会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 7. 发明授权
    • Device for measuring, at a plurality of points of a surface, the
microwave field radiated by a source
    • 用于在表面的多个点处测量由源辐射的微波场的装置
    • US5430369A
    • 1995-07-04
    • US962788
    • 1993-01-11
    • Jean-Charles BolomeyDominique Picard
    • Jean-Charles BolomeyDominique Picard
    • G01R29/10G01R1/04
    • G01R29/10
    • An antenna (3) charged by a diode (4) is arranged at each of the points of a surface (30). The source (1) and a collecting antenna (5) are arranged on the same side of this surface, in the vicinity of each other. A layer (32) of absorbent material is provided, one face of which fits the shape of the surface (30) and is arranged on the side of said surface (30) opposite that of the source (1) and of the collecting antenna (5). An addressing circuit (33) of the diodes (4) which fits the shape of the other face of the absorbent layer (32) is connected, via connections which pass through said layer (32) perpendicular to the surface (30), to each of the diodes (4). The use of the modulated diffusion method permits the measurement of the near field radiated by a transmission antenna or diffracted by an object illuminated by a microwave radiation.
    • PCT No.PCT / FR91 / 00479 Sec。 371日期:1993年1月11日 102(e)日期1993年1月11日PCT提交1991年6月14日PCT公布。 公开号WO91 / 19990 日期为1991年12月26日。在表面(30)的每个点处设置由二极管(4)充电的天线(3)。 源(1)和收集天线(5)布置在该表面的彼此相邻的同一侧。 提供吸收材料层(32),其一面适合表面(30)的形状,并且布置在与源(1)和收集天线(30)的相反侧的所述表面(30)侧 5)。 经由穿过所述层(32)垂直于表面(30)的连接件连接到二极管(4)的与吸收层(32)的另一面的形状相配合的寻址电路(33)连接到每个 的二极管(4)。 使用调制扩散方法允许测量由发射天线辐射的近场或由被微波辐射照射的物体衍射。