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    • 1. 发明申请
    • Optical Communication System And Method For Distributing Content Aboard A Mobile Platform During Travel
    • 光通信系统及其在移动平台上分发内容的方法
    • US20090202241A1
    • 2009-08-13
    • US12367406
    • 2009-02-06
    • Jin YuRandy K. Schwarz
    • Jin YuRandy K. Schwarz
    • H04J14/00
    • H04J3/1694H04B10/27H04J14/0226H04J14/0238H04J14/0252H04J14/0279H04J14/028H04J14/0282H04J14/0283H04J14/0284H04J2203/0067
    • An optical distribution system for vehicle information systems installed aboard passenger vehicles, such as automobiles and aircraft, and methods for manufacturing and using same. Each system resource of the vehicle information system couples with the optical distribution system via an optical transceiver system. The optical transceiver systems provide a link interface between the system resources and the optical distribution system for supporting the transmission and reception of optical communication signals among the system resources via the optical distribution system. The optical distribution system couples the system resources via fiber optic communication connections that can support high data transfer rates. Being light weight, compact, and requiring little, if any, electrical power, the optical distribution system advantageously supports full communications among the system resources of the vehicle information system, while reducing the costs of operating and transporting the vehicle information system aboard the passenger vehicle.
    • 用于车载信息系统的光分配系统,其安装在诸如汽车和飞机的客车上,以及制造和使用它们的方法。 车辆信息系统的每个系统资源经由光收发器系统与光分配系统耦合。 光收发器系统在系统资源和光分配系统之间提供链路接口,用于经由光分配系统支持系统资源之间的光通信信号的发送和接收。 光分配系统通过可支持高数据传输速率的光纤通信连接来耦合系统资源。 光分配系统的重量轻,紧凑,并且需要很少(如果有的话)电力,有利地支持车辆信息系统的系统资源之间的完全通信,同时降低在乘客车辆上操作和运输车辆信息系统的成本 。
    • 2. 发明申请
    • Via Using Zn or Zn Alloys and Its Making Method, 3D Chip Stack Packages Using Thereof
    • 通过使用Zn或Zn合金及其制备方法,使用它的3D芯片堆叠封装
    • US20100240174A1
    • 2010-09-23
    • US12680760
    • 2007-12-04
    • Jin YuYoung-Kun Jee
    • Jin YuYoung-Kun Jee
    • H01L21/768H01L21/50
    • H01L21/768H01L21/76898H01L24/11H01L24/12H01L25/0657H01L25/50H01L2224/05573H01L2224/13025H01L2224/16H01L2225/06513H01L2225/06541H01L2924/01078H01L2924/01079H01L2924/01327H01L2924/10253H01L2924/00
    • Disclosed are via, a method for formation of via using zinc and zinc alloys, and a process for fabrication of three-dimensional multiple chip stack packages by using the same. In lamination of three-dimensional chips, the chips with reduced defects are rapidly formed by the steps of: punching each of the chips to form a via hole used for a circuit wiring between the chips; depositing a seed layer on an inside of the via hole; forming a plated layer inside the via hole by using Zn and Zn alloys through an electroplating process; removing oxide film from surface of the plated layer; and heat treating the via hole at a temperature of more than melting point of the Zn and Zn alloys. Particularly, the chip having Zn via formed according to the present invention has an advantage of simultaneously overcoming problems in establishment of processing parameters caused by Cu via (e.g., plating mode, current density, influence of additives, pore formation, etc.), problems in successive processes caused by Sn (and other low melting point metals) via (e.g., soldering, chip stack, etc.) and difficulty in mechanical reliability of the process. Additionally, when stacking multiple chips with various functions in the three-dimensional chip stack package, the package can be simply fabricated by controlling contents of constitutional elements in Zn alloy via which has specific thermal properties (such as melting point, thermal expansion coefficient, etc.) suitable for processing temperature of each of the chips.
    • 公开了通过使用锌和锌合金形成通孔的方法,以及使用该方法制造三维多芯片堆叠封装的方法。 在三维芯片的层叠中,通过以下步骤快速形成具有减少的缺陷的芯片:冲压每个芯片以形成用于芯片之间的电路布线的通孔; 在所述通孔的内部沉积种子层; 通过使用Zn和Zn合金通过电镀工艺在通孔内形成镀层; 从镀层的表面去除氧化膜; 并在Zn和Zn合金的熔点以上的温度下对通孔进行热处理。 特别地,具有根据本发明形成的Zn通孔的芯片具有同时克服由Cu通孔(例如电镀模式,电流密度,添加剂的影响,孔形成等)引起的加工参数建立中的问题的优点,问题 在由Sn(和其他低熔点金属)经由(例如,焊接,芯片堆叠等)引起的连续工艺中以及该工艺的机械可靠性困难。 此外,当在三维芯片堆叠封装中堆叠具有各种功能的多个芯片时,可以通过控制具有特定热性能(如熔点,热膨胀系数等)的Zn合金中的组成元素的内容物来简单地制造封装 。)适合每个芯片的处理温度。
    • 5. 发明授权
    • Integrated analysis device for simultaneously detecting EBCs and VOCs in human exhaled breath
    • 用于同时检测人呼气中的EBC和VOC的综合分析装置
    • US09408556B2
    • 2016-08-09
    • US13990007
    • 2010-12-01
    • Ping WangDi WangLe WangJin YuKai YuYishan WangLin WangCong Zhao
    • Ping WangDi WangLe WangJin YuKai YuYishan WangLin WangCong Zhao
    • A61B5/08G01N33/00G01N33/497A61B5/097
    • A61B5/082A61B5/097G01N33/0047G01N33/497
    • The present embodiments disclose a device including a module for sampling, separating and enriching a detected object, an exhaled breath condensates (EBCs) detection module and a combined volatile organic compounds (VOCs) detection module. The sampling module is connected with the EBCs detection module via a syringe pump for sample injection and is connected with the combined VOCs detection module by a capillary separation column. EBCs and VOCs in human exhaled breath are simultaneously sampled, separated and condensed; the heavy metal ions, cell factors, etc. in the collected EBCs are detected with a light addressable potentiometric sensor (LAPS); the condensed VOCs can be quantitatively detected by the combined VOCs detection module with a high sensitivity; and a heating rod and a platinum resistor can be conveniently replaced because a separated outlet heating piece is designed in the combined VOCs detection module.
    • 本实施例公开了一种包括用于对检测到的物体进行取样,分离和富集的模块,呼出呼吸冷凝物(EBC)检测模块和组合的挥发性有机化合物(VOC))检测模块的装置。 采样模块通过注射泵与EBC检测模块连接,用于注射样品,并通过毛细管分离柱与组合的VOC检测模块连接。 人呼吸中的EBC和VOCs被同时取样,分离和浓缩; 用光寻址电位传感器(LAPS)检测收集的EBC中的重金属离子,细胞因子等; 可以通过组合的VOC检测模块以高灵敏度定量检测浓缩的VOC; 并且可以方便地更换加热棒和铂电阻器,因为在组合的VOC检测模块中设计了分离的出口加热片。
    • 6. 发明申请
    • METHOD FOR DETECTING SEMICONDUCTOR MANUFACTURING CONDITIONS
    • 用于检测半导体制造条件的方法
    • US20070220458A1
    • 2007-09-20
    • US11308343
    • 2006-03-17
    • Wen-Zhan ZhouJin YuKai-Hung Alex See
    • Wen-Zhan ZhouJin YuKai-Hung Alex See
    • G06F17/50
    • G03F7/70625G03F7/70508H01L22/26H01L22/34
    • A method for detecting semiconductor-manufacturing conditions includes providing a photomask with a plurality of pattern areas each having a plurality of test lines with different pitches, exposing a plurality of wafer with the photomask in different manufacturing conditions, measuring the critical dimensions of the plurality of pattern areas, generating a library of relationships between the pitches and the critical dimension of the pattern areas, exposing a test wafer in an unknown manufacturing condition, finding out a relationships between the pitches and the critical dimension of the pattern areas of the test wafer, searching for a most similar relationship in the library, and detecting a set of manufacturing parameters used to expose the test wafer.
    • 一种用于检测半导体制造条件的方法包括提供具有多个图案区域的光掩模,每个图案区域具有多个具有不同间距的测试线,在不同制造条件下用光掩模曝光多个晶片,测量多个 产生间距和图案区域的关键尺寸之间的关系库,使未知制造条件下的测试晶片暴露出来,找出测试晶片的图案区域的间距与临界尺寸之间的关系, 在库中搜索最相似的关系,并且检测用于暴露测试晶片的一组制造参数。