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    • 4. 发明授权
    • Devices and methods for LED life test
    • LED寿命测试的设备和方法
    • US07888942B2
    • 2011-02-15
    • US12275341
    • 2008-11-21
    • Chiu-Ling ChenSheng-Pan HuangFei-Chang Hwang
    • Chiu-Ling ChenSheng-Pan HuangFei-Chang Hwang
    • G01R31/00
    • G01R31/2642G01R31/2635
    • A life test device comprises an oven, a current source, a voltage meter, a control module, and a process module. A light-emitting diode (LED) is disposed in the oven. The temperature of the oven is gradually changed in a first period and remains at a set temperature in a second period. The current source provides a first current and a second current to the LED. The voltage meter measures forward voltages of the LED. The control module controls the current source to output the first or second current to the LED and controls the voltage meter to measure the forward voltages of the LED. The process module calculates a junction temperature of the LED according to the forward voltages and a variation relationship formula between the forward voltages and the temperature of the oven.
    • 寿命测试装置包括烤箱,电流源,电压表,控制模块和处理模块。 发光二极管(LED)设置在烤箱中。 烘箱的温度在第一时间段内逐渐变化并且在第二时间段内保持在设定温度。 电流源向LED提供第一电流和第二电流。 电压表测量LED的正向电压。 控制模块控制电流源将第一或第二电流输出到LED,并控制电压表来测量LED的正向电压。 处理模块根据正向电压和正向电压与烘箱温度之间的变化关系式计算LED的结温。
    • 5. 发明申请
    • Devices And Methods For LED Life Test
    • LED寿命测试的设备和方法
    • US20100327872A1
    • 2010-12-30
    • US12275341
    • 2008-11-21
    • Chiu-Ling ChenSheng-Pan HuangFei-Chang Hwang
    • Chiu-Ling ChenSheng-Pan HuangFei-Chang Hwang
    • G01R31/26
    • G01R31/2642G01R31/2635
    • A life test device comprises an oven, a current source, a voltage meter, a control module, and a process module. A light-emitting diode (LED) is disposed in the oven. The temperature of the oven is gradually changed in a first period and remains at a set temperature in a second period. The current source provides a first current and a second current to the LED. The voltage meter measures forward voltages of the LED. The control module controls the current source to output the first or second current to the LED and controls the voltage meter to measure the forward voltages of the LED. The process module calculates a junction temperature of the LED according to the forward voltages and a variation relationship formula between the forward voltages and the temperature of the oven.
    • 寿命测试装置包括烤箱,电流源,电压表,控制模块和处理模块。 发光二极管(LED)设置在烤箱中。 烘箱的温度在第一时间段内逐渐变化并且在第二时间段内保持在设定温度。 电流源向LED提供第一电流和第二电流。 电压表测量LED的正向电压。 控制模块控制电流源将第一或第二电流输出到LED,并控制电压表来测量LED的正向电压。 处理模块根据正向电压和正向电压与烘箱温度之间的变化关系式计算LED的结温。