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    • 6. 发明授权
    • Output circuit of semiconductor apparatus having two different types of decoupling capacitors
    • 具有两种不同类型的去耦电容器的半导体装置的输出电路
    • US08405454B2
    • 2013-03-26
    • US12843985
    • 2010-07-27
    • Boo Ho JungJun Ho LeeHyun Seok KimYang Hee Kim
    • Boo Ho JungJun Ho LeeHyun Seok KimYang Hee Kim
    • H01L25/00
    • H01L25/00H01L2924/0002H01L2924/00
    • An output circuit of a semiconductor apparatus having two different types of decoupling capacitors is presented. The output circuit includes a first pad, a second pad, a main output unit and a decoupling capacitor region. The first and second pads are configured to respectively provide a power supply voltage and a ground voltage. The main output unit is coupled to the first and second pads. One end of the decoupling capacitor region is coupled to the first pad and the other end is coupled to the second pad. The decoupling capacitor region includes a first decoupling capacitor region spaced apart from a portion of the main output unit by a first distance, and a second decoupling capacitor region spaced apart from the main output unit by a second distance which is greater than the first distance.
    • 提出了具有两种不同类型的去耦电容器的半导体装置的输出电路。 输出电路包括第一焊盘,第二焊盘,主输出单元和去耦电容器区域。 第一和第二焊盘被配置为分别提供电源电压和接地电压。 主输出单元耦合到第一和第二焊盘。 去耦电容器区域的一端耦合到第一焊盘,另一端耦合到第二焊盘。 去耦电容器区域包括与主输出单元的一部分间隔开第一距离的第一去耦电容器区域和与主输出单元间隔开大于第一距离的第二距离的第二去耦电容器区域。
    • 7. 发明授权
    • Non-volatile memory, method of operating the same, memory system including the same, and method of operating the system
    • 非易失性存储器,操作方法,包括相同的存储器系统以及操作系统的方法
    • US08885409B2
    • 2014-11-11
    • US13618604
    • 2012-09-14
    • Sang Hoon LeeHyun Seok KimSung-Hwan BaeJong-Nam BaekJae Yong Jeong
    • Sang Hoon LeeHyun Seok KimSung-Hwan BaeJong-Nam BaekJae Yong Jeong
    • G11C16/04
    • G11C16/04G11C16/0483G11C16/06G11C16/26G11C29/00
    • A nonvolatile memory device includes an array of nonvolatile memory cells and a plurality of page buffers configured to receive a plurality of pages of data read from the same page in the array using different read voltage conditions. A control circuit is provided, which is electrically coupled to the plurality of page buffers. The control circuit is configured to perform a test operation by driving the plurality of page buffers with control signals that cause generation within the nonvolatile memory device of a string of XOR data bits, which are derived from a comparison of at least two of the multiple pages of data read from the same page of nonvolatile memory cells using the different read voltage conditions. An input/output device is provided, which is configured to output test data derived from the string of XOR data bits to another device located external to the nonvolatile memory device.
    • 非易失性存储器件包括非易失性存储器单元的阵列和多个页缓冲器,其被配置为使用不同的读取电压条件从阵列中的同一页面接收多页数据。 提供了一种控制电路,其电耦合到多个页面缓冲器。 控制电路被配置为通过用控制信号驱动多个页面缓冲器来执行测试操作,该控制信号导致非易失性存储器件内的异或数据位串的产生,这是从多个页面中的至少两个的比较导出的 使用不同的读取电压条件从同一页的非易失性存储单元读取数据。 提供了一种输入/输出设备,其被配置为将从XOR数据位串导出的测试数据输出到位于非易失性存储器件外部的另一个设备。