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    • 9. 发明申请
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US20060001855A1
    • 2006-01-05
    • US10879522
    • 2004-06-30
    • Joeri LofJoannes De Smit
    • Joeri LofJoannes De Smit
    • G03B27/72
    • G03F7/70291G03F7/70275
    • A system and method for use in a lithographic environment include an illumination system for supplying a projection beam of radiation, an array of individually controllable elements for patterning the beam, a projection system for projecting the patterned beam onto a target plane, and a substrate table for supporting a substrate such that a target surface of the substrate is coincident with the target plane. The projection system comprises at least one component, including at least an array of lenses arranged so that each lens receives and focuses a respective portion of the patterned beam. The array of lenses projects a radiation pattern onto the target plane. The apparatus also includes a sensor system arranged to detect an intensity distribution of the projected radiation pattern and to provide a corresponding intensity signal, and a positioning system controllable to adjust a position and/or an orientation of at least one of the following: the array of elements; a component of the projection system; and the illumination system. The apparatus also includes a control system which controls the array of elements to pattern the beam, and which also to receives the intensity signal and controls the positioning system according to the detected intensity distribution to adjust the projected radiation pattern, for example to align the patterned beam with the lens array.
    • 在光刻环境中使用的系统和方法包括用于提供投射辐射束的照明系统,用于图案化束的独立可控元件的阵列,用于将图案化的光束投影到靶平面上的投影系统,以及衬底台 用于支撑基板,使得基板的目标表面与目标平面重合。 投影系统包括至少一个部件,包括至少一组透镜,其布置成使得每个透镜接收并聚焦图案化光束的相应部分。 透镜阵列将辐射图投影到目标平面上。 所述装置还包括传感器系统,其被布置成检测投影辐射图案的强度分布并提供对应的强度信号;以及定位系统,其可控制以调整以下至少一个的位置和/或取向:阵列 元素; 投影系统的一个组件; 和照明系统。 该装置还包括一个控制系统,该控制系统控制元件阵列以对该光束进行图案化,并且还控制该强度信号并根据检测到的强度分布来控制该定位系统,以调整该投射的辐射图案,以使该图案化 光束与透镜阵列。
    • 10. 发明申请
    • Lithographic apparatus and device manufacturing method
    • 平版印刷设备和器件制造方法
    • US20060141373A1
    • 2006-06-29
    • US11020561
    • 2004-12-27
    • Franciscus Casper BijnenJoannes De Smit
    • Franciscus Casper BijnenJoannes De Smit
    • G03F9/00G03C5/00
    • G03F7/70291G03F7/70791G03F9/7003
    • A system and method use a substrate with a pattern of individual, indiscrete alignment marks, i.e., the marks are separate and distinct from each other, and each mark is not divided into component parts. The pattern of marks is distributed over an area of the substrate, and the method also comprises the steps of providing a beam of radiation using an illumination system and an array of individually controllable elements to impart the beam with a pattern in its cross-section, providing a projection system to project the patterned beam onto the substrate, and providing a movement system to effect relative movement between the substrate and the projection system. A detection system, able to detect the alignment marks individually, is also provided, and the method includes using the detection system to detect the marks to determine a relative position of the substrate to the projection system, using the movement system to position the substrate relative to the projection system, and using the projection system to project the patterned beam of radiation onto a target portion of the substrate. The pattern comprises one or more rows of simple alignment marks, such as spots and short linear marks.
    • 一种系统和方法使用具有单独的,不分开的对准标记的图案的基板,即标记彼此分开和不同,并且每个标记不分为组成部分。 标记的图案分布在基板的一个区域上,并且该方法还包括以下步骤:使用照明系统和单独可控元件的阵列提供辐射束,以在其横截面中赋予光束图案, 提供投影系统以将图案化的光束投影到基板上,以及提供移动系统以实现基板和投影系统之间的相对移动。 还提供了能够分别检测对准标记的检测系统,并且该方法包括使用检测系统来检测标记以确定基板与投影系统的相对位置,使用移动系统将基板相对定位 并且使用投影系统将图案化的辐射束投影到基板的目标部分上。 该图案包括一行或多行简单对准标记,例如斑点和短线性标记。