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    • 2. 发明授权
    • Temperature measuring apparatus and temperature measuring method
    • 温度测量仪和温度测量方法
    • US07952717B2
    • 2011-05-31
    • US12043406
    • 2008-03-06
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • G01B9/02
    • G01K11/125
    • A temperature measuring apparatus includes a light source, a first splitter, a second splitter, a reference beam reflector, an optical path length adjuster, a reference beam transmitting member, a first to an nth measuring beam transmitting member and a photodetector. The temperature measuring apparatus further includes a controller that stores, as initial peak position data, positions of interference peaks respectively measured in advance by irradiating the first to the nth measuring beam onto the first to the nth measurement point of the temperature measurement object, and compares the initial peak position data to positions of interference peaks respectively measured during a temperature measurement to thereby estimate a temperature at each of the first to the nth measurement point.
    • 温度测量装置包括光源,第一分离器,第二分离器,参考光束反射器,光程长度调节器,参考光束传输部件,第一至第N测量光束传输部件和光电检测器。 温度测量装置还包括控制器,该控制器通过将第一至第N测量光束照射到温度测量对象的第一至第N测量点上,预先分别测量的干扰峰的位置作为初始峰值位置数据,并将其进行比较 初始峰值位置数据分别在温度测量期间测量的干涉峰位置,从而估计第一至第n测量点中的每一个处的温度。
    • 4. 发明授权
    • Temperature measurement apparatus and method
    • 温度测量装置及方法
    • US08585284B2
    • 2013-11-19
    • US13428870
    • 2012-03-23
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • G01J5/00G01B9/02
    • G01K11/00G01K11/125
    • A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetector that measures an interference between the first reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a second photodetector that measures an intensity of the second reflected reference beam; and a temperature calculation unit. The temperature calculation unit calculates a location of the interference by subtracting an output signal of the second photodetector from an output signal of the first photodetector, and calculates a temperature of the target object from the calculated location of the interference.
    • 温度测量装置包括光源; 第一分离器,其将光束分成测量光束和参考光束; 反射参考光束的参考光束反射器; 光路长度调节器; 第二分离器,其将反射的参考光束分成第一反射参考光束和第二反射参考光束; 测量第一反射参考光束与由目标物体反射的测量光束获得的反射测量光束之间的干涉的第一光电检测器; 第二光电检测器,其测量第二反射参考光束的强度; 和温度计算单元。 温度计算单元通过从第一光电检测器的输出信号减去第二光电检测器的输出信号来计算干扰的位置,并根据所计算的干扰位置计算目标对象的温度。
    • 6. 发明授权
    • Temperature measurement apparatus and method
    • 温度测量装置及方法
    • US08144332B2
    • 2012-03-27
    • US12399431
    • 2009-03-06
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • G01B9/02G01B11/02
    • G01K11/00G01K11/125
    • A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetector that measures an interference between the first reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a second photodetector that measures an intensity of the second reflected reference beam; and a temperature calculation unit. The temperature calculation unit calculates a location of the interference by subtracting an output signal of the second photodetector from an output signal of the first photodetector, and calculates a temperature of the target object from the calculated location of the interference.
    • 温度测量装置包括光源; 第一分离器,其将光束分成测量光束和参考光束; 反射参考光束的参考光束反射器; 光路长度调节器; 第二分离器,其将反射的参考光束分成第一反射参考光束和第二反射参考光束; 测量第一反射参考光束与由目标物体反射的测量光束获得的反射测量光束之间的干涉的第一光电检测器; 第二光电检测器,其测量第二反射参考光束的强度; 和温度计算单元。 温度计算单元通过从第一光电检测器的输出信号减去第二光电检测器的输出信号来计算干扰的位置,并根据所计算的干扰位置计算目标对象的温度。
    • 8. 发明申请
    • TEMPERATURE MEASUREMENT APPARATUS AND METHOD
    • 温度测量装置和方法
    • US20120207189A1
    • 2012-08-16
    • US13428870
    • 2012-03-23
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • Jun AbeTatsuo MatsudoChishio Koshimizu
    • G01K11/00
    • G01K11/00G01K11/125
    • A temperature measurement apparatus includes a light source; a first splitter that splits a light beam into a measurement beam and a reference beam; a reference beam reflector that reflects the reference beam; an optical path length adjustor; a second splitter that splits the reflected reference beam into a first reflected reference beam and a second reflected reference beam; a first photodetector that measures an interference between the first reflected reference beam and a reflected measurement beam obtained by the measurement beam reflected from a target object; a second photodetector that measures an intensity of the second reflected reference beam; and a temperature calculation unit. The temperature calculation unit calculates a location of the interference by subtracting an output signal of the second photodetector from an output signal of the first photodetector, and calculates a temperature of the target object from the calculated location of the interference.
    • 温度测量装置包括光源; 第一分离器,其将光束分成测量光束和参考光束; 反射参考光束的参考光束反射器; 光路长度调节器; 第二分离器,其将反射的参考光束分成第一反射参考光束和第二反射参考光束; 测量第一反射参考光束与由目标物体反射的测量光束获得的反射测量光束之间的干涉的第一光电检测器; 第二光电检测器,其测量第二反射参考光束的强度; 和温度计算单元。 温度计算单元通过从第一光电检测器的输出信号减去第二光电检测器的输出信号来计算干扰的位置,并根据所计算的干扰位置计算目标对象的温度。