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    • 3. 发明授权
    • Ferroelectric vapor deposition targets
    • 铁电气相沉积靶
    • US06746619B2
    • 2004-06-08
    • US10422112
    • 2003-04-23
    • Jianxing LiTim ScottTamara White
    • Jianxing LiTim ScottTamara White
    • C04B35001
    • C23C14/3414C04B35/462C23C14/08Y10S977/775Y10S977/777Y10S977/838Y10S977/891
    • The invention includes a ferroelectric physical vapor deposition target having a predominate grain size of less than or equal to 1.0 micron, and a density of at least 95% of maximum theoretical density. A method of making the target includes hot pressing a prereacted ferroelectric powder predominately including individual prereacted ferroelectric particles having a maximum straight linear dimension of less than or equal to 100 nanometers to form a physical vapor deposition target of desired shape. In one implementation, the prereacted ferroelectric powder is hot pressed at a maximum pressing temperature which is at least 200° C. lower than would be required to produce at least 85% of maximum theoretical density in hot pressing the same powder but having a predominate particle size maximum straight linear dimension of at least 1.0 micron at the same pressure and for the same amount of time.
    • 本发明包括具有小于或等于1.0微米的主要晶粒尺寸和最大理论密度的至少95%的密度的铁电物理气相沉积靶。 制造目标的方法包括热压预先反应的铁电粉末,主要包括具有小于或等于100纳米的最大直线尺寸的单个预反应铁电粒子,以形成所需形状的物理气相沉积靶。 在一个实施方案中,将预反应的铁电粉末以最大压制温度进行热压,所述最高压制温度比在相同粉末热挤压但具有主要颗粒的产生至少85%的最大理论密度所需的最低压力温度 尺寸最大直线尺寸在相同的压力下和相同的时间量为至少1.0微米。
    • 8. 发明授权
    • Ceramic compositions, physical vapor deposition targets and methods of forming ceramic compositions
    • 陶瓷组合物,物理气相沉积靶和形成陶瓷组合物的方法
    • US06277254B1
    • 2001-08-21
    • US09465554
    • 1999-12-16
    • Qi TanJianxing Li
    • Qi TanJianxing Li
    • C23C1400
    • C23C16/409C04B35/491C23C14/3414
    • The invention includes a method for forming a ceramic composition. Materials comprising lead, zirconium, titanium and bismuth are combined together to form a mixture. At least one of the materials is provided in the mixture as a nanophase powder. The mixture is then densified to form the ceramic composition. The invention also includes a method for forming a dense ferroelectric ceramic composition. Lead, zirconium, titanium and bismuth are combined together to form a mixture. The mixture is then densified to form a ferroelectric ceramic composition having a density of greater than or equal to 95% of a theoretical maximum density for the composition. A predominate portion of the composition has a grain size of less than or equal to about 500 nanometers. The invention also includes a ferroelectric ceramic composition comprising lead, zirconium, titanium and bismuth. Such composition has a density of greater than or equal to 95% of a theoretical maximum density for the composition, and a predominate portion of the composition has a grain size of less than or equal to about 500 nanometers.
    • 本发明包括形成陶瓷组合物的方法。 将包含铅,锆,钛和铋的材料组合在一起形成混合物。 在混合物中至少提供一种材料作为纳米相粉末。 然后将混合物致密化以形成陶瓷组合物。 本发明还包括形成致密铁电陶瓷组合物的方法。 铅,锆,钛和铋组合在一起形成混合物。 然后将混合物致密化以形成密度大于或等于组合物的理论最大密度的95%的铁电陶瓷组合物。 组合物的主要部分具有小于或等于约500纳米的粒度。 本发明还包括包含铅,锆,钛和铋的铁电陶瓷组合物。 这种组合物具有大于或等于组合物的理论最大密度的95%的密度,并且组合物的主要部分具有小于或等于约500纳米的晶粒尺寸。
    • 9. 发明授权
    • Physical vapor deposition targets and methods of formation
    • 物理气相沉积目标和形成方法
    • US07153468B2
    • 2006-12-26
    • US10344772
    • 2001-08-16
    • Vasanth MohanJianxing LiTimothy A. Scott
    • Vasanth MohanJianxing LiTimothy A. Scott
    • B22F3/12C22C1/05
    • C23C14/3414Y10T428/12014Y10T428/31678
    • A method includes combining a solid first material and a solid second material and melting at least a portion of the first material sufficient to coat the second material and any remaining first material. An approximately homogenous distribution of the second material can be formed throughout the liquid phase of the first material. The first material liquid phase can then be solidified to define a composite target blank exhibiting an approximately homogenous distribution of the solid second material in a matrix of the solidified first material. The first material can comprise SE and the second material can comprise Ge and/or Ag. The composite target blank can include at least about 50 vol % matrix. The first and second materials can be powdered metals. Accordingly, a physical vapor deposition target can include a matrix of a first material and an approximately homogenous distribution of particles of a second material throughout the first material matrix. The second material can include powders exhibiting particles sizes no greater than about 325 mesh.
    • 一种方法包括组合固体第一材料和固体第二材料,并熔化足以涂覆第二材料和任何剩余的第一材料的第一材料的至少一部分。 可以在第一材料的整个液相中形成大致均匀的第二材料分布。 然后可以将第一材料液相固化以限定在固化的第一材料的基质中显示固体第二材料的大致均匀分布的复合靶材坯料。 第一材料可以包括SE,第二材料可以包括Ge和/或Ag。 复合靶材坯料可以包括至少约50vol%的基体。 第一和第二种材料可以是金属粉末。 因此,物理气相沉积靶可以包括第一材料的基体和第二材料的颗粒在整个第一材料基体中的大致均匀分布。 第二种材料可以包括表现出不大于约325目的颗粒尺寸的粉末。
    • 10. 发明授权
    • Physical vapor deposition target
    • 物理气相沉积靶
    • US06797079B2
    • 2004-09-28
    • US09783835
    • 2001-02-14
    • Shozo NaganoHinrich HargarterJianxing LiJane Buehler
    • Shozo NaganoHinrich HargarterJianxing LiJane Buehler
    • C23C1400
    • C22C9/00C22C5/08C22C9/02C23C14/3414C25D7/12H01L23/53233H01L23/53238H01L2924/0002H01L2924/00
    • A physical vapor deposition target includes an alloy of copper and silver, with the silver being present in the alloy at from less than 1.0 at % to 0.001 at %. In one implementation, a physical vapor deposition target includes an alloy of copper and silver, with the silver being present in the alloy at from 50 at % to 70 at %. A physical vapor deposition target includes an alloy of copper and tin, with tin being present in the alloy at from less than 1.0 at % to 0.001 at %. In one implementation, a conductive integrated circuit metal alloy interconnection includes an alloy of copper and silver, with the silver being present in the alloy at from less than 1.0 at % to 0.001 at %. A conductive integrated circuit metal alloy interconnection includes an alloy of copper and silver, with the silver being present in the alloy at from 50 at % to 70 at %. A conductive integrated circuit metal alloy interconnection includes an alloy of copper and tin, with tin being present in the alloy at from less than 1.0 at % to 0.001 at %. Other useable copper alloys include an alloy of copper and one or more other elements, the one or more other elements being present in the alloy at a total concentration from less than 1.0 at % to 0.001 at % and being selected from the group consisting of Be, Ca, Sr, Ba, Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Ti, Zr, Hf, Zn, Cd, B, Ga, In, C, Se, Te, V, Nb, Ta, Cr, Mo, W, Mn, Tc, Re, Fe, Ru, Os, Co, Rh, Ni, Pd, Pt, Au, Tl, and Pb. An electroplating anode is formed to comprise one or more of the above alloys.
    • 物理气相沉积靶包括铜和银的合金,合金中的银以小于1.0原子%至0.001原子%存在。 在一个实施方案中,物理气相沉积靶包括铜和银的合金,合金中的银以50at%至70at%存在。 物理气相沉积靶包括铜和锡的合金,锡在合金中以小于1.0原子%至0.001原子%存在。 在一个实施方式中,导电集成电路金属合金互连包括铜和银的合金,合金中的银以小于1.0原子%至0.001原子%存在。 导电集成电路金属合金互连包括铜和银的合金,合金中的银以50原子%至70原子%存在。 导电集成电路金属合金互连包括铜和锡的合金,合金中存在锡小于1.0原子%至0.001原子%。 其他可用的铜合金包括铜和一种或多种其它元素的合金,所述一种或多种其它元素以小于1.0原子%至0.001原子%的总浓度存在于合金中,并且选自Be ,Ca,Sr,Ba,Sc,Y,La,Ce,Pr,Nd,Pm,Sm,Eu,Gd,Tb,Dy,Ho,Er,Tm,Yb,Lu,Ti,Zr,Hf,Zn,Cd ,B,Ga,In,C,Se,Te,V,Nb,Ta,Cr,Mo,W,Mn,Tc,Re,Fe,Ru,Os,Co,Rh,Ni,Pd,Pt,Au, ,和Pb。 形成电镀阳极以包含一种或多种上述合金。