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1. 发明授权

US08685820B2 Multiple gate dielectric structures and methods of forming the same 有权
标题翻译：多栅电介质结构及其形成方法
公开(公告)号：US08685820B2
公开(公告)日：2014-04-01
申请号：US13207643
申请日：2011-08-11
申请人： Hsiao-Hui Tseng , Dun-Nian Yaung , Jen-Cheng Liu , Wen-I Hsu , Min-Feng Kao
发明人： Hsiao-Hui Tseng , Dun-Nian Yaung , Jen-Cheng Liu , Wen-I Hsu , Min-Feng Kao
IPC分类号： H01L21/336
CPC分类号： H01L27/14614 , H01L27/14689
摘要： The present disclosure provides for multiple gate dielectric semiconductor structures and methods of forming such structures. In one embodiment, a method of forming a semiconductor structure includes providing a substrate including a pixel array region, an input/output (I/O) region, and a core region. The method further includes forming a first gate dielectric layer over the pixel array region, forming a second gate dielectric layer over the I/O region, and forming a third gate dielectric layer over the core region, wherein the first gate dielectric layer, the second gate dielectric layer, and the third gate dielectric layer are each formed to be comprised of a different material and to have a different thickness.
摘要翻译：本公开提供了多栅极电介质半导体结构和形成这种结构的方法。在一个实施例中，形成半导体结构的方法包括提供包括像素阵列区域，输入/输出（I / O）区域和核心区域的衬底。该方法还包括在像素阵列区域上形成第一栅极电介质层，在I / O区域上形成第二栅极电介质层，以及在芯区域上形成第三栅极电介质层，其中第一栅极介电层，第二栅极电介质层栅极电介质层和第三栅极电介质层各自形成为由不同的材料构成并且具有不同的厚度。

2. 发明申请

US20130037890A1 MULTIPLE GATE DIELECTRIC STRUCTURES AND METHODS OF FORMING THE SAME 有权
标题翻译：多栅型电介质结构及其形成方法
公开(公告)号：US20130037890A1
公开(公告)日：2013-02-14
申请号：US13207643
申请日：2011-08-11
申请人： Hsiao-Hui Tseng , Dun-Nian Yaung , Jen-Cheng Liu , Wen-I Hsu , Min-Feng Kao
发明人： Hsiao-Hui Tseng , Dun-Nian Yaung , Jen-Cheng Liu , Wen-I Hsu , Min-Feng Kao
IPC分类号： H01L21/28 , H01L29/78
CPC分类号： H01L27/14614 , H01L27/14689
摘要： The present disclosure provides for multiple gate dielectric semiconductor structures and methods of forming such structures. In one embodiment, a method of forming a semiconductor structure includes providing a substrate including a pixel array region, an input/output (I/O) region, and a core region. The method further includes forming a first gate dielectric layer over the pixel array region, forming a second gate dielectric layer over the I/O region, and forming a third gate dielectric layer over the core region, wherein the first gate dielectric layer, the second gate dielectric layer, and the third gate dielectric layer are each formed to be comprised of a different material and to have a different thickness.
摘要翻译：本公开提供了多栅极电介质半导体结构和形成这种结构的方法。在一个实施例中，形成半导体结构的方法包括提供包括像素阵列区域，输入/输出（I / O）区域和核心区域的衬底。该方法还包括在像素阵列区域上形成第一栅极电介质层，在I / O区域上形成第二栅极电介质层，以及在芯区域上形成第三栅极电介质层，其中第一栅极介电层，第二栅极电介质层栅极电介质层和第三栅极电介质层各自形成为由不同的材料构成并且具有不同的厚度。

3. 发明授权

US09048162B2 CMOS image sensors and methods for forming the same 有权
标题翻译： CMOS图像传感器及其形成方法
公开(公告)号：US09048162B2
公开(公告)日：2015-06-02
申请号：US13615071
申请日：2012-09-13
申请人： Min-Feng Kao , Dun-Nian Yaung , Jen-Cheng Liu , Chun-Chieh Chuang , Hsiao-Hui Tseng , Tzu-Hsuan Hsu
发明人： Min-Feng Kao , Dun-Nian Yaung , Jen-Cheng Liu , Chun-Chieh Chuang , Hsiao-Hui Tseng , Tzu-Hsuan Hsu
IPC分类号： H01L31/02 , H01L27/146 , H01L31/18 , H01L31/103
CPC分类号： H01L31/18 , H01L27/1461 , H01L27/14621 , H01L27/14627 , H01L27/1464 , H01L27/14689 , H01L31/02 , H01L31/103 , H01L31/1804 , Y02E10/547 , Y02P70/521
摘要： A device includes a diode, which includes a first, a second, and a third doped region in a semiconductor substrate. The first doped region is of a first conductivity type, and has a first impurity concentration. The second doped region is of the first conductivity type, and has a second impurity concentration lower than the first impurity concentration. The second doped region encircles the first doped region. The third doped region is of a second conductivity type opposite the first conductivity type, wherein the third doped region overlaps a portion of the first doped region and a portion of the second doped region.
摘要翻译：一种器件包括二极管，其包括半导体衬底中的第一，第二和第三掺杂区域。第一掺杂区域是第一导电类型，并具有第一杂质浓度。第二掺杂区域是第一导电类型，并且具有低于第一杂质浓度的第二杂质浓度。第二掺杂区域包围第一掺杂区域。第三掺杂区域具有与第一导电类型相反的第二导电类型，其中第三掺杂区域与第一掺杂区域的一部分和第二掺杂区域的一部分重叠。

4. 发明申请

US20130320420A1 CMOS Image Sensors and Methods for Forming the Same 有权
标题翻译： CMOS图像传感器及其形成方法
公开(公告)号：US20130320420A1
公开(公告)日：2013-12-05
申请号：US13615071
申请日：2012-09-13
申请人： Min-Feng Kao , Dun-Nian Yaung , Jen-Cheng Liu , Chun-Chieh Chuang , Hsiao-Hui Tseng , Tzu-Hsuan Hsu
发明人： Min-Feng Kao , Dun-Nian Yaung , Jen-Cheng Liu , Chun-Chieh Chuang , Hsiao-Hui Tseng , Tzu-Hsuan Hsu
IPC分类号： H01L31/02 , H01L31/18
CPC分类号： H01L31/18 , H01L27/1461 , H01L27/14621 , H01L27/14627 , H01L27/1464 , H01L27/14689 , H01L31/02 , H01L31/103 , H01L31/1804 , Y02E10/547 , Y02P70/521
摘要： A device includes a diode, which includes a first, a second, and a third doped region in a semiconductor substrate. The first doped region is of a first conductivity type, and has a first impurity concentration. The second doped region is of the first conductivity type, and has a second impurity concentration lower than the first impurity concentration. The second doped region encircles the first doped region. The third doped region is of a second conductivity type opposite the first conductivity type, wherein the third doped region overlaps a portion of the first doped region and a portion of the second doped region.
摘要翻译：一种器件包括二极管，其包括半导体衬底中的第一，第二和第三掺杂区域。第一掺杂区域是第一导电类型，并具有第一杂质浓度。第二掺杂区域是第一导电类型，并且具有低于第一杂质浓度的第二杂质浓度。第二掺杂区域包围第一掺杂区域。第三掺杂区域具有与第一导电类型相反的第二导电类型，其中第三掺杂区域与第一掺杂区域的一部分和第二掺杂区域的一部分重叠。

5. 发明授权

US09177986B2 Isolation for semiconductor devices 有权
标题翻译：半导体器件隔离
公开(公告)号：US09177986B2
公开(公告)日：2015-11-03
申请号：US13598275
申请日：2012-08-29
申请人： Wen-I Hsu , Min-Feng Kao , Jen-Cheng Liu , Dun-Nian Yaung , Tzu-Hsuan Hsu , Wen-De Wang
发明人： Wen-I Hsu , Min-Feng Kao , Jen-Cheng Liu , Dun-Nian Yaung , Tzu-Hsuan Hsu , Wen-De Wang
IPC分类号： H01L29/00 , H01L27/146 , H01L29/06 , H01L21/762
CPC分类号： H01L27/14689 , H01L21/761 , H01L21/76237 , H01L27/1463 , H01L27/14643 , H01L29/0649
摘要： A system and method for isolating semiconductor devices is provided. An embodiment comprises an isolation region that is laterally removed from source/drain regions of semiconductor devices and has a dielectric material extending over the isolation implant between the source/drain regions. The isolation region may be formed by forming an opening through a layer over the substrate, depositing a dielectric material along the sidewalls of the opening, implanting ions into the substrate after the deposition, and filling the opening with another dielectric material.
摘要翻译：提供一种用于隔离半导体器件的系统和方法。一个实施例包括从半导体器件的源极/漏极区域侧向移除的隔离区域，并且具有在源极/漏极区域之间的隔离注入物上延伸的电介质材料。可以通过在衬底上形成通过层的开口形成隔离区域，沿着开口的侧壁沉积电介质材料，在沉积之后将离子注入到衬底中，并用另一种电介质材料填充该开口。

6. 发明申请

US20140061737A1 Isolation for Semiconductor Devices 有权
标题翻译：半导体器件隔离
公开(公告)号：US20140061737A1
公开(公告)日：2014-03-06
申请号：US13598275
申请日：2012-08-29
申请人： Wen-I Hsu , Min-Feng Kao , Jen-Cheng Liu , Dun-Nian Yaung , Tzu-Hsuan Hsu , Wen-De Wang
发明人： Wen-I Hsu , Min-Feng Kao , Jen-Cheng Liu , Dun-Nian Yaung , Tzu-Hsuan Hsu , Wen-De Wang
IPC分类号： H01L27/146 , H01L31/18 , H01L27/088
CPC分类号： H01L27/14689 , H01L21/761 , H01L21/76237 , H01L27/1463 , H01L27/14643 , H01L29/0649
摘要： A system and method for isolating semiconductor devices is provided. An embodiment comprises an isolation region that is laterally removed from source/drain regions of semiconductor devices and has a dielectric material extending over the isolation implant between the source/drain regions. The isolation region may be formed by forming an opening through a layer over the substrate, depositing a dielectric material along the sidewalls of the opening, implanting ions into the substrate after the deposition, and filling the opening with another dielectric material.
摘要翻译：提供一种用于隔离半导体器件的系统和方法。一个实施例包括从半导体器件的源极/漏极区域侧向移除的隔离区域，并且具有在源极/漏极区域之间的隔离注入物上延伸的介电材料。可以通过在衬底上形成通过层的开口形成隔离区域，沿着开口的侧壁沉积电介质材料，在沉积之后将离子注入到衬底中，并用另一种电介质材料填充该开口。

7. 发明授权

US08513587B2 Image sensor with anti-reflection layer and method of manufacturing the same 有权
标题翻译：具有防反射层的图像传感器及其制造方法
公开(公告)号：US08513587B2
公开(公告)日：2013-08-20
申请号：US13012067
申请日：2011-01-24
申请人： Tzu-Jui Wang , Hsiao-Hui Tseng , Wei-Cheng Hsu , Dun-Nian Yaung , Jen-Cheng Liu
发明人： Tzu-Jui Wang , Hsiao-Hui Tseng , Wei-Cheng Hsu , Dun-Nian Yaung , Jen-Cheng Liu
IPC分类号： H01L27/00 , H01L31/00 , H01L29/80 , H01L21/02
CPC分类号： H01L27/1464 , H01L27/1461 , H01L27/14629
摘要： An image sensor the image sensor comprising an absorption layer disposed on a silicon substrate, the absorption layer having at least one of SiGe or Ge, and an antireflection layer disposed directly thereon.
摘要翻译：图像传感器包括设置在硅衬底上的吸收层，所述吸收层具有SiGe或Ge中的至少一种，以及直接设置在其上的抗反射层。

8. 发明授权

US09165970B2 Back side illuminated image sensor having isolated bonding pads 有权
标题翻译：具有隔离接合垫的背面照明图像传感器
公开(公告)号：US09165970B2
公开(公告)日：2015-10-20
申请号：US13028471
申请日：2011-02-16
申请人： Shuang-Ji Tsai , Dun-Nian Yaung , Jen-Cheng Liu , Wen-De Wang , Hsiao-Hui Tseng
发明人： Shuang-Ji Tsai , Dun-Nian Yaung , Jen-Cheng Liu , Wen-De Wang , Hsiao-Hui Tseng
IPC分类号： H01L27/146
CPC分类号： H01L27/14687 , H01L23/481 , H01L23/525 , H01L24/83 , H01L27/14623 , H01L27/14632 , H01L27/14636 , H01L27/14638 , H01L27/1464 , H01L27/14645 , H01L27/14683 , H01L27/14689
摘要： Provided is an image sensor device. The image sensor device includes having a front side, a back side, and a sidewall connecting the front and back sides. The image sensor device includes a plurality of radiation-sensing regions disposed in the substrate. Each of the radiation-sensing regions is operable to sense radiation projected toward the radiation-sensing region through the back side. The image sensor device includes an interconnect structure that is coupled to the front side of the substrate. The interconnect structure includes a plurality of interconnect layers and extends beyond the sidewall of the substrate. The image sensor device includes a bonding pad that is spaced apart from the sidewall of the substrate. The bonding pad is electrically coupled to one of the interconnect layers of the interconnect structure.
摘要翻译：提供了一种图像传感器装置。图像传感器装置包括具有连接前侧和后侧的前侧，后侧和侧壁。图像传感器装置包括设置在基板中的多个辐射感测区域。每个辐射感测区域可操作以感测通过后侧朝向辐射感测区域投射的辐射。图像传感器装置包括耦合到基板的前侧的互连结构。互连结构包括多个互连层并且延伸超过衬底的侧壁。图像传感器装置包括与衬底的侧壁间隔开的接合焊盘。接合焊盘电连接到互连结构的互连层之一。

9. 发明申请

US20130341692A1 Novel [N] Profile in Si-Ox Interface for CMOS Image Sensor Performance Improvement 审中-公开
标题翻译：用于CMOS图像传感器性能改进的Si-Ox接口中的新型[N]配置文件
公开(公告)号：US20130341692A1
公开(公告)日：2013-12-26
申请号：US13601033
申请日：2012-08-31
申请人： Hsiao-Hui Tseng , Jen-Cheng Liu , Dun-Nian Yaung , Tzu-Hsuan Hsu
发明人： Hsiao-Hui Tseng , Jen-Cheng Liu , Dun-Nian Yaung , Tzu-Hsuan Hsu
IPC分类号： H01L27/146 , H01L21/8238
CPC分类号： H01L27/14603 , H01L27/1463 , H01L27/14643 , H01L29/513 , H01L29/518
摘要： A semiconductor device including first and second isolation regions supported by a substrate, a first array well supported by the first isolation region, the first array well having a first field implant layer embedded therein, the first field implant layer surrounding a first shallow trench isolation region, a second array well supported by the second isolation region, the second array well supporting a doped region and a drain and having a second field implant layer embedded therein, the second field implant layer surrounding a second shallow trench isolation region, a stack of photodiodes disposed in the substrate between the first and second isolation regions, and a gate oxide formed over an uppermost photodiode of the stack of the photodiodes, the gate oxide and a silicon of the uppermost photodiode forming an interface, a nitrogen concentration at the interface offset from a peak nitrogen concentration.
摘要翻译：一种半导体器件，包括由衬底支撑的第一和第二隔离区域，由第一隔离区域良好地支撑的第一阵列，第一阵列阱具有嵌入其中的第一场注入层，第一场注入层围绕第一浅沟槽隔离区域，由第二隔离区域良好支撑的第二阵列，第二阵列阱支撑掺杂区域和漏极，并且具有嵌入其中的第二场注入层，第二场注入层围绕第二浅沟槽隔离区域，一叠光电二极管设置在第一和第二隔离区域之间的衬底中，以及形成在光电二极管的堆叠的最上面的光电二极管上的栅极氧化物，栅极氧化物和最上面的光电二极管的硅形成界面，界面处的氮浓度偏离氮浓度峰值。

10. 发明申请

US20120205769A1 BACK SIDE ILLUMINATED IMAGE SENSOR WITH REDUCED SIDEWALL-INDUCED LEAKAGE 有权
标题翻译：具有降低的侧壁感应泄漏的背面照明图像传感器
公开(公告)号：US20120205769A1
公开(公告)日：2012-08-16
申请号：US13028471
申请日：2011-02-16
申请人： Shuang-Ji Tsai , Dun-Nian Yaung , Jen-Cheng Liu , Wen-De Wang , Hsiao-Hui Tseng
发明人： Shuang-Ji Tsai , Dun-Nian Yaung , Jen-Cheng Liu , Wen-De Wang , Hsiao-Hui Tseng
IPC分类号： H01L31/02 , H01L31/18
CPC分类号： H01L27/14687 , H01L23/481 , H01L23/525 , H01L24/83 , H01L27/14623 , H01L27/14632 , H01L27/14636 , H01L27/14638 , H01L27/1464 , H01L27/14645 , H01L27/14683 , H01L27/14689
摘要： Provided is an image sensor device. The image sensor device includes having a front side, a back side, and a sidewall connecting the front and back sides. The image sensor device includes a plurality of radiation-sensing regions disposed in the substrate. Each of the radiation-sensing regions is operable to sense radiation projected toward the radiation-sensing region through the back side. The image sensor device includes an interconnect structure that is coupled to the front side of the substrate. The interconnect structure includes a plurality of interconnect layers and extends beyond the sidewall of the substrate. The image sensor device includes a bonding pad that is spaced apart from the sidewall of the substrate. The bonding pad is electrically coupled to one of the interconnect layers of the interconnect structure.
摘要翻译：提供了一种图像传感器装置。图像传感器装置包括具有连接前侧和后侧的前侧，后侧和侧壁。图像传感器装置包括设置在基板中的多个辐射感测区域。每个辐射感测区域可操作以感测通过后侧朝向辐射感测区域投射的辐射。图像传感器装置包括耦合到基板的前侧的互连结构。互连结构包括多个互连层并且延伸超过衬底的侧壁。图像传感器装置包括与衬底的侧壁间隔开的接合焊盘。接合焊盘电连接到互连结构的互连层之一。

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