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1. 发明申请

US20070024866A1 Method of combining holograms 失效
标题翻译：组合全息图的方法
公开(公告)号：US20070024866A1
公开(公告)日：2007-02-01
申请号：US11181664
申请日：2005-07-14
申请人： Jon Nisper , Mike Mater , Alex Klooster , Zhenhua Huang
发明人： Jon Nisper , Mike Mater , Alex Klooster , Zhenhua Huang
IPC分类号： G01B11/02
CPC分类号： G01B11/2441 , G01B11/306
摘要： A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt angle and direction correction is added, and a third phase image is generated. Phase images of objects which are too large to be imaged in an interferometric imaging system can thus be produced.
摘要翻译：公开了一种组合物体的全息图或相位图像的方法，其中用于记录物体表面的重叠部分的两个相位图像的数据的属性被比较并用于匹配两个记录的像素。添加相对倾斜角度和方向校正，并生成第三相位图像。因此可以产生太大而不能在干涉成像系统中成像的物体的相位图像。

2. 发明授权

US07359065B2 Method of combining holograms 失效
标题翻译：组合全息图的方法
公开(公告)号：US07359065B2
公开(公告)日：2008-04-15
申请号：US11181664
申请日：2005-07-14
申请人： Jon Nisper , Michael Mater , Alex Klooster , Zhenhua Huang
发明人： Jon Nisper , Michael Mater , Alex Klooster , Zhenhua Huang
IPC分类号： G01B11/02
CPC分类号： G01B11/2441 , G01B11/306
摘要： A method of combining holograms or phase images of an object is disclosed, where attributes of the data used to record two phase images of overlapping portions of the surface of an object are compared and used to match pixels of the two recordings. A relative tilt angle and direction correction is added, and a third phase image is generated. Phase images of objects which are too large to be imaged in an interferometric imaging system can thus be produced.
摘要翻译：公开了一种组合物体的全息图或相位图像的方法，其中用于记录物体表面的重叠部分的两个相位图像的数据的属性被比较并用于匹配两个记录的像素。添加相对倾斜角度和方向校正，并生成第三相位图像。因此可以产生太大而不能在干涉成像系统中成像的物体的相位图像。

3. 发明申请

US20070188764A1 Optical instrument and components thereof 失效
标题翻译：光学仪器及其组件
公开(公告)号：US20070188764A1
公开(公告)日：2007-08-16
申请号：US11504187
申请日：2006-08-15
申请人： Jon Nisper , Michael Mater , Bernard Berg
发明人： Jon Nisper , Michael Mater , Bernard Berg
IPC分类号： G01N21/47
CPC分类号： G01J3/10 , G01J3/02 , G01J3/0213 , G01J3/0264 , G01J3/0272 , G01J3/0275 , G01J3/0289 , G01J3/0291 , G01J3/26 , G01J3/28 , G01J3/50 , G01J3/501 , G01J3/51 , G01J3/513 , G01J3/524 , G01J2003/1213 , G01J2003/1282 , G01J2003/2866 , G01J2003/467
摘要： An optical assembly for use with a spectrophotometer. The optical assembly may comprise an illumination source, a detection sensor, a monitor sensor, and an optical piece having a first side adapted to face a sample. The optical piece may define an illumination channel extending from the illumination source toward the first side. The optical piece may also define a detection channel extending from the first side toward the detection sensor. In addition, the optical piece may define a monitor channel extending from the illumination channel toward the monitor sensor. Also, a light emitting diode (LED) assembly for use with an optical measurement device. The LED assembly may comprise a substrate having a top surface and a bottom surface and a plurality of LED dies positioned on the substrate to emit light in a first direction normal to the bottom surface of the substrate. The LED assembly may also comprise a plurality of leads in electrical contact with the plurality of LED dies. The plurality of leads may be positioned on the bottom surface of the substrate, and may be configured to surface-mount to a board.
摘要翻译：用于分光光度计的光学组件。光学组件可以包括照明源，检测传感器，监视器传感器和具有适于面向样品的第一侧的光学片。光学片可以限定从照明源向第一侧延伸的照明通道。光学片还可以限定从第一侧向检测传感器延伸的检测通道。此外，光学片可以限定从照明通道延伸到监视器传感器的监视器通道。另外，与光学测量装置一起使用的发光二极管（LED）组件。 LED组件可以包括具有顶表面和底表面的衬底和位于衬底上的多个LED管芯，以在垂直于衬底的底表面的第一方向上发光。 LED组件还可以包括与多个LED管芯电接触的多个引线。多个引线可以定位在基板的底表面上，并且可以被配置为表面安装到基板。

4. 发明申请

US20070291993A1 Measuring an appearance property of a surface using a bidirectional reflectance distribution function 有权
标题翻译：使用双向反射分布函数测量表面的外观性质
公开(公告)号：US20070291993A1
公开(公告)日：2007-12-20
申请号：US11810012
申请日：2007-06-04
申请人： Jon Nisper , Patrick Rood , Brett Pawlanta , Thomas Richardson , Brian Teunis
发明人： Jon Nisper , Patrick Rood , Brett Pawlanta , Thomas Richardson , Brian Teunis
IPC分类号： G06K9/00
CPC分类号： G01N21/474 , G01N21/55 , G01N21/8422 , G01N2021/4711
摘要： An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
摘要翻译：一种用于测量表面的空间欠采样双向反射分布函数（BRDF）的装置。该装置可以包括用于从第一照明方向照射表面的第一光源和被定位成接收由表面反射的光的多个传感器。多个传感器可以包括第一，第二和第三传感器，其被定位成接收由第一，第二和第三非共面方向上的表面反射的光。在各种实施例中，装置还可以包括与多个传感器通信的计算机。计算机被配置为考虑到第一，第二和第三反射方向将由多个传感器感测的光转换成表面的第一外观特性。

5. 发明授权

US5538674A Method for reproducing holograms, kinoforms, diffractive optical elements and microstructures 失效
$Method for reproducing holograms, kinoforms, diffractive optical elements and microstructures$
标题翻译：用于再现全息图，奇异变形，衍射光学元件和微结构的方法
公开(公告)号：US5538674A
公开(公告)日：1996-07-23
申请号：US154558
申请日：1993-11-19
申请人： Jon Nisper , Gina Kritchevsky
发明人： Jon Nisper , Gina Kritchevsky
IPC分类号： B29C33/12 , B29C33/38 , B29C33/42 , B29C39/02 , B29C45/00 , B29C45/37 , B29D11/00 , G02B5/18 , G03H1/02 , G03H1/18
CPC分类号： G03H1/0276 , B29C33/3842 , B29C33/3857 , B29C33/424 , B29C39/026 , B29C45/372 , B29D11/00 , B29D11/00769 , B29D11/00971 , G02B5/1876 , B29C45/00 , B29L2011/00 , B29L2011/005 , B29L2031/7224 , G03H1/0891 , G03H2001/0284 , G03H2001/0296 , Y10T428/22
摘要： A method of molding a plastic element having a microstructure embedded therein includes the steps of providing a master having a microstructure therein; casting a liquid surface coating over said master; solidifying the liquid surface coating to form a rigid molding tool containing said microstructure; placing the molding tool into a molding machine; introducing a plastic element into the molding machine; transferring the microstructure from the molding tool to the plastic element; and removing the molded plastic element from the molding machine. The molding tool may also be produced by machining directly into a molding base element a predetermined microstructure without machining through a transfer interlayer. An injection-molded binary optical element produced according to the method of the present invention provides an injection molded optical element which diffracts light.
摘要翻译：一种模塑具有嵌入其中的微结构的塑料元件的方法包括以下步骤：提供其中具有微结构的母版; 在所述主体上铸造液体表面涂层; 固化液体表面涂层以形成包含所述微结构的刚性模制工具; 将成型工具放置在成型机中; 将塑料元件引入成型机中; 将所述微结构从所述模制工具转移到所述塑料元件; 并从成型机中取出模塑塑料元件。模制工具也可以通过直接加工成模制基体元件而不通过传输中间层进行机械加工而制成预定的微结构。根据本发明的方法制造的注塑二元光学元件提供了衍射光的注射成型光学元件。

6. 发明申请

US20070035740A1 Optical instrument 失效
标题翻译：光学仪器
公开(公告)号：US20070035740A1
公开(公告)日：2007-02-15
申请号：US11504120
申请日：2006-08-15
申请人： Jon Nisper , Michael Mater
发明人： Jon Nisper , Michael Mater
IPC分类号： G01N21/47
CPC分类号： G01J3/28 , G01J3/0275 , G01J3/0289 , G01J3/10 , G01J3/50 , G01J3/501 , G01J3/51 , G01J3/513 , G01J3/524 , G01J2003/1282 , G01J2003/2866 , G01J2003/467
摘要： An optical system comprising an optical instrument and a processing unit. The optical instrument may comprise an illumination source and a sensor. The processing unit may comprise a data storage having stored thereon a characterization of the illumination source and a characterization of the sensor. The processing unit may also comprise a computer configured to calculate a system response of the illumination source and the receiving element considering the characterization of the illumination source and the characterization of the receiving element.
摘要翻译：一种光学系统，包括光学仪器和处理单元。光学仪器可以包括照明源和传感器。处理单元可以包括其上存储有照明源的表征和传感器的表征的数据存储器。处理单元还可以包括计算机，其被配置为考虑照明源的特征和接收元件的表征来计算照明源和接收元件的系统响应。

7. 发明申请

US20060245632A1 Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function 有权
标题翻译：使用空间欠采样的双向反射分布函数测量表面的外观性质
公开(公告)号：US20060245632A1
公开(公告)日：2006-11-02
申请号：US11410451
申请日：2006-04-25
申请人： Jon Nisper , Patrick Rood , Brett Pawlanta , Thomas Richardson , Brian Teunis
发明人： Jon Nisper , Patrick Rood , Brett Pawlanta , Thomas Richardson , Brian Teunis
IPC分类号： G06K9/00
CPC分类号： G01J3/50 , G01J3/02 , G01J3/0291 , G01J3/504 , G01N21/474 , G01N21/55
摘要： An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.
摘要翻译：一种用于测量表面的空间欠采样双向反射分布函数（BRDF）的装置。该装置可以包括用于从第一照明方向照射表面的第一光源和被定位成接收由表面反射的光的多个传感器。多个传感器可以包括第一，第二和第三传感器，其被定位成接收由第一，第二和第三非共面方向上的表面反射的光。在各种实施例中，装置还可以包括与多个传感器通信的计算机。计算机被配置为考虑到第一，第二和第三反射方向将由多个传感器感测的光转换成表面的第一外观特性。

8. 发明申请

US20070051880A1 Devices and methods for targeting printing plates and measuring dot coverage thereon 有权
标题翻译：用于瞄准印版并测量其上的点覆盖的装置和方法
公开(公告)号：US20070051880A1
公开(公告)日：2007-03-08
申请号：US11517911
申请日：2006-09-08
申请人： Bernard Berg , Peter Vander Jagt , Rob Kuschinsky , Chris Lafontaine , Jon Nisper , Michael Weber
发明人： Bernard Berg , Peter Vander Jagt , Rob Kuschinsky , Chris Lafontaine , Jon Nisper , Michael Weber
IPC分类号： G02F1/01
CPC分类号： G03F5/00 , B41C1/1083 , G01N21/21 , G01N21/95684 , G01N2021/95646 , G03F7/20 , G03F7/38
摘要： An apparatus, system and method for targeting an image formed on an imaging member. The imaging member includes an imaging sensitive layer formed thereon. The imaging member includes imaged and non-imaged areas. Light of a predetermined wavelength reflected from a target area of the imaging member is received. The light reflected from the target area is representative of an image formed on the imaging sensitive layer using energy at approximately the predetermined wavelength. The predetermined wavelength is suitable to initiate crosslinking of the imaging sensitive layer.
摘要翻译：一种用于瞄准形成在成像构件上的图像的装置，系统和方法。成像构件包括其上形成的成像敏感层。成像构件包括成像区域和非成像区域。接收从成像构件的目标区域反射的预定波长的光。从目标区域反射的光代表使用大约预定波长的能量在成像敏感层上形成的图像。预定波长适于引发成像敏感层的交联。

9. 发明申请

US20060181714A1 Method for processing multiwavelength interferometric imaging data 审中-公开
标题翻译：多波长干涉成像数据处理方法
公开(公告)号：US20060181714A1
公开(公告)日：2006-08-17
申请号：US11194103
申请日：2005-07-29
申请人： Michael Mater , Jon Nisper , Brett Pawlanta , Steven Furtwangler
发明人： Michael Mater , Jon Nisper , Brett Pawlanta , Steven Furtwangler
IPC分类号： G01B11/02
CPC分类号： G01B9/02087 , G01B9/02007 , G01B11/2441 , G01B11/306
摘要： Data from an imaging interferometer producing at least three interferometric images of a surface of an object using at least three different frequencies of light illuminating the surface of the object is processed through a software data processing pipeline architecture which uses data processed by a plurality of data processors to generate a three dimensional surface profile of the surface of the object.
摘要翻译：使用通过使用由多个数据处理器处理的数据的软件数据处理流水线架构来处理使用至少三个不同的照射对象的表面的光的至少三个不同的光的频率来产生物体表面的至少三个干涉图像的成像干涉仪的数据以产生物体表面的三维表面轮廓。

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