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1. 发明授权

US4942596A Adaptive enhancement of x-ray images 失效
标题翻译： x射线图像的自适应增强
公开(公告)号：US4942596A
公开(公告)日：1990-07-17
申请号：US238806
申请日：1988-08-31
申请人： Jeffrey W. Eberhard , Rudolph Koegl , John P. Keaveney
发明人： Jeffrey W. Eberhard , Rudolph Koegl , John P. Keaveney
IPC分类号： H05G1/46 , H05G1/60
CPC分类号： H05G1/46 , H05G1/60
摘要： The quality of x-ray images is significantly enhanced by adjusting the x-ray system operating parameters in real time during acquisition of x-ray data to take information about the part into account adaptively. X-ray energy, x-ray flux, and integration time can all by varied independently and in combination to improve the signal to noise ratio in the image. The x-ray data from a previous subsection of the image is processed to determine optimum system operating parameters for a next image subsection. x-ray tube voltage is adjusted to change x-ray energy and keep .alpha.L close to 2 over all image subsections. X-ray tube current is adjusted to change x-ray flux and data acquisition integration time is adjusted to keep the signal to noise ratio within limits.
摘要翻译：通过在采集x射线数据的过程中实时调整x射线系统的运行参数，自适应地考虑该部分的信息，可显着增强X射线图像的质量。 X射线能量，X射线通量和积分时间可以通过独立变化和组合变化，以提高图像中的信噪比。来自图像的先前子部分的x射线数据被处理以确定下一个图像子部分的最佳系统操作参数。调整x射线管电压以改变x射线能量，并使αL在所有图像子部分保持接近2。调整X射线管电流以改变x射线通量，并调整数据采集积分时间以保持信噪比的范围。

2. 发明授权

US4803639A X-ray inspection system 失效
标题翻译： X光检查系统
公开(公告)号：US4803639A
公开(公告)日：1989-02-07
申请号：US832511
申请日：1986-02-25
申请人： Douglas S. Steele , Larry C. Howington , James W. Schuler , Joseph J. Sostarich , Charles R. Wojciechowski , Theodore W. Sippel , Joseph M. Portaz , Ralph G. Isaacs , Henry J. Scudder, III , Thomas G. Kincaid , Kristina H. V. Hedengren , Rudolph A. A. Koegl , John P. Keaveney , Joseph Czechowski, III , John R. Brehm , James M. Brown, Jr. , David W. Oliver , George E. Williams , Richard D. Miller
发明人： Douglas S. Steele , Larry C. Howington , James W. Schuler , Joseph J. Sostarich , Charles R. Wojciechowski , Theodore W. Sippel , Joseph M. Portaz , Ralph G. Isaacs , Henry J. Scudder, III , Thomas G. Kincaid , Kristina H. V. Hedengren , Rudolph A. A. Koegl , John P. Keaveney , Joseph Czechowski, III , John R. Brehm , James M. Brown, Jr. , David W. Oliver , George E. Williams , Richard D. Miller
IPC分类号： G01N23/04 , G01N23/18 , G06T7/00 , G06F15/20 , G01N23/02
CPC分类号： G06T7/0004 , G01N23/18 , G06T2207/10121 , G06T2207/30164
摘要： An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.
摘要翻译：用于手动或自动执行数字荧光透视检查和/或通过对制造部件进行X射线检查的计算机断层摄影检查的X射线检查系统包括自动分析被检查部分的缺陷的计算机系统。该系统包括用于在X射线机中自动定位部件以获得该部件的透视和断层摄影视图并用于以生产率从检查中获取数据的装置。如果识别出的缺陷位置是有问题的，系统将自动识别在荧光透视扫描期间部件中可排除缺陷的位置，并随后识别用于获取层析成像扫描的位置。该系统可以自动排除在荧光检查检查期间识别的缺陷的部件。该系统通过对后续部分进行X射线检查的一部分进行分析，在实时环境中运行。在每次检查期间获得的数据被存档和存储，用于在进一步的制造过程中跟踪部件。

3. 发明授权

US4809314A Method of aligning a linear array X-ray detector 失效
标题翻译：线性阵列X射线检测器的对准方法
公开(公告)号：US4809314A
公开(公告)日：1989-02-28
申请号：US832973
申请日：1986-02-25
申请人： Douglas S. Steele , John P. Keaveney , David W. Oliver
发明人： Douglas S. Steele , John P. Keaveney , David W. Oliver
IPC分类号： G12B5/00 , G01B7/28 , G01B15/00 , G01B15/04 , G01N23/18 , G21K1/00
CPC分类号： G01B7/285 , G01B15/00 , G01B15/04
摘要： An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal on each signal, securing the X-ray beam limiter, and positioning the detector array for maximum signal.
摘要翻译： X射线检查系统包括用于产生定向X射线束的X射线源和用于测量接收到的辐射的强度并产生代表它的电信号的线性阵列检测器。用于将检测器与定向X射线束对准的方法包括去除X射线源和检测器之间的任何部分，打开X射线束限制器，将线性阵列检测器定位成来自每个检测器元件的最大信号， X射线束限制器开路，检测来自检测器元件的任何信号是否减少，移动限幅器以产生每个信号上的最大信号，固定X射线束限制器，并将检测器阵列定位成最大信号。

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