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1. 发明授权

US07061793B2 Apparatus and method for small signal sensing in an SRAM cell utilizing PFET access devices 失效
标题翻译：使用PFET接入器件的SRAM单元中小信号感测的装置和方法
公开(公告)号：US07061793B2
公开(公告)日：2006-06-13
申请号：US10708713
申请日：2004-03-19
申请人： John E. Barth, Jr. , George M. Braceras , Harold Pilo
发明人： John E. Barth, Jr. , George M. Braceras , Harold Pilo
IPC分类号： G11C7/12 , G11C11/41 , G11C11/419 , G11C7/06
CPC分类号： G11C11/412
摘要： A method for small signal sensing during a read operation of a static random access memory (SRAM) cell includes coupling a pair of complementary sense amplifier data lines to a corresponding pair of complementary bit lines associated with the SRAM cell, and setting a sense amplifier so as to amplify a signal developed on the sense amplifier data lines, wherein the bit line pair remains coupled to the sense amplifier data lines at the time the sense amplifier is set.
摘要翻译：在静态随机存取存储器（SRAM）单元的读取操作期间用于小信号感测的方法包括将一对互补读出放大器数据线耦合到与SRAM单元相关联的对应的一对互补位线，并且将读出放大器设置为放大在感测放大器数据线上产生的信号，其中位线对在读出放大器设置时保持耦合到读出放大器数据线。

2. 发明申请

US20120075919A1 Methods and Systems for Adjusting Wordline Up-Level Voltage to Improve Production Yield Relative to SRAM-Cell Stability 有权
标题翻译：用于调整字面上升电压的方法和系统，以提高相对于SRAM单元稳定性的产量
公开(公告)号：US20120075919A1
公开(公告)日：2012-03-29
申请号：US12892191
申请日：2010-09-28
申请人： Igor Arsovski , George M. Braceras , Kevin W. Gorman , Robert M. Houle , Harold Pilo
发明人： Igor Arsovski , George M. Braceras , Kevin W. Gorman , Robert M. Houle , Harold Pilo
IPC分类号： G11C11/00
CPC分类号： G11C11/413 , G11C8/08
摘要： Methods of setting wordline up-level voltage in as-fabricated SRAM. In one example, the method includes determining the relative speed, or strength, of 1) the combination of the pass-gate and pull-down devices and 2) the pull-up devices in the bitcells of the SRAM. These relative strengths are then used to adjust the wordline up-level voltage, if needed, to decrease the likelihood of the SRAM experiencing a stability failure. Corresponding systems are provided for determining the relative strengths of the devices of interest, for determining the amount of up-level voltage adjustment needed, and for selecting and setting the up-level voltage.
摘要翻译：在制造的SRAM中设置字线上电压的方法。在一个示例中，该方法包括确定1）通过栅极和下拉器件的组合的相对速度或强度，以及2）SRAM的位单元中的上拉器件。然后，如果需要，这些相对强度可用于调整字线上电压，以降低SRAM遇到稳定性故障的可能性。提供相应的系统用于确定感兴趣的装置的相对强度，用于确定所需的上限电压调整量以及用于选择和设定上限电压。

3. 发明授权

US07894291B2 Circuit and method for controlling a standby voltage level of a memory 有权
标题翻译：用于控制存储器的待机电压电平的电路和方法
公开(公告)号：US07894291B2
公开(公告)日：2011-02-22
申请号：US11162847
申请日：2005-09-26
申请人： George M. Braceras , John A. Fifield , Harold Pilo
发明人： George M. Braceras , John A. Fifield , Harold Pilo
IPC分类号： G11C5/14
CPC分类号： G11C11/417 , G11C5/147
摘要： A memory is provided which can be operated at an active rate of power consumption in an active operational mode and at a predetermined reduced rate of power consumption in a standby operational mode. The memory includes a current generating circuit which is operable to supply a predetermined magnitude of current to a sample power supply input terminal of a sample memory cell representative of memory cells of the memory, the predetermined magnitude of current corresponding to the predetermined reduced rate of power consumption. A voltage follower circuit is operable to output a standby voltage level equal to a voltage level at the sample power supply input terminal when the predetermined magnitude of current is supplied thereto. A memory cell array of the memory is operable to store data. In the standby operational mode, a switching circuit is operable to supply power at the standby voltage level to a power supply input terminal of the memory cell array. This permits data to remain stored in the memory during the standby mode. During an active operational mode, the switching circuit is operable to connect the power supply input terminal at the power supply to supply power at the active voltage level to the memory cell array. During the active operational mode, data can be stored into the memory cell array and retrieved from the memory cell array.
摘要翻译：提供一种存储器，其可以在主动操作模式中以在备用操作模式中以预定的降低的功率消耗速率以有效的功率消耗速率操作。存储器包括电流产生电路，其可操作以向代表存储器的存储器单元的采样存储单元的采样电源输入端提供预定大小的电流，与预定的降低的功率比相对应的预定电流值消费。电压跟随器电路可操作以当提供预定电流大小时输出等于采样电源输入端的电压电平的备用电压电平。存储器的存储单元阵列可操作以存储数据。在待机操作模式中，切换电路可操作以将备用电压电平的电力提供给存储单元阵列的电源输入端。这在待机模式期间允许数据保存在存储器中。在有效操作模式期间，开关电路可操作地连接电源处的电源输入端，以将有源电压电平的电力提供给存储单元阵列。在主动操作模式期间，可将数据存储到存储单元阵列中并从存储单元阵列检索。

4. 发明授权

US06967861B2 Method and apparatus for improving cycle time in a quad data rate SRAM device 有权
标题翻译：用于改善四倍数据速率SRAM器件中的周期时间的方法和装置
公开(公告)号：US06967861B2
公开(公告)日：2005-11-22
申请号：US10708379
申请日：2004-02-27
申请人： George M. Braceras , Harold Pilo
发明人： George M. Braceras , Harold Pilo
IPC分类号： G11C8/00 , G11C11/00 , G11C11/413
CPC分类号： G11C11/413
摘要： A method for implementing a self-timed, read to write operation in a memory storage device. In an exemplary embodiment, the method includes capturing a read address during a first half of a current clock cycle, and commencing a read operation so as to read data corresponding to the captured read address onto a pair of bit lines. A write operation is commenced for the current clock cycle so as to cause write data to appear on the pair of bit lines as soon as the read data from the captured read address is amplified by a sense amplifier, wherein the write operation uses a previous write address captured during a preceding clock cycle. A current write address is captured during a second half of the current clock cycle, said current write address used for a write operation implemented during a subsequent clock cycle, wherein the write operation for the current clock cycle is timed independent of the current write address captured during said second half of the current clock cycle.
摘要翻译：一种用于在存储器存储设备中实现自定时的读写操作的方法。在一个示例性实施例中，该方法包括在当前时钟周期的前半部分期间捕获读取地址，并开始读取操作，以便将对应于所捕获的读取地址的数据读取到一对位线上。一旦当前时钟周期开始写入操作，以便一旦来自捕获的读取地址的读取数据被读出放大器放大，就会使写入数据出现在该对位线上，其中写入操作使用先前的写入在前一个时钟周期捕获的地址。在当前时钟周期的后半段期间捕获当前写入地址，所述当前写入地址用于在随后的时钟周期期间实现的写入操作，其中当前时钟周期的写入操作被独立于捕获的当前写入地址在当前时钟周期的后半段。

5. 发明授权

US06922076B2 Scalable termination 失效
标题翻译：可扩展终止
公开(公告)号：US06922076B2
公开(公告)日：2005-07-26
申请号：US10604936
申请日：2003-08-27
申请人： George M. Braceras , Reid C. Hutchins , Harold Pilo
发明人： George M. Braceras , Reid C. Hutchins , Harold Pilo
IPC分类号： H04L25/02 , H03K17/16
CPC分类号： H04L25/0298 , H04L25/0278
摘要： In a first aspect, a first method is provided for providing multiple termination values using a plurality of binary termination signals. The first method includes the steps of (1) determining a characteristic impedance of a first port by generating a plurality of binary termination signals; and (2) modifying a characteristic impedance of a second port by manipulating one or more of the plurality of binary termination signals. Numerous other aspects are provided.
摘要翻译：在第一方面，提供了一种使用多个二进制终止信号来提供多个终止值的第一方法。第一种方法包括以下步骤：（1）通过产生多个二进制终止信号来确定第一端口的特性阻抗; 和（2）通过操纵多个二进制终止信号中的一个或多个来修改第二端口的特性阻抗。提供了许多其他方面。

6. 发明授权

US06897674B2 Adaptive integrated circuit based on transistor current measurements 有权
标题翻译：基于晶体管电流测量的自适应集成电路
公开(公告)号：US06897674B2
公开(公告)日：2005-05-24
申请号：US10604186
申请日：2003-06-30
申请人： George M. Braceras , Harold Pilo
发明人： George M. Braceras , Harold Pilo
IPC分类号： G01R31/30 , G01R31/26
CPC分类号： G01R31/3004
摘要： A method of tuning an integrated circuit on an integrated circuit chip including: performing a drain current at saturation measurement of one or more test field effect transistors on the integrated circuit chip; selectively programming fuses of a bank of fuses on the integrated circuit chip based on the drain current at saturation measurement; and tuning an output of the integrated circuit based on a pattern of blown and un-blown fuses in the bank of fuses.
摘要翻译：一种对集成电路芯片上的集成电路进行调谐的方法，包括：在集成电路芯片上的一个或多个测试场效应晶体管的饱和测量时执行漏极电流; 基于饱和度测量时的漏极电流有选择地对集成电路芯片上的熔丝组进行熔丝; 并根据保险丝库中的熔断和未熔断保险丝的模式调整集成电路的输出。

7. 发明申请

US20130223161A1 VDIFF MAX LIMITER IN SRAMS FOR IMPROVED YIELD AND POWER 有权
标题翻译： VDIFF最大限制在改进的电源和功率的SRAMS
公开(公告)号：US20130223161A1
公开(公告)日：2013-08-29
申请号：US13403252
申请日：2012-02-23
申请人： Igor Arsovski , George M. Braceras , Harold Pilo
发明人： Igor Arsovski , George M. Braceras , Harold Pilo
IPC分类号： G11C7/10
CPC分类号： G11C5/147 , G11C11/417
摘要： An integrated circuit structure comprises a static random access memory (SRAM) structure and a logic circuit. A power supply is operatively connected to the SRAM structure, and provides a first voltage to the SRAM structure. A voltage limiter is operatively connected to the power supply. The voltage limiter comprises a switching device operatively connected to the power supply. The switching device receives the first voltage and a second voltage supplied to structures external to the SRAM structure. A resistive element is operatively connected to the switching device. The switching device connects the resistive element to the power supply. The resistive element is selected to enable an output from the switching device to the logic circuit when a difference between the first voltage and the second voltage is greater than a voltage threshold value of the switching device.
摘要翻译：集成电路结构包括静态随机存取存储器（SRAM）结构和逻辑电路。电源可操作地连接到SRAM结构，并且向SRAM结构提供第一电压。电压限制器可操作地连接到电源。电压限制器包括可操作地连接到电源的开关装置。开关器件接收提供给SRAM结构外部结构的第一电压和第二电压。电阻元件可操作地连接到开关装置。开关装置将电阻元件连接到电源。电阻元件被选择为当第一电压和第二电压之间的差大于开关器件的电压阈值时，使能从开关器件到逻辑电路的输出。

8. 发明授权

US07180320B2 Adaptive integrated circuit based on transistor current measurements 失效
标题翻译：基于晶体管电流测量的自适应集成电路
公开(公告)号：US07180320B2
公开(公告)日：2007-02-20
申请号：US10995791
申请日：2004-11-23
申请人： George M. Braceras , Harold Pilo
发明人： George M. Braceras , Harold Pilo
IPC分类号： G01R31/26
CPC分类号： G01R31/3004
摘要： BUR920020148US13 A method of tuning an integrated circuit on an integrated circuit chip including: performing a drain current at saturation measurement of one or more test field effect transistors on the integrated circuit chip; selectively programming fuses of a bank of fuses on the integrated circuit chip based on the drain current at saturation measurement; and tuning an output of the integrated circuit based on a pattern of blown and un-blown fuses in the bank of fuses.
摘要翻译：一种对集成电路芯片上的集成电路进行调谐的方法，包括：在集成电路芯片上的一个或多个测试场效应晶体管的饱和测量时执行漏极电流; 基于饱和度测量时的漏极电流有选择地对集成电路芯片上的熔丝组进行熔丝; 并根据保险丝库中的熔断和未熔断保险丝的模式调整集成电路的输出。

9. 发明授权

US06999547B2 Delay-lock-loop with improved accuracy and range 失效
标题翻译：延迟锁定循环具有提高的精度和范围
公开(公告)号：US06999547B2
公开(公告)日：2006-02-14
申请号：US10065840
申请日：2002-11-25
申请人： George M. Braceras , Harold Pilo
发明人： George M. Braceras , Harold Pilo
IPC分类号： H04L7/033
CPC分类号： H03L7/00
摘要： A Delay-Lock-Loop circuit and a method for producing a phase shift comprises a phase generator producing a first and second clock signal having a first and second rising edge, respectively, wherein a timing difference between the first and second rising edges is equal to a desired cycle time; a delay circuit operable to receive the first clock signal and to produce a delayed clock signal; and a latch element connected to the delay circuit, and operable to check whether the delayed clock signal is delayed by an amount equal to the desired cycle time; a plurality of serially connected binary-weighted inverters connected to the latch element, which are operable to adjust the delay of the delayed clock signal to be equal to the desired cycle time; and a phase-shifted delay circuit connected to the delay circuit, and operable to produce multiple degrees of phase shift of the delayed clock signal.
摘要翻译：延迟锁定环电路和产生相移的方法包括相位发生器，分别产生具有第一和第二上升沿的第一和第二时钟信号，其中第一和第二上升沿之间的定时差等于期望的周期时间; 延迟电路，其可操作以接收所述第一时钟信号并产生延迟的时钟信号; 以及锁存元件，连接到所述延迟电路，并且可操作以检查延迟的时钟信号是否被延迟等于期望周期时间的量; 连接到所述锁存元件的多个串行连接的二进制加权反相器，其可操作以将延迟的时钟信号的延迟调整为等于期望的周期时间; 以及连接到所述延迟电路的相移延迟电路，并且可操作以产生延迟的时钟信号的多个相移。

10. 发明授权

US06392949B2 High performance memory architecture 有权
公开(公告)号：US06392949B2
公开(公告)日：2002-05-21
申请号：US09761460
申请日：2001-01-16
申请人： George M. Braceras , Harold Pilo
发明人： George M. Braceras , Harold Pilo
IPC分类号： G11C300
CPC分类号： G11C11/417 , G11C7/1039 , G11C11/418
摘要： A high performance memory array architecture is provided to minimize the delays within each array. The architecture of the array equalizes the access time to all memory elements by optimizing the positioning of the subarrays with respect to buffering and rebuffering elements used in the array which cause delays.

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