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    • 8. 发明授权
    • Systems and methods for updating detector parameters in a data processing circuit
    • 用于更新数据处理电路中检测器参数的系统和方法
    • US08578253B2
    • 2013-11-05
    • US12651956
    • 2010-01-04
    • Shaohua YangJonseung ParkChangyou XuMadhusudan KalluriYuan Xing LeeKapil Gaba
    • Shaohua YangJonseung ParkChangyou XuMadhusudan KalluriYuan Xing LeeKapil Gaba
    • H03M13/00
    • H03M13/1111G11B2220/2516H03M13/3723
    • Various embodiments of the present invention provide systems and methods for updating detector parameters in a data processing circuit. For example, a data processing circuit is disclosed that includes a first detector circuit, a second detector circuit, and a calibration circuit. The first detector circuit is operable to receive a first data set and to apply a data detection algorithm to the first data set, and the second detector circuit is operable to receive a second data set and to apply the data detection algorithm to the second data set. The calibration circuit is operable to calculate a data detection parameter based upon a third data set. The data detection parameter is used by the first detector circuit in applying the data detection algorithm to the first data set during a period that the data detection parameter is used by the second detector circuit in applying the data detection algorithm to the second data set.
    • 本发明的各种实施例提供用于在数据处理电路中更新检测器参数的系统和方法。 例如,公开了一种包括第一检测器电路,第二检测器电路和校准电路的数据处理电路。 第一检测器电路可操作以接收第一数据集并将数据检测算法应用于第一数据集,并且第二检测器电路可操作以接收第二数据集并将数据检测算法应用于第二数据集 。 校准电路可操作以基于第三数据集计算数据检测参数。 数据检测参数由第一检测器电路在将数据检测算法应用于第二数据集时由第二检测器电路使用的时段期间将数据检测算法应用于第一数据集使用。