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    • 2. 发明授权
    • Failure isolation and repair techniques for integrated circuits
    • 集成电路故障隔离和修复技术
    • US07111213B1
    • 2006-09-19
    • US10316607
    • 2002-12-10
    • Jayabrata Ghosh DastidarMichael Harms
    • Jayabrata Ghosh DastidarMichael Harms
    • G01R31/28G06F11/00
    • G01R31/318516G01R31/318533
    • Techniques for isolating and repairing failures on a programmable circuit are provided. An error on programmable circuit may be caused by a defect on the chip. The error is located, and the circuit elements effected by the defect are isolated. By identifying operable circuit elements near the defect, the number of circuit elements that are adversely effected by the defected can be narrowed down. The failed circuit elements adversely effected by the defect are then shut down and cut off from the rest of the programmable circuit. The functionality performed by the failed circuit elements is transferred to an unused portion of the programmable circuit. The se techniques reduce the amount of circuit elements that need to be shut down as a result of a defect on a programmable circuit.
    • 提供了在可编程电路上分离和修复故障的技术。 可编程电路的错误可能由芯片上的缺陷引起。 定位错误,由缺陷影响的电路元件被隔离。 通过识别缺陷附近的可操作的电路元件,可以缩小由缺陷引起的不利影响的电路元件的数量。 然后由缺陷不利地影响的故障电路元件被关闭并与可编程电路的其余部分切断。 由故障电路元件执行的功能被传送到可编程电路的未使用部分。 该技术减少了由于可编程电路上的缺陷而需要关闭的电路元件的数量。
    • 3. 发明授权
    • Techniques for providing early failure warning of a programmable circuit
    • 提供可编程电路的早期故障警告的技术
    • US07062685B1
    • 2006-06-13
    • US10317436
    • 2002-12-11
    • Jordan PlofskyJayabrata Ghosh DastidarMichael Harms
    • Jordan PlofskyJayabrata Ghosh DastidarMichael Harms
    • G06F11/00
    • G01R31/318516G06F11/1423H03K19/177H03K19/17736
    • Techniques for monitoring the performance of a programmable circuit and to provide an early warning of a potential failure are provided. A processor monitors the performance of components on a programmable circuit over time. The processor stores performance characteristics for the components in memory. If the performance characteristics for particular components fall outside tolerance ranges, these components may to fail to operate according to specifications. Once the performance characteristics for particular components are outside the tolerance ranges, the processor sends out an alert signal. The alert signal indicates the possibility that the performance of the programmable circuit may violate the specifications in the future. The processor may repair the programmable circuit by re-routing around the problem components.
    • 提供了用于监视可编程电路的性能并提供潜在故障的早期警告的技术。 处理器随时间监视可编程电路上的组件的性能。 处理器存储内存中组件的性能特征。 如果特定部件的性能特性落在公差范围之外,这些部件可能无法根据规格进行操作。 一旦特定组件的性能特征超出公差范围,处理器就会发出警报信号。 警报信号表示可编程电路的性能可能会违反将来的规格。 处理器可以通过围绕问题组件重新路由来修复可编程电路。
    • 4. 发明授权
    • Method and apparatus for application specific test of PLDs
    • PLD应用特异性检测方法和装置
    • US07058534B1
    • 2006-06-06
    • US10394486
    • 2003-03-19
    • Paul TracyMichael HarmsJayabrata Ghosh DastidarSteven Perry
    • Paul TracyMichael HarmsJayabrata Ghosh DastidarSteven Perry
    • G01R31/00
    • G01R31/318516
    • Method and apparatus for application specific testing of PLDs. The PLD has a number of resources, less than all of which are used for implementing a customer application. The method includes the following steps. The set of resources that is used for implementing the customer application is identified. A test is then performed only on the set and a test result is generated. Defective resources may be replaced. The PLD is identified as defective only if one of the resources associated with the customer application is defective. Such application specific testing allows the ability of the customer to perform in-system testing, the reduction of the time required for testing the PLD, and the testing of PLDs based on knowledge of the customer's application, among other advantages.
    • PLD应用特定测试方法和设备。 PLD具有多个资源,少于用于实施客户应用程序的资源。 该方法包括以下步骤。 识别用于实现客户应用程序的一组资源。 然后仅对集合进行测试,并生成测试结果。 资源不足可能会被替换。 只有当与客户应用程序相关联的资源之一有缺陷时,PLD才被识别为有缺陷。 这样的应用程序特定测试允许客户执行系统测试,减少测试PLD所需的时间以及基于客户应用知识的PLD测试的能力等。