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    • 1. 发明授权
    • Method for switching between modes of operation
    • 切换操作模式的方法
    • US06615325B2
    • 2003-09-02
    • US08984561
    • 1997-12-03
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • G06F1200
    • G11C7/1027G11C7/1015G11C7/1024G11C7/1039G11C7/1045G11C7/20
    • An integrated circuit memory device is designed for high speed data access and for compatibility with existing memory systems. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. Transitions of the Read/Write control line during a burst access will terminate the burst access, reset the burst length counter and initialize the device for another burst access. The device is compatible with existing Extended Data Out DRAM device pinouts, Fast Page Mode and Extended Data Out Single In-Line Memory Module pinouts, and other memory circuit designs. Additionally, a DRAM is provided having both pipelined and burst Extended Data Out modes of operation and the ability to switch between them.
    • 集成电路存储器件被设计用于高速数据访问和与现有存储器系统的兼容性。 地址选通信号用于锁存第一个地址。 在突发访问周期期间,地址在设备内部增加,并具有额外的地址选通转换。 只有在每次突发访问开始时才需要新的内存地址。 读/写命令每次突发存取发出一次,无需在器件周期频率下切换读/写控制线。 突发访问期间读/写控制线的转换将终止突发访问,重置突发长度计数器并初始化设备以进行另一个突发访问。 该器件与现有的扩展数据输出DRAM器件引脚排列,快速页面模式和扩展数据输出单列直插存储器模块引脚排列以及其他存储器电路设计兼容。 此外,提供具有流水线和突发扩展数据输出操作模式的DRAM以及在它们之间切换的能力。
    • 2. 发明授权
    • Memory device for burst or pipelined operation with mode selection circuitry
    • 用于脉冲串或流水线操作的存储器件,具有模式选择电路
    • US07124256B1
    • 2006-10-17
    • US08984562
    • 1997-12-03
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • G06F12/00G11C7/00
    • G11C7/1027G11C7/1015G11C7/1024G11C7/1039G11C7/1045G11C7/20
    • An integrated circuit memory device is designed for high speed data access and for compatibility with existing memory systems. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. Transitions of the Read/Write control line during a burst access will terminate the burst access, reset the burst length counter and initialize the device for another burst access. The device is compatible with existing Extended Data Out DRAM device pinouts, Fast Page Mode and Extended Data Out Single In-Line Memory Module pinouts, and other memory circuit designs. Additionally, a DRAM is provided having both pipelined and burst Extended Data Out modes of operation and the ability to switch between them.
    • 集成电路存储器件被设计用于高速数据访问和与现有存储器系统的兼容性。 地址选通信号用于锁存第一个地址。 在突发访问周期期间,地址在设备内部增加,并具有额外的地址选通转换。 只有在每次突发访问开始时才需要新的内存地址。 读/写命令每次突发存取发出一次,无需在器件周期频率下切换读/写控制线。 突发访问期间读/写控制线的转换将终止突发访问,重置突发长度计数器并初始化设备以进行另一个突发访问。 该器件与现有的扩展数据输出DRAM器件引脚排列,快速页面模式和扩展数据输出单列直插存储器模块引脚排列以及其他存储器电路设计兼容。 此外,提供具有流水线和突发扩展数据输出操作模式的DRAM以及在它们之间切换的能力。
    • 3. 发明授权
    • Burst/pipelined edo memory device
    • 突发/流水线edo内存设备
    • US07103742B1
    • 2006-09-05
    • US08984560
    • 1997-12-03
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • G06F13/00
    • G11C7/1024G11C7/1039G11C7/1045G11C8/06G11C11/408
    • An integrated circuit memory device is designed for high speed data access and for compatibility with existing memory systems. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. Transitions of the Read/Write control line during a burst access will terminate the burst access, reset the burst length counter and initialize the device for another burst access. The device is compatible with existing Extended Data Out DRAM device pinouts, Fast Page Mode and Extended Data Out Single In-Line Memory Module pinouts, and other memory circuit designs. Additionally, a DRAM is provided having both pipelined and burst Extended Data Out modes of operation and the ability to switch between them. Additionally, a memory device switchable between a patterned and a patternless addressing scheme is provided.
    • 集成电路存储器件被设计用于高速数据访问和与现有存储器系统的兼容性。 地址选通信号用于锁存第一个地址。 在突发访问周期期间,地址在设备内部增加,并具有额外的地址选通转换。 只有在每次突发访问开始时才需要新的内存地址。 读/写命令每次突发存取发出一次,无需在器件周期频率下切换读/写控制线。 突发访问期间读/写控制线的转换将终止突发访问,重置突发长度计数器并初始化设备以进行另一个突发访问。 该器件与现有的扩展数据输出DRAM器件引脚排列,快速页面模式和扩展数据输出单列直插存储器模块引脚排列以及其他存储器电路设计兼容。 此外,提供具有流水线和突发扩展数据输出操作模式的DRAM以及在它们之间切换的能力。 另外,提供了可在图案化和无图案寻址方案之间切换的存储器件。
    • 4. 发明授权
    • Asynchronously-accessible memory device with mode selection circuitry for burst or pipelined operation
    • 具有模式选择电路的异步可访问存储器件,用于突发或流水线操作
    • US07681006B2
    • 2010-03-16
    • US08984563
    • 1997-12-03
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • Jeffrey S. MaillouxKevin J. RyanTodd A. MerrittBrett L. Williams
    • G06F13/00
    • G11C7/1027G11C7/1015G11C7/1024G11C7/1039G11C7/1045G11C7/20
    • An integrated circuit memory device is designed for high speed data access and for compatibility with existing memory systems. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. Transitions of the Read/Write control line during a burst access will terminate the burst access, reset the burst length counter and initialize the device for another burst access. The device is compatible with existing Extended Data Out DRAM device pinouts, Fast Page Mode and Extended Data Out Single In-Line Memory Module pinouts, and other memory circuit designs. Additionally, a DRAM is provided having both pipelined and burst Extended Data Out modes of operation and the ability to switch between them.
    • 集成电路存储器件被设计用于高速数据访问和与现有存储器系统的兼容性。 地址选通信号用于锁存第一个地址。 在突发访问周期期间,地址在设备内部增加,并具有额外的地址选通转换。 只有在每次突发访问开始时才需要新的内存地址。 读/写命令每次突发存取发出一次,无需在器件周期频率下切换读/写控制线。 突发访问期间读/写控制线的转换将终止突发访问,重置突发长度计数器并初始化设备以进行另一个突发访问。 该器件与现有的扩展数据输出DRAM器件引脚排列,快速页面模式和扩展数据输出单列直插存储器模块引脚排列以及其他存储器电路设计兼容。 此外,提供具有流水线和突发扩展数据输出操作模式的DRAM以及在它们之间切换的能力。
    • 7. 发明授权
    • Burst EDO memory device
    • Burst EDO存储设备
    • US5696732A
    • 1997-12-09
    • US754780
    • 1996-11-21
    • Paul S. ZagarBrett L. Williams
    • Paul S. ZagarBrett L. Williams
    • G06F12/06G11C7/10G11C11/407G11C8/00
    • G11C7/109G06F12/0638G11C11/407G11C7/1018G11C7/1021G11C7/1024G11C7/1039G11C7/1045G11C7/1078G11C7/1096G06F2212/2022
    • An integrated circuit memory device is designed for high speed data access and for compatibility with existing memory systems. An address strobe signal is used to latch a first address. During a burst access cycle the address is incremented internal to the device with additional address strobe transitions. A new memory address is only required at the beginning of each burst access. Read/Write commands are issued once per burst access eliminating the need to toggle the Read/Write control line at the device cycle frequency. Transitions of the Read/Write control line during a burst access will terminate the burst access, reset the burst length counter and initialize the device for another burst access. The device is compatible with existing Extended Data Out DRAM device pinouts, Fast Page Mode and Extended Data Out Single In-Line Memory Module pinouts, and other memory circuit designs.
    • 集成电路存储器件被设计用于高速数据访问和与现有存储器系统的兼容性。 地址选通信号用于锁存第一个地址。 在突发访问周期期间,地址在设备内部增加,并具有额外的地址选通转换。 只有在每次突发访问开始时才需要新的内存地址。 读/写命令每次突发存取发出一次,无需在器件周期频率下切换读/写控制线。 突发访问期间读/写控制线的转换将终止突发访问,重置突发长度计数器并初始化设备以进行另一个突发访问。 该器件与现有的扩展数据输出DRAM器件引脚排列,快速页面模式和扩展数据输出单列直插存储器模块引脚排列以及其他存储器电路设计兼容。
    • 8. 发明授权
    • Burst EDO memory address counter
    • 突发EDO内存地址计数器
    • US5850368A
    • 1998-12-15
    • US922194
    • 1997-09-02
    • Adrian E. OngPaul S. ZagarBrett L. WilliamsTroy A. Manning
    • Adrian E. OngPaul S. ZagarBrett L. WilliamsTroy A. Manning
    • G11C8/04G11C8/00
    • G11C8/04
    • A counter comprised of two flip flops and a multiplexer produces a sequential or interleaved address sequence. The addresses produced are used to access memory elements in a Burst Extended Data Output Dynamic Random Access Memory (Burst EDO or BEDO DRAM). Input addresses in combination with a sequence select signal are logically combined to produce a multiplexer select input which selects between true and compliment outputs of a first flip flop to couple to an input of a second flip flop to specify a toggle condition for the second flip flop. Outputs of the counter are compared with outputs of an input address latch to detect the end of a burst sequence and initialize the device for another burst access. A transition of the Read/Write control line during a burst access will terminate the burst access and initialize the device for another burst access.
    • 由两个触发器和多路复用器组成的计数器产生顺序或交错地址序列。 所产生的地址用于访问突发扩展数据输出动态随机存取存储器(Burst EDO或BEDO DRAM)中的存储器元件。 与序列选择信号组合的输入地址被逻辑地组合以产生多路复用器选择输入,其选择第一触发器的真实和补码输出以耦合到第二触发器的输入以指定第二触发器的切换条件 。 将计数器的输出与输入地址锁存器的输出进行比较,以检测突发序列的结束,并初始化用于另一个突发存取的设备。 在脉冲串访问期间读/写控制线的转换将终止脉冲串访问并初始化设备以进行另一个突发存取。
    • 10. 发明授权
    • Reconfigurable memory with selectable error correction storage
    • 可重新配置的存储器,具有可选择的纠错存储
    • US06279072B1
    • 2001-08-21
    • US09359926
    • 1999-07-22
    • Brett L. WilliamsDonald D. Baldwin
    • Brett L. WilliamsDonald D. Baldwin
    • G06F1200
    • G06F11/1052
    • A memory structure includes a memory module divided into low order banks and high order banks. The low order banks are used as conventional memory. The high order banks are used as either conventional memory or ECC memory, depending upon routing of data. In one embodiment, data from the high order banks are routed through a primary multiplexer to a data bus when the high order banks are used as conventional memory. When the high order banks are used as ECC memory, data from the auxiliary section is routed through the primary multiplexer to an error correction circuit. A secondary multiplexer combines ECC bits from the auxiliary section of the module or a dedicated ECC memory on a motherboard. The auxiliary section thus supplements the onboard ECC memory to provide support for an effectively larger ECC memory for use with error intolerant applications that require error correction.
    • 存储器结构包括分为低阶存储体和高阶存储体的存储器模块。 低阶存储体用作常规存储器。 根据数据的路由,高阶存储体被用作常规存储器或ECC存储器。 在一个实施例中,当高阶存储体用作常规存储器时,来自高阶存储体的数据经由主多路复用器被路由到数据总线。 当高阶存储体用作ECC存储器时,来自辅助部分的数据通过主复用器被路由到纠错电路。 辅助复用器将来自模块的辅助部分的ECC位或主板上的专用ECC存储器组合。 因此,辅助部分补充了板载ECC存储器,以便为需要纠错的错误不耐受应用提供有效的更大的ECC存储器的支持。