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1. 发明申请

US20080052868A1 Vacuum Cleaner 有权
标题翻译：吸尘器
公开(公告)号：US20080052868A1
公开(公告)日：2008-03-06
申请号：US11929271
申请日：2007-10-30
申请人： Jae Lee , Hyuk Kwon , Seog Kim , Sang Park
发明人： Jae Lee , Hyuk Kwon , Seog Kim , Sang Park
IPC分类号： A47L5/00
CPC分类号： B04C5/185 , A47L9/108 , A47L9/1608 , A47L9/165 , A47L9/1658 , A47L9/1666 , A47L9/1683 , A47L9/1691 , Y10S15/08 , Y10S55/03
摘要： There is provided a vacuum cleaner. The vacuum cleaner includes a dust storing part; a compression passage connecting a motor generating a negative pressure to the dust storing part; a flow passage control unit that controls opening and closing of the compression passage; and a compression unit compressing dust stored in the dust storing part when the compression passage is opened.
摘要翻译：提供真空吸尘器。真空吸尘器包括一个除尘部分; 压缩通道，其将产生负压的电动机连接到所述除尘部分; 流路控制单元，其控制压缩通路的开闭; 以及压缩单元，当压缩通道打开时，压缩存储在灰尘存储部分中的灰尘。

2. 发明申请

US20080052870A1 Vacuum Cleaner 有权
标题翻译：吸尘器
公开(公告)号：US20080052870A1
公开(公告)日：2008-03-06
申请号：US11929219
申请日：2007-10-30
申请人： Jae Lee , Hyuk Kwon , Seog Kim , Sang Park
发明人： Jae Lee , Hyuk Kwon , Seog Kim , Sang Park
IPC分类号： A47L9/10 , A47L11/24
CPC分类号： B04C5/185 , A47L9/108 , A47L9/1608 , A47L9/165 , A47L9/1658 , A47L9/1666 , A47L9/1683 , A47L9/1691 , Y10S15/08 , Y10S55/03
摘要： There is provided a vacuum cleaner. The vacuum cleaner includes a dust separation part separating dust contained in air; a dust storing part storing dust separated by the dust separation part; a compression unit dividing the dust separation part and dust storing part, for compressing dust stored in the dust storing part; a motor connection passage communicated with a motor generating a negative pressure; a compression passage communicated with the dust storing part; a dust collection passage communicated with the dust separation part; and a flow passage control unit selectively opening and closing the compression passage and the dust collection passage.
摘要翻译：提供真空吸尘器。真空吸尘器包括分离空气中包含的灰尘的除尘部分; 存放由灰尘分离部分分离的灰尘的除尘部分; 压缩单元，其分隔灰尘分离部分和灰尘存储部分，用于压缩存储在灰尘存储部分中的灰尘; 与产生负压的电动机连通的电动机连接通道; 压缩通道与灰尘存储部分连通; 与尘埃分离部连通的集尘通道; 选择性地打开和关闭压缩通道和灰尘收集通道的流路控制单元。

3. 发明申请

US20060123750A1 Dust compressing apparatus and method for dust collecting unit of vacuum cleaner 有权
公开(公告)号：US20060123750A1
公开(公告)日：2006-06-15
申请号：US11297435
申请日：2005-12-09
申请人： Jae Lee , Hyuk Kwon , Seog Kim , Sang Park
发明人： Jae Lee , Hyuk Kwon , Seog Kim , Sang Park
IPC分类号： A47L9/16
CPC分类号： B04C5/185 , A47L9/108 , A47L9/1608 , A47L9/165 , A47L9/1658 , A47L9/1666 , A47L9/1683 , A47L9/1691 , Y10S15/08 , Y10S55/03
摘要： There is provided a dust compressing apparatus for a dust collecting unit of a vacuum cleaner. In the dust compressing apparatus, a compartment plate divides an inner space of a dust collection container into an upper foreign substance separating compartment and a lower foreign substance storing compartment, and a branching unit guides airflow. The branching unit includes a motor connection passage directed to a motor generating a negative pressure, a dust collection passage directed to the foreign substance separating compartment, and a compression passage directed to the foreign substance storing compartment. A flow passage control unit controls connections between the passages of the branching unit. A compression unit compresses foreign substances stored in the foreign substance storing compartment by moving the compartment plate to the foreign substance storing compartment using the negative pressure transmitted through the compression passage.

4. 发明授权

US08604813B2 Built-off test device and test system including the same 有权
标题翻译：内置测试装置和测试系统包括相同的
公开(公告)号：US08604813B2
公开(公告)日：2013-12-10
申请号：US12900748
申请日：2010-10-08
申请人： Hyuk Kwon , Hyoung-Young Lee , Sang-Do Han
发明人： Hyuk Kwon , Hyoung-Young Lee , Sang-Do Han
IPC分类号： G01R31/3187 , G01R31/26
CPC分类号： G01R31/2601 , G01R31/31908 , G01R31/31926
摘要： A built-off test (BOT) device includes a signal processing block, an output selection block and a signal control block. The signal processing block duplicates a test signal to apply a plurality of duplicated test signals to each of a plurality of devices under test (DUTs) through each of corresponding channels, and the signal processing block provides a plurality of decision signals based upon a plurality of test result signals received from each of the DUTs. The output selection block merges the decision signals as a final decision signal or sequentially outputs the decision signals as the final decision signal, in response to an output mode selection signal. The signal control block provides the test signal to the signal processing block or provides the final decision signal externally, in response to a first switching control signal.
摘要翻译：内置测试（BOT）设备包括信号处理块，输出选择块和信号控制块。信号处理块复制测试信号，以通过每个相应的通道将多个复制的测试信号施加到被测设备（DUT）中的每一个，并且信号处理块基于多个测试信号提供多个决定信号从每个DUT接收的测试结果信号。响应于输出模式选择信号，输出选择块将决定信号合并为最终判定信号，或者顺序输出作为最终判定信号的判定信号。信号控制块将测试信号提供给信号处理块，或响应于第一开关控制信号，向外部提供最终判定信号。

5. 发明授权

US07879671B2 Method for manufacturing a semiconductor device that is less prone to DC failures brought about by unwanted defects on capacitors therein 失效
标题翻译：用于制造半导体器件的方法，该半导体器件不容易发生由其中的电容器的不希望的缺陷引起的直流故障
公开(公告)号：US07879671B2
公开(公告)日：2011-02-01
申请号：US12492324
申请日：2009-06-26
申请人： Hyuk Kwon
发明人： Hyuk Kwon
IPC分类号： H01L21/8234
CPC分类号： H01L28/40 , H01L27/10852 , H01L27/10894
摘要： A method for manufacturing a semiconductor device that is less prone to DC failures brought about by unwanted defects on capacitors in the device is presented. Manufacturing defects such as scratches are known to occur when making capacitors and that these defects are thought to be a primary cause of subsequent performance DC failures in the completed semiconductor devices. The method includes the steps of depositing, removing, forming, polishing, etching and forming. A sacrificial layer is exploited to allow a subsequent polishing down step to mechanically remove defects from the capacitors.
摘要翻译：提出了一种制造半导体器件的方法，该半导体器件由于器件中的电容器的不期望的缺陷而导致的不容易发生DC故障。已知在制造电容器时会发生诸如划痕之类的制造缺陷，并且认为这些缺陷是完成的半导体器件中的后续性能直流故障的主要原因。该方法包括沉积，去除，成形，抛光，蚀刻和成形的步骤。利用牺牲层以允许随后的抛光步骤从电容器机械地去除缺陷。

6. 发明授权

US06943577B2 Multichip package test 失效
标题翻译： Multichip包测试
公开(公告)号：US06943577B2
公开(公告)日：2005-09-13
申请号：US10677743
申请日：2003-10-01
申请人： Young-Gu Shin , Kyoung-Il Heo , Hyoung-Young Lee , Hyuk Kwon , Ki-Bong Ju , Jeong-Ho Bang , Hyun-Seop Shim
发明人： Young-Gu Shin , Kyoung-Il Heo , Hyoung-Young Lee , Hyuk Kwon , Ki-Bong Ju , Jeong-Ho Bang , Hyun-Seop Shim
IPC分类号： G01R31/28 , G01R31/26 , G01R31/3185
CPC分类号： G01R31/318505 , G01R31/318513
摘要： A test apparatus for testing a multi-chip package comprising a multiplicity of semiconductor chips, which includes a test driver having one drive channel and at least one input/output channel. A test board is mounted with the multi-chip package. Drive pins of the semiconductor chips are parallel connected to the drive channel, and input/output pins of the semiconductor chips are parallel connected to the input/output channel.
摘要翻译：一种用于测试包括多个半导体芯片的多芯片封装的测试装置，其包括具有一个驱动通道和至少一个输入/输出通道的测试驱动器。测试板安装有多芯片封装。半导体芯片的驱动引脚并联连接到驱动通道，并且半导体芯片的输入/输出引脚并联连接到输入/输出通道。

7. 发明授权

US07130649B2 Message creating apparatus and method for mobile phone 失效
标题翻译：手机消息创建装置和方法
公开(公告)号：US07130649B2
公开(公告)日：2006-10-31
申请号：US10472294
申请日：2002-10-07
申请人： Hyuk Kwon , Jae-Yeong Lee
发明人： Hyuk Kwon , Jae-Yeong Lee
IPC分类号： H04Q7/20
CPC分类号： H04M1/72552 , G06F17/211 , H04W88/02
摘要： This invention is a message crating apparatus and message writing method for mobile phone. The above message (SMS or LMS) of mobile phone is including an attribute information(letter color, background color, background scene, letter blink, etc.). Therefore, message creating apparatus and message writing method of the present invention add an attribute information that can select freely that letter color, background color, background scene, letter blink, etc., and use non-print code of ASCII code to keep compatibility with a short message service (SMS) function of existing mobile phone.
摘要翻译：本发明是用于移动电话的消息打包装置和消息写入方法。手机的上述信息（SMS或LMS）包括属性信息（字母颜色，背景颜色，背景场景，字母闪烁等）。因此，本发明的消息创建装置和消息写入方法添加可以自由选择字母颜色，背景颜色，背景场景，字母闪烁等的属性信息，并且使用ASCII码的非打印代码来保持与现有手机的短消息服务（SMS）功能。

8. 发明申请

US20050284577A1 Glass support system, method of supporting glass, and etching equipment using the same 有权
标题翻译：玻璃支撑系统，支撑玻璃的方法和使用其的蚀刻设备
公开(公告)号：US20050284577A1
公开(公告)日：2005-12-29
申请号：US11159804
申请日：2005-06-23
申请人： Hyuk Kwon
发明人： Hyuk Kwon
IPC分类号： B44C1/22 , B65G49/06 , C23F1/00
CPC分类号： B65G49/065 , B65G2249/02
摘要： The present invention provides a glass support system, including methods and equipment for supporting a glass substrate on a column of air. The disclosed glass alignment equipment may be used to prevent or reduce defects or contamination on the surface of a glass substrate which may arise when the glass is aligned prior to etching. In particular, a support pin of the present invention may be used with an air circulation system to support or align glass over a column of air so as to reduce or prevent defects or contamination on the glass in dry etching processes used in the manufacturing of LCDs and other devices.
摘要翻译：本发明提供了一种玻璃支撑系统，包括用于将玻璃基板支撑在空气柱上的方法和设备。所公开的玻璃对准设备可用于防止或减少在蚀刻之前对准玻璃时可能出现的玻璃基板表面上的缺陷或污染。特别地，本发明的支撑销可以与空气循环系统一起使用，以在玻璃柱上支撑或对齐玻璃，以便在用于制造LCD的干式蚀刻工艺中减少或防止玻璃上的缺陷或污染和其他设备。

9. 发明申请

US20050150559A1 Apparatus and method for controlling exhaust pressure in semiconductor manufacturing 失效
标题翻译：用于控制半导体制造中排气压力的装置和方法
公开(公告)号：US20050150559A1
公开(公告)日：2005-07-14
申请号：US11032103
申请日：2005-01-11
申请人： Hyuk Kwon , Jong-Chul Park
发明人： Hyuk Kwon , Jong-Chul Park
IPC分类号： H01L21/02 , F16K3/32 , F16K3/34
CPC分类号： F16K3/34 , F16K1/222 , F16K1/223 , F16K3/0209 , F16K3/32 , F16K51/02 , Y10T137/7761 , Y10T137/8696 , Y10T137/87378
摘要： An apparatus and method for controlling exhaust produced by a reactive chamber is provided. The apparatus for controlling exhaust may include, for example, a valve body having an exhaust hole for the exhaust to pass through, and may include a first and second valve which regulate the opening and/or the closing of the exhaust hole. A control device may control the operation of the first and second valves based on the internal pressure of the reactive chamber.
摘要翻译：提供了一种用于控制由反应室产生的排气的装置和方法。用于控制排气的装置可以包括例如具有用于排气通过的排气孔的阀体，并且可以包括调节排气孔的打开和/或关闭的第一和第二阀。控制装置可以基于反应室的内部压力来控制第一和第二阀的操作。

10. 发明授权

US07327154B2 Multichip package test 失效
标题翻译： Multichip包测试
公开(公告)号：US07327154B2
公开(公告)日：2008-02-05
申请号：US11191494
申请日：2005-07-27
申请人： Young-Gu Shin , Kyoung-Il Heo , Hyoung-Young Lee , Hyuk Kwon , Ki-Bong Ju , Jeong-Ho Bang , Hyun-Seop Shim
发明人： Young-Gu Shin , Kyoung-Il Heo , Hyoung-Young Lee , Hyuk Kwon , Ki-Bong Ju , Jeong-Ho Bang , Hyun-Seop Shim
IPC分类号： G01R31/28
CPC分类号： G01R31/318505 , G01R31/318513
摘要： A test apparatus for testing a multi-chip package comprising a multiplicity of semiconductor chips, which includes a test driver having one drive channel and at least one input/output channel. A test board is mounted with the multi-chip package. Drive pins of the semiconductor chips are parallel connected to the drive channel, and input/output pins of the semiconductor chips are parallel connected to the input/output channel.
摘要翻译：一种用于测试包括多个半导体芯片的多芯片封装的测试装置，其包括具有一个驱动通道和至少一个输入/输出通道的测试驱动器。测试板安装有多芯片封装。半导体芯片的驱动引脚并联连接到驱动通道，并且半导体芯片的输入/输出引脚并联连接到输入/输出通道。

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