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    • 9. 发明专利
    • VIBROMETER
    • JPS62212530A
    • 1987-09-18
    • JP5508286
    • 1986-03-14
    • SUMITOMO ELECTRIC INDUSTRIES
    • USAMI HIROSHI
    • G01H9/00
    • PURPOSE:To make it possible to detect a vibration state without being affected by the electrical noise, by observing the photoelastic state generated in a photoelastic effect element with beam. CONSTITUTION:The polarized beam emitted from semiconductive laser 5 is guided to a beam splitter 7 by a fiber 6 to be split into two beams. Subsequently, one polarized beam is passed through a photoelastic effect element 10 through a fiber 8 and a lens 9, and condensed by a lens 11 to be guided to an optical coupler 17 by a fiber 12. Further, the other polarized beam is guided by a fiber 13 to be guided to the coupler 17 by lenses 14, 15 and a fiber 16 and coupled with the beam guided by the fiber 12 and passed through the element 10 to be detected by a beam detector 19. When vibration is sensed by a strain sensor 1, the element 10 moves up and down and, therefore, the element 10 is compressed or restored to the original state. As a result, the refractive index of the element 10 is changed and interference is generated by the coupling with polarized beam not passing through the element 10 and the amplitude and phase interval of vibration can be detected by the detector 19. Therefore, a vibration state can be detected without being affected by the electrical noise.