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    • 3. 发明申请
    • Layout Content Analysis for Source Mask Optimization Acceleration
    • 源掩码优化加速的布局内容分析
    • US20110047519A1
    • 2011-02-24
    • US12778083
    • 2010-05-11
    • Juan Andres Torres RoblesOberdan OttoYuri Granik
    • Juan Andres Torres RoblesOberdan OttoYuri Granik
    • G06F17/50
    • G06F17/5081G01R31/26G03F1/0069G03F1/0092G03F1/36G03F1/38G03F1/70G03F7/70125G03F7/70441G06F17/5068G06F19/00G06F2217/12G06F2217/14G06K9/00G21K5/00H01L21/00H01L22/00
    • The invention provides for the acceleration of a source mask optimization process. In some implementations, a layout design is analyzed by a pattern matching process, wherein sections of the layout design having similar patterns are identified and consolidated into pattern groups. Subsequently, sections of the layout design corresponding to the pattern groups may be analyzed to determine their compatibility with the optical lithographic process, and the compatibility of these sections may be classified based upon a “cost function.” With further implementations, the analyzed sections may be classified as printable or difficult to print, depending upon the particular lithographic system. The compatibility of various sections of a layout design may then be utilized to optimize the layout design during a lithographic friendly design process. For example, during the design phase, sections categorized as difficult to print may be flagged for further optimization, processing, or redesign. In further implementations, the difficult-to-print sections may be subjected to a source mask optimization process. Subsequently, the entire layout design may receive a conventional resolution enhancement treatment using the optimized source.
    • 本发明提供了源掩码优化过程的加速。 在一些实现中,通过模式匹配过程来分析布局设计,其中具有相似图案的布局设计的部分被识别并且被合并到模式组中。 随后,可以分析对应于图案组的布局设计的部分以确定它们与光学平版印刷工艺的兼容性,并且可以基于“成本函数”对这些部分的兼容性进行分类。通过进一步的实施,分析的部分可以 根据特定的光刻系统,可分类为可印刷或难以印刷。 然后可以利用布局设计的各个部分的兼容性来在光刻友好的设计过程期间优化布局设计。 例如,在设计阶段,分类为难以打印的部分可能被标记以进一步优化,处理或重新设计。 在进一步的实现中,难以打印的部分可以经受源掩码优化处理。 随后,整个布局设计可以使用优化的源接收常规的分辨率增强处理。