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    • 2. 发明授权
    • Pin photodiode having a low leakage current
    • 引脚光电二极管具有低漏电流
    • US4904608A
    • 1990-02-27
    • US297821
    • 1989-01-17
    • Jean-Louis GentnerJean-Noel PatillonCatherine Mallet-MoukoGerard M. Martin
    • Jean-Louis GentnerJean-Noel PatillonCatherine Mallet-MoukoGerard M. Martin
    • H01L31/10H01L31/105
    • H01L31/105
    • A PIN photodiode having a low leakage current comprises a substrate (10) of indium phosphide (InP) which is n.sup.+ doped and on whose first surface is formed a layer (11) of indium phosphide (InP) which is n.sup.- doped and on which is disposed a MESA structure formed by a layer (12) of gallium indium arsenide (InGaAs) which is n.sup.- doped and is moreover constituted by a layer (13, 113, 213) of the p.sup.+ type formed at the surface, at the edges and along the circumference of the MESA structure. The structure further comprises a metallic contact (22) formed on the second surface of the substrate and an ohmic contact (21) formed on a part of the p.sup.+ layer. The invention is characterized in that the n.sup.- doping of the layer of indium phosphide (InP) (11) is chosen to be lower than the n.sup.- doping of the layer of gallium indium arsenide (InGaAs) (12), and in that the ohmic contact (21) is formed on a part (213) of the p.sup.+ zone located in the layer of indium phosphide (InP) (11) along the circumference of the MESA structure.
    • 具有低泄漏电流的PIN光电二极管包括磷化铟(InP)的衬底(10),其是n +掺杂的,并且其第一表面形成为掺杂的磷化铟(InP)层(11),并且其上 设置由掺杂砷化镓(InGaAs)的层(12)形成的MESA结构,并且还由在表面处形成的p +型的层(13,113,213),在边缘 并沿着MESA结构的圆周。 该结构还包括形成在衬底的第二表面上的金属触点(22)和形成在p +层的一部分上的欧姆接触(21)。 本发明的特征在于,磷化铟层(InP)(11)的n掺杂选择为低于砷化镓砷(InGaAs)(12)的n掺杂,并且因为 欧姆接触(21)沿着MESA结构的圆周形成在位于磷化铟(InP)(11)层中的p +区的部分(213)上。