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    • 2. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20120069668A1
    • 2012-03-22
    • US13235426
    • 2011-09-18
    • Kosuke HATSUDA
    • Kosuke HATSUDA
    • G11C16/04
    • G11C16/10G11C16/0483G11C16/30
    • According to one embodiment, a semiconductor storage device includes a transistor, a first node, a first capacitor, a first switch, and a second switch. One end of the transistor is connected to a first voltage source supplying a first voltage. The first node is charged to the first voltage by the transistor. One of electrodes of the first capacitor is connected to the first node, and the other of the electrodes of the first capacitor is supplied with a first clock signal having a second voltage. One end of the first switch is connected to the first node. The first switch outputs a potential of the first node at a first time at which the first switch is turned on. One end of the second switch is connected to the first node. The second switch outputs the potential of the first node at a second time.
    • 根据一个实施例,半导体存储装置包括晶体管,第一节点,第一电容器,第一开关和第二开关。 晶体管的一端连接到提供第一电压的第一电压源。 第一个节点被晶体管充电到第一个电压。 第一电容器的电极中的一个连接到第一节点,并且第一电容器的另一个电极被提供有具有第二电压的第一时钟信号。 第一开关的一端连接到第一节点。 第一开关在第一开关被接通的第一时间输出第一节点的电位。 第二开关的一端连接到第一节点。 第二个开关在第二个时间输出第一个节点的电位。
    • 4. 发明申请
    • SEMICONDUCTOR MEMORY
    • 半导体存储器
    • US20120320665A1
    • 2012-12-20
    • US13422110
    • 2012-03-16
    • Yoshihiro UEDAKosuke HATSUDA
    • Yoshihiro UEDAKosuke HATSUDA
    • G11C11/00
    • G11C11/1673
    • A semiconductor memory includes a first memory cell including: a first resistance change element and a first select transistor. The semiconductor memory includes a second memory cell including: a second select transistor and a second resistance change element. The semiconductor memory includes a third memory cell including: a third select transistor and a third resistance change element, the third memory cell acting as a reference cell. The semiconductor memory includes a fourth memory cell including: a fourth resistance change element and a fourth select transistor, the fourth memory cell acting as a reference cell.
    • 半导体存储器包括:第一存储单元,包括:第一电阻变化元件和第一选择晶体管。 半导体存储器包括第二存储单元,其包括:第二选择晶体管和第二电阻变化元件。 半导体存储器包括第三存储单元,第三存储单元包括:第三选择晶体管和第三电阻变化元件,第三存储单元用作参考单元。 半导体存储器包括:第四存储单元,包括:第四电阻变化元件和第四选择晶体管,第四存储单元用作参考单元。
    • 5. 发明申请
    • MEMORY SYSTEM, CONTROLLER, AND DATA TRANSFER METHOD
    • 存储系统,控制器和数据传输方法
    • US20110055462A1
    • 2011-03-03
    • US12860160
    • 2010-08-20
    • Kosuke HATSUDADaisaburo Takashima
    • Kosuke HATSUDADaisaburo Takashima
    • G06F12/00G06F12/02G06F12/16
    • G06F11/1441
    • According to one embodiment, a memory system includes a nonvolatile first memory, a nonvolatile second memory, a data-copy processing unit and a data invalidation processing unit. The first memory has a storage capacity for n (n≧2) pages per word line. The nonvolatile second memory temporarily stores user data write-requested from a host apparatus. The data-copy processing unit executes data copy processing including reading out, in page units, the user data stored in the second memory and sequentially writing the read-out user data in page units in the first memory. The data invalidation processing unit selects, after the execution of the data copy processing, based on whether the memory cell group per word line stores user data for n pages, user data requiring backup out of the user data subjected to the data copy processing and leaves the selected user data in the second memory as backup data.
    • 根据一个实施例,存储器系统包括非易失性第一存储器,非易失性第二存储器,数据复制处理单元和数据无效化处理单元。 第一个存储器具有每个字线n(n≥2)页的存储容量。 非易失性第二存储器临时存储从主机设备写入请求的用户数据。 数据复制处理单元执行数据复制处理,包括以页为单位读出存储在第二存储器中的用户数据,并以页单元顺序地将读出的用户数据写入第一存储器。 数据无效处理单元在执行数据复制处理之后,根据每个字线的存储单元组是否存储n页的用户数据,选择需要备份的用户数据进行数据复制处理的用户数据,并且离开 所选择的用户数据在第二存储器中作为备份数据。