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1. 发明申请

WO2008020379A2 RADIATION DETECTOR WITH COUNTING ELECTRONICS 审中-公开
标题翻译：有计数电子的辐射探测器
公开(公告)号：WO2008020379A2
公开(公告)日：2008-02-21
申请号：PCT/IB2007/053182
申请日：2007-08-10
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , HERRMANN, Christoph , STEADMAN, Roger , ZEITLER, Guenter , BAEUMER, Christian
发明人： HERRMANN, Christoph , STEADMAN, Roger , ZEITLER, Guenter , BAEUMER, Christian
IPC分类号： G01T1/17
CPC分类号： G01T1/17
摘要： The invention relates to a radiation detector, particularly an X-ray detector (100), comprising a counting circuitry (10, 20, 30) for counting electrical pulses generated by the (sub-)pixels (2) of the detector. In the counting circuitry, the results counted by a fast counting stage (10) are at intervals transferred to a slow counting stage (20). The fast counting stage (10) may for example comprise a fast counter (111) with a low bit-depth operating as a frequency divider in front of a slow counter (121) of high bit-depth in the slow counting stage (20). The counting circuitry (10, 20, 30) can optionally be fed via a multiplexer (4) with the signals of several (sub-)pixels (2). Furthermore, the pixels (1, 2) of the radiation device may optionally deliver energy resolved pulses.
摘要翻译：本发明涉及一种辐射探测器，特别是一种X射线探测器（100），其包括用于对由（子）像素（（子））产生的电脉冲进行计数的计数电路（10,20,30） 2）的检测器。在计数电路中，由快速计数级（10）计数的结果以间隔转移到慢速计数级（20）。快速计数级（10）例如可以包括具有低位深度的快速计数器（111），其在慢计数级（20）中作为高位深度的慢计数器（121）前面的分频器进行操作，。计数电路（10,20,30）可以可选地经由多路复用器（4）与几个（子）像素（2）的信号一起被馈送。此外，辐射装置的像素（1,2）可以可选地传递能量分解脉冲。

2. 发明申请

WO2008155680A2 SPECTRAL PHOTON COUNTING DETECTOR 审中-公开
标题翻译：光谱计数检测器
公开(公告)号：WO2008155680A2
公开(公告)日：2008-12-24
申请号：PCT/IB2008/052043
申请日：2008-05-23
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , HERRMANN, Christoph , STEADMAN, Roger , BAEUMER, Christian , ZEITLER, Guenter
发明人： HERRMANN, Christoph , STEADMAN, Roger , BAEUMER, Christian , ZEITLER, Guenter
IPC分类号： G01T1/17 , G01T1/164
CPC分类号： G01T1/171
摘要： An apparatus includes an integrator (120) that produces a pulse having a peak amplitude indicative of the energy of a detected photon. First discharging circuitry (136) discharges the integrator (120) at a first discharging speed, and second discharging circuitry (124) discharges the integrator (120) at a second discharging speed. The first discharging speed is less than the second discharging speed.
摘要翻译：一种装置包括产生具有指示被检测光子的能量的峰值振幅的脉冲的积分器（120）。第一放电电路（136）以第一放电速度放电积分器（120），第二放电电路（124）以第二放电速度放电积分器（120）。第一放电速度小于第二放电速度。

3. 发明申请

WO2008146218A2 SPECTRAL PHOTON COUNTING DETECTOR 审中-公开
标题翻译：光谱计数检测器
公开(公告)号：WO2008146218A2
公开(公告)日：2008-12-04
申请号：PCT/IB2008/052029
申请日：2008-05-22
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , HERRMANN, Christoph , STEADMAN, Roger , BAEUMER, Christian , ZEITLER, Guenter
发明人： HERRMANN, Christoph , STEADMAN, Roger , BAEUMER, Christian , ZEITLER, Guenter
CPC分类号： G01T1/171
摘要： An apparatus includes a scale factor determiner (236) that determines a count scale factor based on a measured count of a number detected photons for an energy threshold and an estimated actual count of the number of detected photons. The photons include poly-energetic photons detected by a radiation sensitive detector. The apparatus further includes a count sealer (136) that employs the count scale factor to scale measured counts of detected photons for different energy thresholds.
摘要翻译：一种装置包括比例因子确定器（236），该比例因子确定器（236）基于针对能量阈值的检测到的光子数量的测量计数和检测到的光子数量的估计实际计数来确定计数比例因子。光子包括由辐射敏感检测器检测的多能光子。该装置还包括计数密封器（136），其使用计数比例因子来缩放检测到的光子对于不同能量阈值的计数。

4. 发明申请

WO2008050283A3 APPARATUS, IMAGING DEVICE AND METHOD FOR DETECTING X-RAY RADIATION 审中-公开
公开(公告)号：WO2008050283A3
公开(公告)日：2008-05-02
申请号：PCT/IB2007/054283
申请日：2007-10-22
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , STEADMAN, Roger , ZEITLER, Guenter , HERRMANN, Christoph , BAEUMER, Christian
发明人： STEADMAN, Roger , ZEITLER, Guenter , HERRMANN, Christoph , BAEUMER, Christian
IPC分类号： G01T1/17
摘要： The invention is directed at an apparatus (10), an imaging device and a method for detecting X-ray photons, in particular photons (32,34) in a computer tomograph. Photons (32,34) are converted into an electrical pulse and compared against a threshold using a discriminator (20). The electrical network (12) performing these functions comprises a switching element (28), that can modify the electrical path (22) along which the process signals travel. The trigger signal (V T ) for actuating the switching element (28) is derived from an electrical state of the electrical path (22). If a pulse associated to a photon (32,34) is detected, the switching element (28) is actuated in order to avoid that the processing of the charge pulse stemming from a first photon (32) is affected by a subsequent second photon (34).

5. 发明申请

WO2010119358A2 SPECTRAL IMAGING 审中-公开
标题翻译：光谱成像
公开(公告)号：WO2010119358A2
公开(公告)日：2010-10-21
申请号：PCT/IB2010/051101
申请日：2010-03-15
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , BAEUMER, Christian , HERRMANN, Christoph , STEADMAN, Roger , RUETTEN, Walter
发明人： BAEUMER, Christian , HERRMANN, Christoph , STEADMAN, Roger , RUETTEN, Walter
CPC分类号： G01T1/1647 , G01T1/2985
摘要： An imaging system includes a scintillator array (202) and a digital photomultiplier array (204). A photon counting channel (212), an integrating channel (210), and a moment generating channel (214) process the output signal of the digital photomultiplier array (204). A reconstructor (122) spectrally resolves the first, the second and the third output signals. In one embodiment, a controller (232) activates the photon counting channel (212) to process the digital signal only if a radiation flux is below a predetermined threshold. An imaging system includes at least one direct conversion layer (302) and at least two scintillator layers (304) and corresponding photosensors (306). A photon counting channel (212) processes an output of the at least one direct conversion layer (302), and an integrating channel (210) and a moment generating channel (214) process respective outputs of the photosensors (306). A reconstructor (122) spectrally resolves the first, the second and the third output signals.
摘要翻译：成像系统包括闪烁体阵列（202）和数字光电倍增管阵列（204）。光子计数通道（212），积分通道（210）和力矩产生通道（214）处理数字光电倍增管阵列（204）的输出信号。重建器（122）对第一，第二和第三输出信号进行光谱解析。在一个实施例中，仅当辐射通量低于预定阈值时，控制器（232）激活光子计数通道（212）才能处理数字信号。成像系统包括至少一个直接转换层（302）和至少两个闪烁体层（304）和对应的光电传感器（306）。光子计数通道（212）处理至少一个直接转换层（302）的输出，并且积分通道（210）和力矩产生通道（214）处理光电传感器（306）的相应输出。重建器（122）对第一，第二和第三输出信号进行光谱解析。

6. 发明申请

WO2011077302A3 RADIATION DETECTOR ASSEMBLY WITH TEST CIRCUITRY 审中-公开
公开(公告)号：WO2011077302A3
公开(公告)日：2011-06-30
申请号：PCT/IB2010/055633
申请日：2010-12-07
申请人： KONINKLIJKE PHILIPS ELECTRONICS N.V. , PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , HERRMANN, Christoph , STEADMAN, Roger , MUELHENS, Oliver
发明人： HERRMANN, Christoph , STEADMAN, Roger , MUELHENS, Oliver
IPC分类号： G01T1/24 , G01T7/00
摘要： A radiation detector assembly (20) includes a detector array module (40) configured to convert radiation particles to electrical detection pulses, and an application specific integrated circuit (ASIC) (42) operatively connected with the detector array. The ASIC includes signal processing circuitry (60) configured to digitize an electrical detection pulse received from the detector array, and test circuitry (80) configured to inject a test electrical pulse into the signal processing circuitry. The test circuitry includes a current meter (84) configured to measure the test electrical pulse injected into the signal processing circuitry, and a charge pulse generator (82) configured to generate a test electrical pulse that is injected into the signal processing circuitry. The radiation detector assembly (20) is assembled by operatively connecting the ASIC (42) with the detector array module (40), and the signal processing circuitry (60) of the ASIC of the assembled radiation detector assembly is tested without the use of radiation.

7. 发明申请

WO2007110799A2 LOW OHMIC THROUGH SUBSTRATE INTERCONNECTION FOR SEMICONDUCTOR CARRIERS 审中-公开
标题翻译：通过半导体载体的基板互连实现低欧姆性
公开(公告)号：WO2007110799A2
公开(公告)日：2007-10-04
申请号：PCT/IB2007/050914
申请日：2007-03-16
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N.V. , VOGTMEIER, Gereon , STEADMAN, Roger , DORSCHEID, Ralf , JONKERS, Jeroen
发明人： VOGTMEIER, Gereon , STEADMAN, Roger , DORSCHEID, Ralf , JONKERS, Jeroen
IPC分类号： H01L23/48
CPC分类号： H01L21/76898 , H01L23/481 , H01L2224/0401 , H01L2224/05 , H01L2224/131 , H01L2924/014
摘要： It is described a low ohmic Through Wafer Interconnection (TWI) for electronic chips formed on a semiconductor substrate (600). The TWI comprises a first connection (610) extending between a front surface and a back surface of the substrate (600). The first connection (610) comprises a through hole filled with a low ohmic material having a specific resistivity lower than poly silicon. The TWI further comprises a second connection (615) also extending between the front surface and the back surface. The second connection (615) is spatially separated from the first connection (610) by at least a portion of the semiconductor substrate (600). The front surface is provided with a integrated circuit arrangement (620) wherein the first connection (610) is electrically coupled to at least one node of the integrated circuit arrangement (620) without penetrating the integrated circuit arrangement (620). During processing the TWI the through hole may be filled first with a non-metallic material, e.g. poly silicon. After forming integrated components (620) on top of the front surface the substrate (600) may be thinned and the non-metallic material may be substituted with the low ohmic material, which is in particular a metallic material.
摘要翻译：描述了形成在半导体衬底（600）上的用于电子芯片的低欧姆直通晶片互连（TWI）。 TWI包括在衬底（600）的前表面和后表面之间延伸的第一连接（610）。第一连接（610）包括填充有比多晶硅电阻率低的低欧姆材料的通孔。 TWI还包括也在前表面和后表面之间延伸的第二连接（615）。第二连接（615）通过半导体衬底（600）的至少一部分与第一连接（610）在空间上分离。前表面设置有集成电路布置（620），其中第一连接（610）电耦合到集成电路布置（620）的至少一个节点而不穿透集成电路布置（620）。在处理TWI期间，通孔可以首先用非金属材料填充，例如，多晶硅。在前表面顶部形成集成组件（620）之后，衬底（600）可以变薄，并且非金属材料可以用特别是金属材料的低欧姆材料替代。

8. 发明申请

WO2007023416A1 ELECTRICALLY SHIELDED THROUGH-WAFER INTERCONNECT 审中-公开
标题翻译：电气屏蔽通过波形互连
公开(公告)号：WO2007023416A1
公开(公告)日：2007-03-01
申请号：PCT/IB2006/052809
申请日：2006-08-15
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N.V. , STEADMAN, Roger , VOGTMEIER, Gereon , DORSCHEID, Ralf
发明人： STEADMAN, Roger , VOGTMEIER, Gereon , DORSCHEID, Ralf
IPC分类号： H01L23/48 , H01L23/60
CPC分类号： H01L23/481 , H01L23/552 , H01L2223/6622 , H01L2224/13 , H01L2224/13025
摘要： Through-Wafer Interconnections allow for the usage of cost-effective substrates for detector chips . According to an exemplary embodiment of the present invention, detecting element for application in an examination apparatus may be provided, comprising a wafer with a sensitive region and a coaxial through-wafer interconnect structure. This may reduce the susceptibility of the interconnection by providing an effective shielding.
摘要翻译：通过晶片互连允许为检测器芯片使用经济高效的基板。根据本发明的示例性实施例，可以提供用于检查装置中的检测元件，其包括具有敏感区域的晶片和同轴贯通晶片互连结构。这可以通过提供有效的屏蔽来降低互连的敏感性。

9. 发明申请

WO2004068168A1 X-RAY DETECTOR 审中-公开
标题翻译： X射线探测器
公开(公告)号：WO2004068168A1
公开(公告)日：2004-08-12
申请号：PCT/IB2004/050046
申请日：2004-01-22
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N.V. , VOGTMEIER, Gereon , MORALES SERRANO, Francisco , STEADMAN, Roger
发明人： VOGTMEIER, Gereon , MORALES SERRANO, Francisco , STEADMAN, Roger
IPC分类号： G01T1/20
CPC分类号： G01T1/2018
摘要： The invention relates to an X-ray detector for detecting X-radiation, as used, in particular, in computer tomographic (CT) systems. The X-ray detector in accordance with the invention is composed of a photo sensor device, which comprises individual detector elements (1), above which scintillator elements (2) are disposed. These convert the incident X-ray light (6) into visible or UV light (7), which is detected by a photodiode (4) located on the detector element (1). In accordance with the invention, a micro-lens (3), which focuses the light (7) departing from the scintillator element (2) onto the photodiode (4), is disposed between the scintillator element (2) and the detector element (1). It is possible, in this manner, to use large areas of the detector element (1) for further electronic components (5) outside the photodiode (4), and, at the same time, to ensure a high DQE (Detection Quantum Efficiency) in that the light (7) departing from the scintillator element (2) is virtually fully exploited. The crosstalk from scatter radiation from adjacent detector elements is effectively prevented simultaneously.
摘要翻译：本发明涉及用于检测X射线的X射线检测器，特别是在计算机断层摄影（CT）系统中使用。根据本发明的X射线检测器由光传感器装置组成，该光传感器装置包括单独的检测器元件（1），其上设置有闪烁体元件（2）。这些将入射的X射线光（6）转换成由位于检测器元件（1）上的光电二极管（4）检测到的可见光或紫外光（7）。根据本发明，将从闪烁体元件（2）离开的光（7）聚焦到光电二极管（4）上的微透镜（3）设置在闪烁体元件（2）和检测器元件（ 1）。以这种方式，可以将大面积的检测器元件（1）用于在光电二极管（4）外部的另外的电子部件（5），同时，为了确保高的DQE（检测量子效率）因为从闪烁体元件（2）出发的光（7）实际上被充分利用。来自相邻检测器元件的散射辐射的串扰被有效地同时防止。

10. 发明申请

WO2006018804A1 MICROELECTRONIC SYSTEM WITH A PASSIVATION LAYER 审中-公开
标题翻译：具有钝化层的微电子系统
公开(公告)号：WO2006018804A1
公开(公告)日：2006-02-23
申请号：PCT/IB2005/052673
申请日：2005-08-11
申请人： PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH , KONINKLIJKE PHILIPS ELECTRONICS N. V. , VOGTMEIER, Gereon , STEADMAN, Roger , ZEITLER, Günter , ENGEL, Klaus Jürgen , WIECZOREK, Herfried
发明人： VOGTMEIER, Gereon , STEADMAN, Roger , ZEITLER, Günter , ENGEL, Klaus Jürgen , WIECZOREK, Herfried
IPC分类号： H01L27/146 , H01L31/0216 , H01L31/101 , H01L31/115 , G01T1/20 , H05G1/00 , G01V5/00
CPC分类号： H01L27/14663 , H01L27/14676 , H01L31/085 , H01L31/101 , H01L31/115
摘要： The invention relates to a microelectronic system, particularly for an X-ray detector, comprising a semiconductor layer (1) with an array of pixels (P) which are composed of photosensitive components (3) and associated electronic circuits (4). An insulating passivation layer (5) with recesses (5a) in its surface is disposed between the semiconductor layer (1) and a scintillator (8). A shielding metal (6) for the protection of the electronic circuits (4) from X-radiation may be disposed in the recesses (5a) of the passivation layer (5). Furthermore, the recesses may contain glue for the fixation of the scintillator (8), wherein the passivation layer (5) additionally serves as a spacer between scintillator (8) and semiconductor layer (1).
摘要翻译：本发明涉及一种微电子系统，特别是一种用于X射线检测器的微电子系统，其包括具有由光敏元件（3）和相关电子电路（4）组成的像素阵列（P）的半导体层（1）。在其表面上具有凹部（5a）的绝缘钝化层（5）设置在半导体层（1）和闪烁体（8）之间。用于保护电子电路（4）免受X射线的屏蔽金属（6）可设置在钝化层（5）的凹槽（5a）中。此外，凹部可以包含用于固定闪烁体（8）的胶，其中钝化层（5）另外用作闪烁体（8）和半导体层（1）之间的间隔物。

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