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    • 7. 发明申请
    • THIN FILM TRANSISTOR AND METHOD OF FABRICATING THE SAME
    • 薄膜晶体管及其制造方法
    • US20070108483A1
    • 2007-05-17
    • US11557360
    • 2006-11-07
    • Hyuk LIMTakashi NOGUCHIJong-man KIMKyung-bae PARKHuaxiang YIN
    • Hyuk LIMTakashi NOGUCHIJong-man KIMKyung-bae PARKHuaxiang YIN
    • H01L29/76
    • H01L29/78621H01L29/66757
    • A thin film transistor having an offset or a lightly doped drain (LDD) structure by self alignment and a method of fabricating the same comprises a substrate, a silicon layer disposed on the substrate and including a channel region, a source region and a drain region at both sides of the channel region, and offset regions, each offset regions disposed between the channel region and one of the source and drain regions at both sides of the channel region, a gate insulating layer covering the channel region and the offset regions disposed at both sides of the channel region excluding the source and drain regions, and a gate layer formed on the channel region excluding the offset regions. The thin film transistor has the structure in which an offset or LDD is obtained without an additional mask process.
    • 具有通过自对准的偏移或轻掺杂漏极(LDD)结构的薄膜晶体管及其制造方法包括:衬底,设置在衬底上的硅层,并且包括沟道区,源极区和漏极区 在通道区域的两侧和偏移区域,每个偏移区域设置在沟道区域和沟道区域两侧的源极和漏极区域之一之间,覆盖沟道区域的栅极绝缘层和设置在沟道区域的偏移区域 除了源极和漏极区域之外的沟道区域的两侧,以及形成在除偏移区域之外的沟道区域上的栅极层。 薄膜晶体管具有在没有附加掩模处理的情况下获得偏移或LDD的结构。