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1. 发明专利

JP2010261923A Scanning-type electrochemistry ion conductance microscope measuring method, scanning-type electrochemistry ion conductance microscope, probe for the same, and probe manufacturing method 有权
标题翻译：扫描型电化学离子导管显微镜测量方法，扫描型电化学离子导电显微镜，相同的探针和探针制造方法
公开(公告)号：JP2010261923A
公开(公告)日：2010-11-18
申请号：JP2009140602
申请日：2009-06-11
申请人： Imperial Innovations Ltd , Tohoku Univ , インペリアルイノベーションズリミテッド , 国立大学法人東北大学
发明人： TAKAHASHI YASUSHI , SUENAGA TOMOKAZU , SHUKU HITOSHI , MURAKAMI ARIYOSHI , NAGAMINE KUNIAKI , SHEVCHUK ANDREW , KORCHEV YURI
IPC分类号： G01Q60/60 , G01Q60/22
摘要： PROBLEM TO BE SOLVED: To provide a scanning-type electrochemistry ion conductance microscope measuring method, scanning type electrochemistry ion conductance microscope, probe of the same, and probe measuring method, capable of attaining shape imaging and electrochemistry imaging by performing scanning, in such a mode that the distance between one probe and a sample is constant, using the probe.
SOLUTION: A SECM electrode 26A for measuring a Faraday current is attached onto an end surface formed by sharpening one end of a hollow base material to take it as one end 25b and cutting the end. A probe 21, having a SICM electrode 27 for measuring an ion current corresponding to an outflow amount from an opening 25c
1 in the end surface of electrolyte charged into a hollow portion 25a
1 , is used in the hollow portion 25a
1 of the hollow base material. The probe 21 is scanned relatively along a sample surface, in such a way that the distance between the probe and the sample is constant. Electrochemical imaging of the sample surface is performed with the SECM electrode 26A, while the ion current to be measured with the SICM electrode 27 is used in a distance-control feedback signal, and form imaging of the sample surface is performed with the SICM electrode 27.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：为了提供扫描型电化学离子电导显微镜测量方法，扫描型电化学离子电导显微镜，其探针和探针测量方法，能够通过进行扫描获得形状成像和电化学成像，以这样的模式，使用探针使得一个探针和样品之间的距离恒定。解决方案：用于测量法拉第电流的SECM电极26A附着在通过磨削中空基材的一端而形成的端面上，以将其作为一端25b并切割端部。具有SICM电极27的探针21，该SICM电极27用于测量与填充到中空部25a中的电解质的端部表面中的开口25c <1S / s>相当的流出量的离子电流。 >，用于中空基材的中空部25a <1> 。探针21沿着样品表面被相对扫描，使得探针和样品之间的距离是恒定的。使用SECM电极26A进行样品表面的电化学成像，而在距离控制反馈信号中使用要用SICM电极27测量的离子电流，并且利用SICM电极27进行样品表面的成像版权所有（C）2011，JPO＆INPIT

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