikus, Maria , MOENCH, Holger , RONDA, Cornelis, Reinder , KARAKAYA, Koray
IPC分类号： G01N15/14 , G01S17/32 , G01S17/58 , G01S17/95 , G01B9/02 , G01N15/02 , G01S7/48 , G01S7/491
CPC分类号： G01B9/02092 , G01N15/06 , G01N15/1434 , G01N15/1456 , G01N2015/0046 , G01N2015/0693 , G01N2015/1075 , G01N2015/1454 , G01S7/4802 , G01S7/4817 , G01S7/4916 , G01S17/32 , G01S17/58 , G01S17/87 , G01S17/95 , Y02A90/19
摘要： The invention describes a laser sensor module (100) for particle density detection. The laser sensor module (100) comprising at least one first laser (110), at least one first detector (120) and at least one electrical driver (130). The first laser (110) is adapted to emit first laser light in reaction to signals provided by the at least one electrical driver (130). The at least one first detector (120) is adapted to detect a first self-mixing interference signal of an optical wave within a first laser cavity of the first laser (110). The first self-mixing interference signal is caused by first reflected laser light reentering the first laser cavity, the first reflected laser light being reflected by a particle receiving at least a part of the first laser light. The laser sensor module (100) is adapted to reduce multiple counts of the particle. The invention further describes a related method and computer program product.
摘要翻译：本发明描述了一种用于粒子密度检测的激光传感器模块（100）。激光传感器模块（100）包括至少一个第一激光器（110），至少一个第一检测器（120）和至少一个电驱动器（130）。第一激光器（110）适于响应于由至少一个电驱动器（130）提供的信号发射第一激光。所述至少一个第一检测器（120）适于检测所述第一激光器（110）的第一激光腔内的光波的第一自混合干涉信号。第一自混合干涉信号是由第一反射激光重新进入第一激光腔引起的，第一反射激光被接受至少一部分第一激光的粒子反射。激光传感器模块（100）适于减少颗粒的多个计数。本发明进一步描述了相关方法和计算机程序产品。

4. 发明申请

WO2015091117A1 LASER MODULE WITH SIMPLIFIED ALIGNMENT 审中-公开
标题翻译：具有简化对准的激光模块
公开(公告)号：WO2015091117A1
公开(公告)日：2015-06-25
申请号：PCT/EP2014/077098
申请日：2014-12-10
申请人： KONINKLIJKE PHILIPS N.V.
发明人： GRONENBORN, Stephan , HEUSLER, Gero , CONRADS, Ralf Gordon , MOENCH, Holger
IPC分类号： H01S5/022 , H01S5/024 , H01L33/00 , H01S5/00 , H01S5/02 , H01S5/40
CPC分类号： H01S5/02476 , H01L23/50 , H01L23/544 , H01L2223/54426 , H01L2223/54486 , H01L2924/0002 , H01S5/0202 , H01S5/02268 , H01S5/02288 , H01S5/02469 , H01S5/423 , H01L2924/00
摘要： The invention describes carrier structure (100, 200) for assembling a semiconductor lighting module, comprising at least two sub carriers (110, 210) and an alignment structure (120, 130, 230, 232) mechanically coupling the sub carriers (110, 210). The alignment structure (120, 130, 230, 232) is adapted such that the mechanical coupling to at least a part of the sub carriers (110, 210) disappears during thermal mating the carrier structure (100, 200) on a carrier (110, 250). The alignment structure (120, 130, 230, 232) is further adapted to compensate a coefficient of thermal expansion of a material of the carrier (110, 250) being higher than a coefficient of thermal expansion of a material of the carrier structure (100, 200). The invention further describes a semiconductor chip comprising such a carrier structure (100, 200) and a semiconductor lighting module comprising the carrier structure (100, 200) or the semiconductor chip. The invention finally describes a corresponding method of manufacturing a semiconductor lighting module. The invention enables assembling of semiconductor lighting modules by thermal mating with reduced alignment effort.
摘要翻译：本发明描述了用于组装半导体照明模块的载体结构（100,200），其包括至少两个子载体（110,210）和对准结构（120,130,230,232），其将所述子载体（110,210））。对准结构（120,130,230,232）适于使得在将载体结构（100,200）热载体配合在载体（110,210）上时，至少部分副载体（110,210）的机械耦合消失，250）。对准结构（120,130,230,232）还适于补偿载体（110,250）的材料的热膨胀系数高于载体结构材料（100）的材料的热膨胀系数，200）。本发明还描述了一种包括这种载体结构（100,200）和包括载体结构（100,200）或半导体芯片的半导体照明模块的半导体芯片。本发明最后描述了制造半导体照明模块的相应方法。本发明能够通过热配合减少对准力来组装半导体照明模块。

5. 发明申请

WO2014083485A1 LASER DEVICE FOR PROJECTING A STRUCTURED LIGHT PATTERN ONTO A SCENE 审中-公开
标题翻译：用于将结构化的光图案投射到场景的激光装置
公开(公告)号：WO2014083485A1
公开(公告)日：2014-06-05
申请号：PCT/IB2013/060325
申请日：2013-11-22
申请人： KONINKLIJKE PHILIPS N.V. , PHILIPS DEUTSCHLAND GMBH
发明人： MOENCH, Holger , GRONENBORN, Stephan , CARPAIJ, Mark
IPC分类号： H01S5/42 , H01S5/00 , H01S5/183 , G01S17/93 , H04N5/235
CPC分类号： G01B11/254 , G01B11/2513 , G01S7/4815 , G01S17/46 , G01S17/89 , G01S17/936 , H01S5/005 , H01S5/18394 , H01S5/423 , H04N5/235 , H04N5/265
摘要： The present invention relates to a laser device (10) for projecting a structured light pattern (9) onto a scene (15). The device is formed of several arrays (1) of semiconductor lasers (2), each array (1) comprising an irregular distribution of emission areas (2a) of the semiconductor lasers (2). One or several imaging optics (4) image said arrays (1) to an imaging space and superpose the images of said arrays (1) in the imaging space to form said light pattern (9). The proposed laser device generates a light pattern with high contrast and efficiency which may be used for 3D imaging systems, e. g. in automotive applications.
摘要翻译：本发明涉及一种用于将结构化光图案（9）投射到场景（15）上的激光装置（10）。该器件由半导体激光器（2）的几个阵列（1）形成，每个阵列（1）包括半导体激光器（2）的发射区域（2a）的不规则分布。一个或多个成像光学器件（4）将所述阵列（1）成像到成像空间，并将所述阵列（1）的图像叠加在成像空间中以形成所述光图案（9）。所提出的激光装置产生可以用于3D成像系统的高对比度和高效率的光图案，例如， G。在汽车应用中。

6. 发明申请

WO2016131658A1 INFRARED LASER ILLUMINATION DEVICE 审中-公开
标题翻译：红外激光照明装置
公开(公告)号：WO2016131658A1
公开(公告)日：2016-08-25
申请号：PCT/EP2016/052320
申请日：2016-02-04
申请人： KONINKLIJKE PHILIPS N.V.
发明人： HELLMIG, Joachim Wilhelm , HOEVEN, Pieter , VAN DER KLOET, Robert , MOENCH, Holger
IPC分类号： G01S7/481 , G01S17/89 , H01S5/42 , H04N13/02
CPC分类号： G01S7/4815 , G01S17/89 , H01S5/423
摘要： The invention describes an illumination device (100) for illuminating a three dimensional arrangement (250) in an infrared wavelength spectrum. The illumination device (100) comprises at least a first group of laser devices (110) comprising at least one laser device (105) and at least a second group of laser devices (120) comprising at least one laser device (105). The first and the second group of laser devices (110, 120) are adapted to be operated independent with respect to each other. The first group of laser devices (110) is adapted to emit laser light with a first emission characteristic and the second group of laser devices (120) is adapted to emit laser light with a second emission characteristic different from the first emission characteristic. The invention further describes a distance detection device (150) and a camera system (300) comprising such an illumination device (100). The different emission characteristics may be used to compensate or take into account the depth of the three dimensional arrangement (250). Different parts of the three dimensional arrangement (250) may be illuminated by means of the first and second emission characteristic in different ways.
摘要翻译：本发明描述了用于照射红外波长光谱的三维排列（250）的照明装置（100）。照明装置（100）至少包括第一组激光装置（110），其包括至少一个激光装置（105）和至少第二组包括至少一个激光装置（105）的激光装置（120）。第一组和第二组激光装置（110,120）适于相对于彼此独立地操作。第一组激光器件（110）适于发射具有第一发射特性的激光，并且第二组激光器件（120）适于发射具有与第一发射特性不同的第二发射特性的激光。本发明进一步描述了包括这种照明装置（100）的距离检测装置（150）和相机系统（300）。可以使用不同的发射特性来补偿或考虑三维排列（250）的深度。可以通过不同方式的第一和第二发射特性来照亮三维排列（250）的不同部分。

7. 发明公开

EP3433599A1 LASER SENSOR FOR ULTRA-FINE PARTICLE SIZE DETECTION 有权转让
公开(公告)号：EP3433599A1
公开(公告)日：2019-01-30
申请号：EP17711674.6
申请日：2017-03-21
申请人： Koninklijke Philips N.V.
发明人： SPRUIT, Johannes, Hendrikus, Maria , VAN DER LEE, Alexander, Marc , JUTTE, Petrus, Theodorus , RONDA, Cornelis, Reinder , DE GRAAF, Pascal , MOENCH, Holger , HELLMIG, Joachim, Wilhelm
IPC分类号： G01N15/02 , G01B9/02 , G01N15/14 , G01N15/00

8. 发明公开

EP3370311A1 METHOD OF DETERMINING OPERATION CONDITIONS OF A LASER-BASED PARTICLE DETECTOR 审中-公开
公开(公告)号：EP3370311A1
公开(公告)日：2018-09-05
申请号：EP17158808.0
申请日：2017-03-02
申请人： Koninklijke Philips N.V.
发明人： WEICHMANN, Ulrich , HELLMIG, Joachim Wilhelm , VAN DER LEE, Alexander Marc , MOENCH, Holger
IPC分类号： H01S5/183 , H01S5/00 , H01S5/062 , G01N15/02 , G01S7/491 , G01N15/14 , H01S5/026 , H01S5/065 , G01N15/00 , G01N15/10
CPC分类号： H01S5/0028 , G01N15/0205 , G01N15/1434 , G01N2015/0003 , G01N2015/1075 , G01N2015/1454 , G01N2015/1486 , G01N2015/1493 , H01S5/0264 , H01S5/0622 , H01S5/0653 , H01S5/183 , H01S2301/02
摘要： The invention describes a method of determining operation conditions of a particle detector (200) for detecting a particle density of particles with a size of less than 20 µm, preferably less than 10 µm in a fluid, wherein the particle detector (200) comprises a laser (111), wherein the laser is a multimode Vertical Cavity Surface Emitting Laser, the method comprising the steps of:
providing an electrical drive current to the laser (111) such that a laser beam (112) is emitted by the laser,
varying the drive current within a predefined range of drive currents,
determining an intensity signal of an optical wave within a laser cavity of the laser (111) as a function of the drive current,
determining a noise measure of the intensity signal as a function of the drive current,
determining a range of drive currents in which the noise measure is below a predefined threshold value,
determining at least a part of the operation conditions of the particle detector (200) by choosing a drive current for particle detection out of the determined range of drive currents.
The invention further relates to a particle detector (200) and a mobile device (190) comprising such a particle detector (200). The invention finally relates to a related computer program product.

9. 发明授权

EP2456382B1 EPILATION BY APPLYING LIGHT 有权转让
标题翻译：脱毛光应用的方式
公开(公告)号：EP2456382B1
公开(公告)日：2015-02-25
申请号：EP10740347.9
申请日：2010-07-08
申请人： Koninklijke Philips N.V. , Philips Intellectual Property & Standards GmbH
发明人： MOENCH, Holger , ACKERMANN, Bernd
IPC分类号： A61B18/20 , A61N5/06
CPC分类号： A61B18/203 , A61B18/20 , A61B2017/00057 , A61B2018/00452 , A61B2018/00476 , A61B2018/00636 , A61B2018/00904 , A61B2018/2065 , A61N2005/0629 , A61N2005/0652

10. 发明公开

EP3259612A1 INFRARED LASER ILLUMINATION DEVICE 有权转让
标题翻译：红外激光照明装置
公开(公告)号：EP3259612A1
公开(公告)日：2017-12-27
申请号：EP16703103.8
申请日：2016-02-04
申请人： Koninklijke Philips N.V.
发明人： HELLMIG, Joachim Wilhelm , HOEVEN, Pieter , VAN DER KLOET, Robert , MOENCH, Holger
IPC分类号： G01S7/481 , G01S17/89 , H01S5/42 , H04N13/02
CPC分类号： G01S7/4815 , G01S17/89 , H01S5/423
摘要： The invention describes an illumination device (100) for illuminating a three dimensional arrangement (250) in an infrared wavelength spectrum. The illumination device (100) comprises at least a first group of laser devices (110) comprising at least one laser device (105) and at least a second group of laser devices (120) comprising at least one laser device (105). The first and the second group of laser devices (110, 120) are adapted to be operated independent with respect to each other. The first group of laser devices (110) is adapted to emit laser light with a first emission characteristic and the second group of laser devices (120) is adapted to emit laser light with a second emission characteristic different from the first emission characteristic. The invention further describes a distance detection device (150) and a camera system (300) comprising such an illumination device (100). The different emission characteristics may be used to compensate or take into account the depth of the three dimensional arrangement (250). Different parts of the three dimensional arrangement (250) may be illuminated by means of the first and second emission characteristic in different ways.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式