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    • 3. 发明授权
    • Purification of zein from corn gluten meal
    • 玉米蛋白从玉米麸粉中纯化
    • US5580959A
    • 1996-12-03
    • US402320
    • 1995-03-10
    • Richard B. CookFrank M. MalleeMark L. Shulman
    • Richard B. CookFrank M. MalleeMark L. Shulman
    • A23J1/12A23J3/18C07K1/14C07K14/415C07K14/425
    • A23J3/18C07K14/425
    • This invention pertains to methods for extracting and purifying zein, zein bodies, glutelins or destarched corn gluten from corn gluten meal by efficiently removing and recovering food grade pigments and starch hydrolysates, while discarding unwanted fractions. Corn gluten is subjected to the combination of enzymatic starch hydrolysis, alkaline treatment, alcohol washing and alcohol extraction to produce a substantially starch-free, deflavored and decolored zein which is suitable for use in foods and pharmaceuticals. An advantage of the process described herein is its use of food grade alcohol(s) to deflavor, decolorize and extract the zein from corn gluten meal. Purified zein and zein bodies have improved utility and functionality in a variety of existing and emerging food applications. Alternate products such as deflavored, decolored and destarched corn gluten, zein bodies or glutelins are also obtained by the methods of this invention and are useful as vegetable protein supplements. By-products of the invention such as yellow food pigments and starch hydrolysates can be further purified and/or used directly in various foods.
    • 本发明涉及通过有效地去除和回收食品级颜料和淀粉水解物,从而从玉米面筋粉中提取和提纯玉米蛋白,玉米醇溶蛋白,谷蛋白或脱谷蛋白玉米面筋的方法,同时丢弃不需要的部分。 将玉米麸质进行酶淀粉水解,碱处理,醇洗和醇提取的组合,以产生适用于食品和药物的基本上无淀粉,脱色和脱色的玉米醇溶蛋白。 本文描述的方法的优点是其使用食品级酒精来从玉米面筋粉中脱脂,脱色并提取玉米醇溶蛋白。 纯化的玉米蛋白和玉米醇溶蛋白体在各种现有和新兴食品应用中具有改进的效用和功能。 替代产品如脱色,脱色和破坏的玉米面筋,玉米醇溶蛋白体或谷蛋白也通过本发明的方法获得,并且可用作植物蛋白质补充剂。 本发明的副产物如黄色食品颜料和淀粉水解产物可以进一步纯化和/或直接用于各种食品中。
    • 7. 发明授权
    • Clocking mechanism for delay, short path and stuck-at testing
    • 延时,短路和卡住测试的时钟机制
    • US5617426A
    • 1997-04-01
    • US393511
    • 1995-02-21
    • Bernd K. F. KoenemannWilliam H. McAnneyMark L. Shulman
    • Bernd K. F. KoenemannWilliam H. McAnneyMark L. Shulman
    • G01R31/28G01R31/3185G06F11/22H04B17/00
    • G01R31/31858G01R31/318552
    • In a level sensitive scan design (LSSD) circuit embodiment for testing the behavior of logic circuits, a mechanism is provided for generating a skewed load of data into a set of shift register scan string latches. The nature of the input scan string assures that a certain number of 0 to 1 or 1 to 0 transitions occurs as an input to the block of logic being tested. Furthermore, a mechanism for delaying by one system clock cycle time the capture of information from the logic block in a second shift register scan string provides a mechanism for testing for the occurrence of short paths and long paths while preserving testability for stuck-at faults. Furthermore, all of these advantages are achieved without impacting the traditional stuck-fault test capabilities of the level sensitive scan design methodology.
    • 在用于测试逻辑电路的行为的电平敏感扫描设计(LSSD)电路实施例中,提供了一种机制,用于将数据的偏移负载产生到一组移位寄存器扫描串锁存器中。 输入扫描字符串的性质确保了一定数量的0到1或1到0的转换作为被测试逻辑块的输入发生。 此外,通过一个系统时钟周期时间延迟在第二移位寄存器扫描串中从逻辑块捕获信息的机制提供了一种用于测试短路径和长路径的发生的机制,同时保持卡住故障的可测试性。 此外,所有这些优点都是在不影响级别敏感扫描设计方法的传统卡死故障测试功能的情况下实现的。