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    • 1. 发明申请
    • Heated chuck for laser thermal processing
    • 加热卡盘用于激光热处理
    • US20060113290A1
    • 2006-06-01
    • US11001954
    • 2004-12-01
    • Iqbal ShareefIgor LandauDavid MarkleSomit TalwarMichael ThompsonIvelin AngelovSenquan Zhou
    • Iqbal ShareefIgor LandauDavid MarkleSomit TalwarMichael ThompsonIvelin AngelovSenquan Zhou
    • B23K26/00B23K26/02
    • B23K26/703
    • A chuck for supporting a wafer and maintaining a constant background temperature across the wafer during laser thermal processing (LTP) is disclosed. The chuck includes a heat sink and a thermal mass in the form of a heater module. The heater module is in thermal communication with the heat sink, but is physically separated therefrom by a thermal insulator layer. The thermal insulator maintains a substantially constant power loss at least equal to the maximum power delivered by the laser, less that lost by radiation and convection. A top plate is arranged atop the heater module, supports the wafer to be processed, and provides a contamination barrier. The heater module is coupled to a power supply that is adapted to provide varying amounts of power to the heater module to maintain the heater module at the constant background temperature even when the wafer experiences a spatially and temporally varying heat load from an LTP laser beam. Thus, heat from the laser is transferred from the wafer to the heat sink via the heater module and the insulator layer. In the absence of any laser heating, heat is also transferred from the heater module to the wafer as needed to maintain the constant background temperature.
    • 公开了一种用于在激光热处理(LTP)期间支撑晶片并在晶片上保持恒定的背景温度的卡盘。 卡盘包括散热器和加热器模块形式的热质量。 加热器模块与散热器热连通,但是通过绝热层在物理上与其分离。 热绝缘体保持至少等于由激光器传递的最大功率的基本恒定的功率损耗,而不是由辐射和对流损失。 顶板布置在加热器模块的顶部,支撑要处理的晶片,并提供污染屏障。 加热器模块耦合到电源,其适于向加热器模块提供变化量的功率,以将加热器模块保持在恒定的背景温度,即使当晶片经历来自LTP激光束的空间上和时间上变化的热负载时。 因此,来自激光器的热量通过加热器模块和绝缘体层从晶片传递到散热器。 在没有激光加热的情况下,根据需要也从加热器模块转移到晶片以保持恒定的背景温度。
    • 3. 发明申请
    • Heat shield for thermal processing
    • 用于热处理的隔热罩
    • US20060237403A1
    • 2006-10-26
    • US11112647
    • 2005-04-22
    • Iqbal ShareefBoris GrekMichael Thompson
    • Iqbal ShareefBoris GrekMichael Thompson
    • B23K26/00
    • B23K26/703
    • A heat shield (10) that facilitates thermally processing a substrate (22) with a radiation beam (150) is disclosed. The heat shield is in the form of a cooled plate adapted to allow the radiation beam to communicate with the substrate upper surface (20) over a radiation beam path (BP), either through an aperture or a transparent region. The heat shield has an operating position that forms a relatively small gap (170) between the lower surface (54) of the heat shield and the upper surface of the wafer. The gap is sized such that the formation of convection cells (200) is suppressed during substrate surface irradiation. If convection cells do form, they are kept out of the radiation beam path. This prevents the radiation beam from wandering from the desired radiation beam path, which in turn allows for uniform heating of the substrate during thermal processing.
    • 公开了一种有助于用辐射束(150)热处理衬底(22)的隔热罩(10)。 隔热板是冷却板的形式,其适于允许辐射束通过光圈或透明区域在辐射束路径(BP)上与衬底上表面(20)连通。 隔热罩具有在隔热罩的下表面(54)和晶片的上表面之间形成相对小的间隙(170)的操作位置。 间隙的尺寸使得在衬底表面照射期间抑制形成对流电池(200)。 如果形成对流电池,则它们被保持在辐射束路径之外。 这防止辐射束从所需的辐射束路径移动,这又允许在热处理期间对衬底的均匀加热。