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    • 6. 发明申请
    • SCANNING PROBE FOR DATA STORAGE AND MICROSCOPY
    • 数据存储和显微镜扫描探针
    • WO2003062742A1
    • 2003-07-31
    • PCT/IB2002/005292
    • 2002-12-11
    • INTERNATIONAL BUSINESS MACHINES CORPORATIONBINNIG, Gerd, K.DESPONT, MichelHÄBERLE, WalterLANTZ, Mark
    • BINNIG, Gerd, K.DESPONT, MichelHÄBERLE, WalterLANTZ, Mark
    • G01B7/34
    • G11B9/1418G01Q70/06G01Q80/00G11B9/14G11B9/1409G11B2005/0021
    • A cantilever device (30, 50, 70) for scanning a surface comprises a support (32, 52, 72), a tip platform (31, 51, 71) and a flexible arm arrangement (33, 53, 73). The tip platform (31, 51, 71) has a plurality of tips. These comprise at least two contact tips (34; 55a-55c; 74, 75) providing points of contact with a surface to be scanned, and a scanning tip (36; 55a, 55b; 75) for scanning the surface, where the scanning tip may be one of the two or more contact tips provided on the platform. The flexible arm arrangement (33, 53, 73) connects the tip platform to the support and allows orientation of the platform, via flexing of the arm arrangement, to bring the contact tips into contact with a surface to be scanned. The platform (31, 51, 71) is then at a well-defined orientation relative to the scan surface, and the scanning tip (36; 55a, 55b; 75) is appropriately positioned for the scanning operation. Scanning probe microscopes and data storage devices incorporating such cantilever devices are also provided.
    • 用于扫描表面的悬臂装置(30,50,70)包括支撑件(32,52,72),尖端平台(31,51,71)和柔性臂装置(33,53,73)。 尖端平台(31,51,71)具有多个尖端。 这些包括提供与待扫描表面的接触点的至少两个接触尖端(34; 55a-55c; 74,75)和用于扫描表面的扫描尖端(36; 55a,55b; 75) 提示可以是在平台上提供的两个或更多个接触提示之一。 柔性臂布置(33,53,73)将尖端平台连接到支撑件,并且允许平台的取向通过臂布置的弯曲,以使接触尖端与待扫描的表面接触。 然后,平台(31,51,71)相对于扫描表面处于相当明确的方向,并且扫描尖端(36; 55a,55b; 75)被适当地定位用于扫描操作。 还提供了包括这种悬臂装置的扫描探针显微镜和数据存储装置。
    • 10. 发明申请
    • HIGH-SPEED SCANNING PROBE MICROSCOPE
    • 高速扫描探针显微镜
    • WO2010086759A1
    • 2010-08-05
    • PCT/IB2010/050186
    • 2010-01-15
    • INTERNATIONAL BUSINESS MACHINES CORPORATIONBHASKARAN, HarishDESPONT, MichelSEBASTIAN, Abu
    • BHASKARAN, HarishDESPONT, MichelSEBASTIAN, Abu
    • G01Q60/16
    • G01Q60/16
    • The invention is directed to a probe for scanning probe microscopy. The probe 20 comprises a tunnel-current conducting part 30 and a tunnel-current insulating part 40. The said parts are configured such that the insulating part determines a minimal distance between the conducting part 30 and the sample surface. The invention may further concern a scanning probe microscope having such a probe, and a corresponding scanning probe microscopy method. Since the distance to the sample surface 100 is actually determined by the insulating part 40, controlling the vertical position of the probe 20 relative to the sample surface is easily and rapidly achieved. The configuration of the parts allows for a fast scan of the sample surface, whereby high-speed imaging can be achieved. Further, embodiments allow for topographical variations to be accurately captured through tunneling effect.
    • 本发明涉及用于扫描探针显微镜的探针。 探针20包括隧道电流传导部分30和隧道电流绝缘部分40.所述部分被构造成使得绝缘部分确定导电部分30和样品表面之间的最小距离。 本发明还可以涉及具有这种探针的扫描探针显微镜和相应的扫描探针显微镜方法。 由于到达样品表面100的距离实际上由绝缘部件40确定,因此容易且快速地实现了探针20相对于样品表面的垂直位置的控制。 部件的构造允许对样品表面进行快速扫描,由此可以实现高速成像。 此外,实施例允许通过隧道效应准确地捕获地形变化。