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1. 发明申请

US20040056654A1 Magnetic field characterization of stresses and properties in materials 审中-公开
标题翻译：材料应力和性能的磁场表征
公开(公告)号：US20040056654A1
公开(公告)日：2004-03-25
申请号：US10441976
申请日：2003-05-20
申请人： JENTEK Sensors, Inc.
发明人： Neil J. Goldfine , Ian C. Shay , Darrell E. Schlicker , Andrew P. Washabaugh , David C. Grundy , Robert J. Lyons , Vladimir A. Zilberstein , Vladimir Tsukernik
IPC分类号： G01N027/72 , G01R033/12
CPC分类号： G01N27/9013
摘要： Described are methods for monitoring of stresses and other material properties. These methods use measurements of effective electrical properties, such as magnetic permeability and electrical conductivity, to infer the state of the test material, such as the stress, temperature, or overload condition. The sensors, which can be single element sensors or sensor arrays, can be used to periodically inspect selected locations, mounted to the test material, or scanned over the test material to generate two-dimensional images of the material properties. Magnetic field or eddy current based inductive and giant magnetoresistive sensors may be used on magnetizable and/or conducting materials, while capacitive sensors can be used for dielectric materials. Methods are also described for the use of state-sensitive layers to determine the state of materials of interest. These methods allow the weight of articles, such as aircraft, to be determined.
摘要翻译：描述了用于监测应力和其他材料性质的方法。这些方法使用诸如磁导率和电导率之类的有效电性能的测量来推断测试材料的状态，例如应力，温度或过载条件。可以使用可以是单元件传感器或传感器阵列的传感器来周期性地检查安装到测试材料上的选定位置，或者在测试材料上扫描以产生材料性质的二维图像。基于磁场或涡电流的感应和巨磁阻传感器可用于可磁化和/或导电材料，而电容传感器可用于介电材料。还描述了使用状态敏感层来确定感兴趣的材料的状态的方法。这些方法允许确定诸如飞机的物品的重量。

2. 发明申请

US20040004475A1 High throughput absolute flaw imaging 审中-公开
标题翻译：高通量绝对缺陷成像
公开(公告)号：US20040004475A1
公开(公告)日：2004-01-08
申请号：US10419702
申请日：2003-04-18
申请人： JENTEK Sensors, Inc.
发明人： Neil J. Goldfine , Vladimir A. Zilberstein , J. Stephen Cargill , Darrell E. Schlicker , Ian C. Shay , Andrew P. Washabaugh , Vladimir Tsukernik , David C. Grundy , Mark D. Windoloski
IPC分类号： G01N027/90 , G01R033/12
CPC分类号： G01N27/82 , G01N27/902
摘要： Apparatus and methods are described for the improved throughput and increased reliability for inspection of critical surfaces on aircraft engine disks. Eddy current sensor arrays allow two-dimensional images to be generated for detection of cracks in regions with fretting damage. Background variations due to fretting damage and stress variations are also accommodated. These arrays are combined with instrumentation that permits parallel data acquisition for each sensing element and rapid inspection rates. Inflatable support structures behind the sensor array improve sensor durability and reduce fixturing requirements for the inspection.
摘要翻译：描述了用于提高吞吐量和增加对飞机引擎盘上的关键表面的检查的可靠性的装置和方法。涡流传感器阵列允许生成二维图像，以检测具有微动损伤的区域中的裂纹。由于微小的损伤和应力变化引起的背景变化也被应用。这些阵列与允许每个感测元件并行数据采集和快速检测速率的仪器相结合。传感器阵列后面的充气支撑结构可提高传感器的耐用性，并减少检测的固定要求。

3. 发明申请

US20020075006A1 Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation grids 审中-公开
公开(公告)号：US20020075006A1
公开(公告)日：2002-06-20
申请号：US10040797
申请日：2002-01-07
申请人： JENTEK Sensors, Inc.
发明人： Neil J. Goldfine , Markus Zahn , Alexander V. Mamishev , Darrell E. Schlicker , Andrew P. Washabaugh
IPC分类号： G01R029/12
CPC分类号： G01R27/2623
摘要： A method is disclosed for processing, optimization, calibration, and display of measured dielectrometry signals. A property estimator is coupled by way of instrumentation to an electrode structure and translates sensed electromagnetic responses into estimates of one or more preselected properties or dimensions of the material, such as dielectric permittivity and ohmic conductivity, layer thickness, or other physical properties that affect dielectric properties, or presence of other lossy dielectric or metallic objects. A dielectrometry sensor is disclosed which can be connected in various ways to have different effective penetration depths of electric fields but with all configurations having the same air-gap, fluid gap, or shim lift-off height, thereby greatly improving the performance of the property estimators by decreasing the number of unknowns. The sensor geometry consist of a periodic structure with, at any one time, a single sensing element that provides for multiple wavelength within the same sensor footprint.

4. 发明申请

US20030164700A1 High resolution hidden damage imaging 审中-公开
标题翻译：高分辨率隐藏伤害成像
公开(公告)号：US20030164700A1
公开(公告)日：2003-09-04
申请号：US10345883
申请日：2003-01-15
申请人： JENTEK Sensors, Inc.
发明人： Neil J. Goldfine , Darrell E. Schlicker , Andrew P. Washabaugh , Mark D. Windoloski , David C. Grundy , Ian C. Shay
IPC分类号： G01N027/82 , G01R033/12
CPC分类号： G01N27/904 , G01N27/82 , G01N27/902
摘要： This invention relates to apparatus for the nondestructive measurements of materials. New eddy current sensing arrays and methods are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects and flaws around features such as fasteners. The arrays incorporate unique layouts for the sensing elements, generally have essentially identical sensor arrays with sensing elements aligned in proximity to the drive elements, and conductive pathways that promote cancellation of undesired magnetic flux. These features enable the use of small sense elements that permits high resolution imaging of material properties.
摘要翻译：本发明涉及用于材料的非破坏性测量的装置。描述了新的涡流感测阵列和方法，其提供测试材料的高分辨率成像的能力，并且对诸如紧固件之类的特征周围的缺陷和缺陷也具有高的检测难度。该阵列包含用于感测元件的独特布局，通常具有基本上相同的传感器阵列，其中感测元件在驱动元件附近对齐，以及促进非期望磁通量消除的导电通路。这些特征使得能够使用允许材料性质的高分辨率成像的小感测元件。

5. 发明申请

US20020158626A1 Deep penetration magnetoquasistatic arrays 有权
标题翻译：深度穿透磁测量阵列
公开(公告)号：US20020158626A1
公开(公告)日：2002-10-31
申请号：US10045650
申请日：2001-11-08
申请人： Jentek Sensors, Inc.
发明人： Ian Shay , Neil J. Goldfine , Andrew P. Washabaugh , Darrell E. Schlicker
IPC分类号： H01F005/00 , G01B007/14 , G01B007/30
CPC分类号： G01N27/82 , G01N27/902
摘要： The combination of giant magnetoresistive (GMR) sensing element arrays with shaped field, distributed drive windings provides a deep measurement capability for magnetic and/or conducting materials. Sensor designs are disclosed that use either sinusoidal or first order Bessel function shaped quasistatic field drive designs with a method to provide two magnetic field penetration depths within the same sensor footprint and at the same temporal excitation frequency. An easy to model drive construct supports substantial calibration requirement reduction and rapid generation of sensor response databases called measurement grids used for rapid estimation of multiple properties. Use of one deep penetration drive with an array of GMR sensing elements provides both high-resolution imaging and sensitivity deep into complex structures. This wide area scanning capability offers a substantial improvement over conventional eddy current sensors that have an inherent trade-off between depth of sensitivity and image resolution. Novel feedback methods for controlling the magnetic field at the GMR sensing elements improve robustness by eliminating effects of non-linear GMR transfer characteristics. The use of this feedback method, even with simple drive constructs, such as a simple rectangular drive with one or more GMR sensors inside our outside the drive winding region, offers substantial new capabilities for nondestructive testing and materials characterization.
摘要翻译：具有成形磁场，分布式驱动绕组的巨磁阻（GMR）感测元件阵列的组合为磁性和/或导电材料提供了深度测量能力。公开了传感器设计，其使用正弦或一阶贝塞尔函数形准态场驱动设计，其方法是在相同的传感器覆盖区内和在相同的时间激励频率下提供两个磁场穿透深度。易于建模的驱动器结构支持实质性的校准要求降低，并快速生成称为测量网格的传感器响应数据库，用于快速估计多个属性。使用一个具有GMR感测元件阵列的深度穿透驱动器，可以在复杂结构中提供高分辨率成像和灵敏度。与传统的涡流传感器相比，这种广泛的扫描能力具有显着的改进，在传感器的灵敏度和图像分辨率之间具有固有的权衡。用于控制GMR感应元件的磁场的新型反馈方法通过消除非线性GMR传输特性的影响来提高鲁棒性。即使使用简单的驱动结构，使用这种反馈方法，例如在驱动绕组区域外部具有一个或多个GMR传感器的简单矩形驱动，为非破坏性测试和材料表征提供了大量新功能。

6. 发明申请

US20040239317A1 High resolution inductive sensor arrays for material and defect characterization of welds 有权
标题翻译：用于焊接材料和缺陷表征的高分辨率感应传感器阵列
公开(公告)号：US20040239317A1
公开(公告)日：2004-12-02
申请号：US10788526
申请日：2004-02-27
申请人： JENTEK Sensors, Inc.
发明人： Neil J. Goldfine , Vladimir A. Zilberstein , Darrell E. Schlicker , David C. Grundy , Ian Shay , Andrew P. Washabaugh
IPC分类号： G01N027/82
CPC分类号： G01N27/82 , G01N27/902
摘要： A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
摘要翻译：表征材料焊缝的传感器。传感器包括具有至少三个延伸部分的曲折的驱动绕组以及放置在相邻的一对延伸部分之间的至少一个感测元件。时变电流通过延伸部分形成磁场。将传感器放置在测试材料附近并在焊接区域上翻译。对于每个感测元件位置测量焊接区域的电特性。使用电性能测量和位置的特征确定焊缝质量。

7. 发明申请

US20030155914A1 Fluid supports for sensors 有权
标题翻译：用于传感器的流体支架
公开(公告)号：US20030155914A1
公开(公告)日：2003-08-21
申请号：US10348339
申请日：2003-01-21
申请人： JENTEK Sensors, Inc.
发明人： Vladimir Tsukernik , Neil J. Goldfine , Andrew P. Washabaugh , Darrell E. Schlicker , Karen E. Walrath , Eric Hill , Vladimir A. Zilberstein
IPC分类号： G01N027/82 , G01R033/12
CPC分类号： G01N27/82
摘要： Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.
摘要翻译：使用加压的弹性支撑结构或气球将柔性传感器压在表面上，以测试被测材料。也可以将刚性支撑元件结合到检查装置中，以维持检查结构的基本形状并且便于传感器在测试材料表面附近的定位。刚性支撑件可以具有测试材料表面的近似形状，或者可以使用一个或多个气囊的加压使传感器与测试材料表面的形状相一致。

8. 发明申请

US20020105325A1 High resolution inductive sensor arrays for material and defect characterization of welds 有权
标题翻译：用于焊接材料和缺陷表征的高分辨率感应传感器阵列
公开(公告)号：US20020105325A1
公开(公告)日：2002-08-08
申请号：US10046925
申请日：2002-01-15
申请人： JENTEK Sensors, Inc.
发明人： Neil J. Goldfine , Vladimir A. Zilberstein , Darrell E. Schlicker , David C. Grundy , Ian Shay , Andrew P. Washabaugh
IPC分类号： G01N027/82
CPC分类号： G01N27/82 , G01N27/902
摘要： A sensor that characterizes welds in materials. The sensor includes a meandering drive winding with at least three extended portions and at least one sensing element placed between an adjacent pair of extended portions. A time varying electric current is passed through the extended portions to form a magnetic field. The sensor is placed in proximity to the test material and translated over the weld region. An electrical property of the weld region is measured for each sensing element location. The weld quality is determined using a feature of the electrical property measurement and location.
摘要翻译：表征材料焊缝的传感器。传感器包括具有至少三个延伸部分的曲折的驱动绕组以及放置在相邻的一对延伸部分之间的至少一个感测元件。时变电流通过延伸部分形成磁场。将传感器放置在测试材料附近并在焊接区域上翻译。对于每个感测元件位置测量焊接区域的电特性。使用电性能测量和位置的特征确定焊缝质量。

9. 发明申请

US20040232911A1 Eddy current sensor arrays having drive windings with extended portions 有权
公开(公告)号：US20040232911A1
公开(公告)日：2004-11-25
申请号：US10876002
申请日：2004-06-23
申请人： JENTEK Sensors, Inc.
发明人： Darrell E. Schlicker , Neil J. Goldfine , Andrew P. Washabaugh , Karen E. Walrath , Ian C. Shay , David C. Grundy , Mark Windoloski
IPC分类号： G01N027/82
CPC分类号： G01N27/9033 , G01N27/82 , G01N27/902 , G01N27/904
摘要： An apparatus for the nondestructive measurements of materials. Eddy current sensing arrays are described which provide a capability for high resolution imaging of test materials and also a high probabilitity of detection for defects. These arrays incorporate layouts for the sensing elements which take advantage of microfabrication manufacturing capabilities for creating essentially identical sensor arrays, aligning sensing elements in proximity to the drive elements, and laying out conductive pathways that promote cancellation of undesired magnetic flux.

10. 发明申请

US20040225474A1 Damage tolerance using adaptive model-based methods 审中-公开
标题翻译：使用基于模型的自适应方法的伤害容限
公开(公告)号：US20040225474A1
公开(公告)日：2004-11-11
申请号：US10763573
申请日：2004-01-22
申请人： Jentek Sensors, Inc.
发明人： Neil J. Goldfine , Vladimir A. Zilberstein , David C. Grundy , Andrew P. Washabaugh
IPC分类号： G06F015/00
CPC分类号： G05B23/0283 , B64D2045/008 , G01N27/9046 , G05B23/0245
摘要： A model based framework utilizing a vector of multiple material states integrates nondestructive evaluation methods that provide observability of precursor and damage states with health control actions to reduce sustainment costs and extend component lifetimes. This evaluation includes usage monitoring and onboard diagnostics to ensure damage state observability. With an adaptive damage tolerance model, a set of precursor and damage states are assumed. Monitoring of precursor states, early damage detection, and observable health control actions, combined with onboard diagnostics, permit reduced costs and ensure readiness.
摘要翻译：利用多种物质状态向量的基于模型的框架集成了非破坏性评估方法，可以通过健康控制措施提供前体和损伤状态的可观察性，从而降低维持成本并延长组件的使用寿命。此评估包括使用监控和板载诊断，以确保损坏状态的可观察性。使用自适应损伤容限模型，假设一组前兆和损伤状态。监测前体状态，早期损伤检测和可观察到的健康控制行动以及车载诊断，可以降低成本并确保准备就绪。

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