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    • 8. 发明申请
    • NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF
    • 非易失性存储器及其制造方法
    • US20090047764A1
    • 2009-02-19
    • US11953076
    • 2007-12-10
    • Wei-Ming LiaoMing-Cheng ChangChien-Chang Huang
    • Wei-Ming LiaoMing-Cheng ChangChien-Chang Huang
    • H01L21/336
    • H01L27/11521
    • A non-volatile memory having a gate structure and a source/drain region is provided. The gate structure is disposed on a substrate. The gate structure includes a pair of floating gates, tunneling dielectric layers, a control gate and an inter-gate dielectric layer. The floating gates are disposed on the substrate. Each tunneling dielectric layer is disposed between each floating gate and the substrate. The control gate is disposed on the substrate between the pair of the floating gates and covers a top surface and sidewalls of each floating gate. The inter-gate dielectric layer is disposed between the control gate and each of the floating gates, disposed between the control gate and each of the tunneling dielectric layers, and disposed between the control gate and the substrate. The source/drain region is disposed in the substrate at respective sides of the gate structure.
    • 提供具有栅极结构和源极/漏极区域的非易失性存储器。 栅极结构设置在基板上。 栅极结构包括一对浮置栅极,隧道电介质层,控制栅极和栅极间介电层。 浮置栅极设置在基板上。 每个隧道介电层设置在每个浮动栅极和衬底之间。 控制栅极设置在一对浮置栅极之间的衬底上并且覆盖每个浮动栅极的顶表面和侧壁。 栅极间电介质层设置在控制栅极和每个浮置栅极之间,设置在控制栅极和每个隧道介电层之间,并且设置在控制栅极和衬底之间。 源极/漏极区域在栅极结构的相应侧设置在衬底中。