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    • 2. 发明授权
    • Inspecting apparatus for semiconductor device
    • 半导体器件检测设备
    • US07176704B2
    • 2007-02-13
    • US10823546
    • 2004-04-14
    • Je-hyoung RyuTae-gyu KimSoon-kyu YimSung-jin LeeJun-ho Lee
    • Je-hyoung RyuTae-gyu KimSoon-kyu YimSung-jin LeeJun-ho Lee
    • G01R31/02
    • G01R1/0458
    • An inspecting apparatus for semiconductor devices including: a match plate; a contact module combined with the match plate, and the match plate including a radiation unit radiating heat from the semiconductor devices to the outside, and a test unit contacting leads of the semiconductor; an insert module installed on a bottom of the contact module, and having a semiconductor device accommodator to accommodate the semiconductor device; and an auxiliary radiation member installed on a bottom of the insert module, and radiating the heat from the semiconductor device to the outside. Accordingly, the inspecting apparatus for semiconductor device according to the present invention performs testing at a constant temperature regardless of heat from the semiconductors by radiating the heat from the semiconductors immediately and efficiently, thereby producing more accurate test results. Accurate testing improves productivity and saves expense by removing faulty test results caused by identifying a qualified semiconductor as a defective semiconductor due to heat radiated from the semiconductor device.
    • 一种用于半导体器件的检查装置,包括:匹配板; 与所述匹配板组合的接触模块,所述匹配板包括从所述半导体器件向外部辐射热的辐射单元,以及接触所述半导体的引线的测试单元; 插入模块,安装在所述触点模块的底部,并且具有用于容纳所述半导体器件的半导体器件容纳器; 以及安装在所述插入模块的底部上的辅助辐射构件,并且将来自所述半导体器件的热量散发到外部。 因此,根据本发明的半导体装置的检查装置不管来自半导体的热量是恒定的,通过立即有效地辐射来自半导体的热量进行测试,从而产生更准确的测试结果。 通过从半导体器件辐射的热量,通过识别合格的半导体作为有缺陷的半导体而导致的故障测试结果,可以提高生产率并节省成本。
    • 6. 发明申请
    • FUSING DEVICE AND IMAGE FORMING APPARATUS HAVING THE SAME
    • 熔接装置和具有该装置的图像形成装置
    • US20090092423A1
    • 2009-04-09
    • US12036514
    • 2008-02-25
    • Su-ho SHINDong-woo LeeTae-gyu KimChang-hoon JungTae-hoon KimHwan-hee Kim
    • Su-ho SHINDong-woo LeeTae-gyu KimChang-hoon JungTae-hoon KimHwan-hee Kim
    • G03G15/20
    • G03G15/2064G03G2215/2035
    • A fusing device includes a rotatable pressing roller, a fusing belt to rotate by a rotational force transmitted from the rotatable pressing roller, a nip forming member to contact an inner surface of the fusing belt to form a nip on a contact area between the rotatable pressing roller and the fusing belt, a heating member formed in approximately an internal central portion of the fusing belt to heat the nip forming member and the fusing belt, an inner support member formed within the fusing belt to press a nip part of the nip forming member toward the rotatable pressing roller, and an outer support member formed outside the fusing belt, and both ends of the outer support member being engaged with the inner support member to thereby reinforce the strength of the inner support member and form a path for radiation heat to disperse. The support unit includes an inner support member placed within the belt unit, and an outer support member placed outside the belt unit, both ends of the outer support member being engaged with the inner support member to reinforce the strength of the inner support member and to form a path for a radiation heat to disperse.
    • 定影装置包括可旋转的加压辊,通过从可旋转的加压辊传递的旋转力而旋转的定影带,夹持形成构件,其与定影带的内表面接触,以在可旋转的压制 辊和定影带,形成在定影带的大致中心部分的加热构件,用于加热夹持部件和定影带;形成在定影带内的内部支撑构件,以挤压辊隙形成构件的夹持部分 朝向可旋转的压辊,以及形成在定影带外部的外支撑构件,并且外支撑构件的两端与内支撑构件接合,从而增强内支撑构件的强度,并形成用于辐射热的路径 分散。 支撑单元包括放置在皮带单元内的内支撑构件和设置在皮带单元外部的外支撑构件,外支撑构件的两端与内支撑构件接合以增强内支撑构件的强度, 形成辐射热分散的路径。