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1. 发明授权

US06526536B1 Apparatus within an integrated circuit for preventing the integrated circuit from erroneously entering a test mode operation 失效
标题翻译：集成电路内的装置，用于防止集成电路错误地进入测试模式操作
公开(公告)号：US06526536B1
公开(公告)日：2003-02-25
申请号：US08843786
申请日：1997-04-21
申请人： Jason Chen , Bao-Shiang Sun , Henry Fan
发明人： Jason Chen , Bao-Shiang Sun , Henry Fan
IPC分类号： G06F1100
CPC分类号： G01R31/31701 , G06F11/0751
摘要： An integrated circuit is disclosed which includes a start test mode circuit for generating a test mode start-up signal to cause the integrated circuit to enter a test mode, and an automatic reset circuit responsive to the test mode start-up signal for preventing the integrated circuit from erroneously entering a test mode during normal operation.
摘要翻译：公开了一种集成电路，其包括用于产生测试模式启动信号以使集成电路进入测试模式的启动测试模式电路，以及响应于测试模式启动信号的自动复位电路，用于防止集成在正常操作期间错误地进入测试模式的电路。

2. 发明授权

US5977893A Method for testing charge redistribution type digital-to-analog and analog-to-digital converters 失效
标题翻译：用于测试电荷再分配型数模转换器和模数转换器的方法
公开(公告)号：US5977893A
公开(公告)日：1999-11-02
申请号：US844170
申请日：1997-04-18
申请人： Jason Chen , Henry Fan
发明人： Jason Chen , Henry Fan
IPC分类号： G01R31/3167 , H03M1/10 , H03M1/80
CPC分类号： H03M1/1071 , G01R31/3167 , H03M1/804
摘要： A test method for charge redistribution type digital-to-analog and analog-to-digital converters by utilizing the special characteristics of a DAC or ADC such that the accuracy and linearity of the converted signal is only determined by the internal capacitance ratios of the converter, and that the accuracy and linearity are not related to the test reference voltage, the test voltage and the noise signal of the test machine. The test method utilizes a principle of capacitance comparison to directly compare the capacitance ratios in a converter in order to determine the accuracy and linearity of the converted signal. The present invention method enables an effective reduction in the test time and test steps required and an increase in the test efficiency.
摘要翻译：通过利用DAC或ADC的特殊特性，电荷再分配型数模转换器和模数转换器的测试方法，使得转换信号的精度和线性度仅由转换器的内部电容比决定精度和线性度与试验机的试验参考电压，试验电压和噪声信号无关。测试方法利用电容比较原理直接比较转换器中的电容比，以确定转换信号的精度和线性。本发明的方法能够有效地减少测试时间和所需的测试步骤并提高测试效率。

3. 发明授权

US5745541A Data shift control circuit 失效
标题翻译：数据移位控制电路
公开(公告)号：US5745541A
公开(公告)日：1998-04-28
申请号：US797006
申请日：1997-02-07
申请人： Yi Lin , Jason Chen , Henry Fan
发明人： Yi Lin , Jason Chen , Henry Fan
IPC分类号： G11C19/00
CPC分类号： G11C19/00
摘要： A data shift control circuit for a shift register in response to a logic operation command code is disclosed. The shift register includes a first register and a second register and the logic operation command code includes a first portion and a second portion. The circuit includes a first decoder for decoding the first portion to transmit a move signal; a second decoder for decoding the second portion to transmit a control signal; a control signal channel, electrically connected to the first register and the second register, for allowing the first register and the second register to receive the control signal and for allowing the shift register to execute a first action; and a move signal channel, electrically connected to all registers of the shift register for allowing the all registers to receive the move signal and for allowing the move register to execute a second action.
摘要翻译：公开了一种用于响应逻辑运算命令码的移位寄存器的数据移位控制电路。移位寄存器包括第一寄存器和第二寄存器，逻辑运算命令代码包括第一部分和第二部分。电路包括用于解码第一部分以传送移动信号的第一解码器; 第二解码器，用于解码所述第二部分以发送控制信号; 电连接到第一寄存器和第二寄存器的控制信号通道，用于允许第一寄存器和第二寄存器接收控制信号并允许移位寄存器执行第一动作; 以及移动信号通道，电连接到移位寄存器的所有寄存器，用于允许所有寄存器接收移动信号并允许移位寄存器执行第二动作。

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