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    • 1. 发明申请
    • XRF analyzer
    • XRF分析仪
    • US20080310588A1
    • 2008-12-18
    • US11101792
    • 2005-04-07
    • John Arthur CooperSarah Catherine FryBruce Edward Johnsen
    • John Arthur CooperSarah Catherine FryBruce Edward Johnsen
    • G01N23/223G01D18/00
    • G01N23/223G01N2223/076
    • A method of analyzing a fluid sample by XRF includes the steps of: depositing the fluid sample onto a substrate, exposing the sample and the substrate to an x-ray emission, generating a first analytical signal responsive to the x-ray emission, providing an operable first reference material having a first extended position above the substrate and in communication with the x-ray emission, periodically extending the first reference material to its first extended position, generating a first calibration signal, providing an operable second reference material having a first extended position below the substrate and in communication with the x-ray emission, and periodically extending the second reference material to its first extended position and generating at least one second calibration signal. The first and second calibration signals are compared with predetermined values. The first and second reference materials also have second retracted positions.
    • 通过XRF分析流体样品的方法包括以下步骤:将流体样品沉积到基底上,将样品和基底暴露于X射线发射,产生响应于X射线发射的第一分析信号,提供 可操作的第一参考材料具有在衬底上方的第一延伸位置并与x射线发射连通,周期性地将第一参考材料延伸到其第一延伸位置,产生第一校准信号,提供可操作的第二参考材料,其具有第一延伸 并且与x射线发射通信,并且周期性地将第二参考材料延伸到其第一延伸位置并产生至少一个第二校准信号。 将第一和第二校准信号与预定值进行比较。 第一和第二参考材料还具有第二缩回位置。
    • 3. 发明授权
    • XRF analyzer
    • XRF分析仪
    • US07539282B2
    • 2009-05-26
    • US11101792
    • 2005-04-07
    • John Arthur CooperSarah Catherine FryBruce Edward Johnsen
    • John Arthur CooperSarah Catherine FryBruce Edward Johnsen
    • G01N23/223
    • G01N23/223G01N2223/076
    • A method of analyzing a fluid sample by XRF includes the steps of: depositing the fluid sample onto a substrate, exposing the sample and the substrate to an x-ray emission, generating a first analytical signal responsive to the x-ray emission, providing an operable first reference material having a first extended position above the substrate and in communication with the x-ray emission, periodically extending the first reference material to its first extended position, generating a first calibration signal, providing an operable second reference material having a first extended position below the substrate and in communication with the x-ray emission, and periodically extending the second reference material to its first extended position and generating at least one second calibration signal. The first and second calibration signals are compared with predetermined values. The first and second reference materials also have second retracted positions.
    • 通过XRF分析流体样品的方法包括以下步骤:将流体样品沉积到基底上,将样品和基底暴露于X射线发射,产生响应于X射线发射的第一分析信号,提供 可操作的第一参考材料具有在衬底上方的第一延伸位置并与x射线发射连通,周期性地将第一参考材料延伸到其第一延伸位置,产生第一校准信号,提供可操作的第二参考材料,其具有第一延伸 并且与x射线发射通信,并且周期性地将第二参考材料延伸到其第一延伸位置并产生至少一个第二校准信号。 将第一和第二校准信号与预定值进行比较。 第一和第二参考材料还具有第二缩回位置。