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    • 2. 发明申请
    • Method And Apparatus For Reading And Programming A Non-Volatile Memory Cell In A Virtual Ground Array
    • US20090290430A1
    • 2009-11-26
    • US12126853
    • 2008-05-23
    • Jack FrayerYa-Fen LinGianfranco PellegriniWilliam SaikiChangyuan ChenXiuhong Chen
    • Jack FrayerYa-Fen LinGianfranco PellegriniWilliam SaikiChangyuan ChenXiuhong Chen
    • G11C16/06
    • G11C16/0475G11C11/5642G11C11/5671G11C16/0458G11C16/0491G11C2211/5612
    • A method and apparatus for dynamic programming and dynamic reading of a select non-volatile memory cell in a virtual grounds array is disclosed. The array of non-volatile memory cells are arranged in a plurality of rows and columns, wherein each cell in the same column share a first local bit line to one side and share a second local bit line to another side. Alternating local bit lines are connected to a first global bit line and other alternating local bit lines are connected to a second global bit line with the global bit lines connected to a sense amplifier. In the dynamic read operation the global bit lines and the associated local bit lines are connected to a precharged voltage. One of the first or second global bit lines is connected to a low voltage such as ground, wherein the one global bit line connected to ground also connects to the local bit line for sensing the select non-volatile memory cell. The state of the select non-volatile memory cell is detected by detecting the sense amplifier connected to the global bit line, other than the one global bit line. In a dynamic programming operation, the first and second global bit lines and their associated local bit lines are precharged to a first voltage. One of the first or second global bit line and its associated local bit lines is connected to a second voltage, wherein the associated local bit lines of the one global bit line include a select bit line connected to a programming terminal of the select non-volatile memory cell. The voltage differential between the second voltage and the first voltage is insufficient to cause programming of the select non-volatile memory cell. The bit line, other than the select bit line of the select non-volatile memory cell, is connected to a low voltage such as ground. The voltage differential between the second voltage and ground is sufficient to cause programming of the select non-volatile memory cell. In another embodiment of the programming operation, a local bit line connected to a programming terminal of a select non-volatile memory cell is precharged to a first voltage and then boosted to a programming voltage by precharging an adjacent local bit line.
    • 3. 发明授权
    • Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture
    • 非扩散结分离栅极非易失性存储器单元和阵列,其编程,擦除和读取方法以及制造方法
    • US07723774B2
    • 2010-05-25
    • US11775851
    • 2007-07-10
    • Changyuan ChenYa-Fen LinDana Lee
    • Changyuan ChenYa-Fen LinDana Lee
    • H01L29/788
    • G11C16/0458G11C16/10H01L27/115H01L27/11521H01L29/42328H01L29/42336H01L29/7887
    • Nonvolatile flash memory systems and methods are disclosed having a semiconductor substrate of a first conductivity type, including non-diffused channel regions through which electron flow is induced by application of voltage to associated gate elements. A plurality of floating gates are spaced apart from one another and each insulated from the channel region. A plurality of control gates are spaced apart from one another and insulated from the channel region, with each control gate being located between a first floating gate and a second floating gate and capacitively coupled thereto to form a subcell. A plurality of spaced-apart assist gates are insulated from the channel region, with each assist gate being located between and insulated from adjacent subcells. The channel is formed of three regions, two beneath adjacent control gate elements as well as a third region between the first two and beneath an associated assist gate.
    • 公开了非挥发性闪速存储器系统和方法,其具有第一导电类型的半导体衬底,包括非扩散沟道区,通过向相关联的栅极元件施加电压而引起电子流。 多个浮动栅极彼此间隔开并且与沟道区域绝缘。 多个控制栅极彼此间隔开并且与沟道区域绝缘,每个控制栅极位于第一浮动栅极和第二浮动栅极之间,并电容耦合到其上以形成子电池。 多个间隔开的辅助栅极与沟道区域绝缘,每个辅助栅极位于相邻子电池之间并且与相邻的子电池绝缘。 通道由三个区域组成,两个位于相邻的控制栅极元件下方,以及位于相关联的辅助栅极之间的第一个两个和第二区域之间。
    • 6. 发明授权
    • Non-diffusion junction split-gate nonvolatile memory cells and arrays, methods of programming, erasing, and reading thereof, and methods of manufacture
    • 非扩散结分离栅极非易失性存储器单元和阵列,其编程,擦除和读取方法以及制造方法
    • US08164135B2
    • 2012-04-24
    • US12773811
    • 2010-05-04
    • Changyuan ChenYa-Fen LinDana Lee
    • Changyuan ChenYa-Fen LinDana Lee
    • H01L29/788
    • G11C16/0458G11C16/10H01L27/115H01L27/11521H01L29/42328H01L29/42336H01L29/7887
    • Nonvolatile flash memory systems and methods are disclosed having a semiconductor substrate of a first conductivity type, including non-diffused channel regions through which electron flow is induced by application of voltage to associated gate elements. A plurality of floating gates are spaced apart from one another and each insulated from the channel region. A plurality of control gates are spaced apart from one another and insulated from the channel region, with each control gate being located between a first floating gate and a second floating gate and capacitively coupled thereto to form a subcell. A plurality of spaced-apart assist gates are insulated from the channel region, with each assist gate being located between and insulated from adjacent subcells. The channel is formed of three regions, two beneath adjacent control gate elements as well as a third region between the first two and beneath an associated assist gate.
    • 公开了非挥发性闪速存储器系统和方法,其具有第一导电类型的半导体衬底,包括非扩散沟道区,通过向相关联的栅极元件施加电压而引起电子流。 多个浮动栅极彼此间隔开并且与沟道区域绝缘。 多个控制栅极彼此间隔开并且与沟道区域绝缘,每个控制栅极位于第一浮动栅极和第二浮动栅极之间,并电容耦合到其上以形成子电池。 多个间隔开的辅助栅极与沟道区域绝缘,每个辅助栅极位于相邻子电池之间并且与相邻的子电池绝缘。 通道由三个区域组成,两个位于相邻的控制栅极元件下方,以及位于相关联的辅助栅极之间的第一个两个和第二区域之间。