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1. 发明专利

JP2011080967A Particle analyzer 审中-公开
标题翻译：颗粒分析仪
公开(公告)号：JP2011080967A
公开(公告)日：2011-04-21
申请号：JP2009235744
申请日：2009-10-09
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , NAKANO YUKI , NAKAJIMA GOSUKE
IPC分类号： G01N15/02
摘要： PROBLEM TO BE SOLVED: To substantially improve users' usability of a particle analyzer which requires a large number of settings of measurement conditions, by facilitating input of settings and changes in the measurement conditions. SOLUTION: A condition setting screen W1 is divided into at least two regions A1 and A2; a plurality of condition input pages P1 for inputting the conditions are switchably displayed on one region A1, and a condition list page P2 for displaying a list of items of each inputted condition and its representative content is displayed on the other region A2; and the condition list page P2 is displayed on the same screen W1 at all times, while the condition input page P1 is shown on a display. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：通过促进设置的输入和测量条件的变化，大大提高了需要大量测量条件设置的粒子分析仪的用户的可用性。解决方案：条件设置屏幕W1被划分为至少两个区域A1和A2; 用于输入条件的多个条件输入页P1可切换地显示在一个区域A1上，并且在另一区域A2上显示用于显示每个输入条件的项目列表的条件列表页P2及其代表内容; 并且条件列表页P2始终显示在同一屏幕W1上，而条件输入页P1被显示在显示器上。版权所有（C）2011，JPO＆INPIT

2. 发明专利

JP2006058182A Method of forming sample liquid 有权
标题翻译：形成样品液的方法
公开(公告)号：JP2006058182A
公开(公告)日：2006-03-02
申请号：JP2004241507
申请日：2004-08-20
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： DAIDOJI HIDEHIRO , TANAKA SATORU , ISHIHARA SATOKO
IPC分类号： G01N31/00
摘要： PROBLEM TO BE SOLVED: To provide a method for forming a sample liquid for analyzing halogen elements, capable of analyzing the halogen elements contained in a solid sample, using the same sample liquid as other elements.
SOLUTION: A solid plastic material 1 to be analyzed is put in a container 2 housing nitric acid, to which silver ions are added (a) and heated by a heater 3 to obtain a decomposition liquid 4, wherein the plastic material 1 is made to decompose (b). All of the chlorine atoms contained in the plastic material 1 are collected as a precipitate 5 of silver chloride, without diffusing as gas (c). Aqueous ammonia is added to the decomposition liquid 4 to make silver chloride dissolve, and a solution 6, in which the chloride ions are liberated (d), is obtained. The solution 6 obtained is used as a sample liquid, and chlorine is analyzed using an ICP emission analyzer. The analysis of another element can be performed together, with respect to the same solution 6 (sample liquid).
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种形成用于分析卤素元素的样品液体的方法，其能够使用与其它元件相同的样品液体分析固体样品中所含的卤素元素。解决方案：将待分析的固体塑料材料1放入容纳硝酸的容器2中，加入银离子（a）并通过加热器3加热以获得分解液体4，其中塑料材料1 被分解（b）。包含在塑料材料1中的所有氯原子作为氯化银的沉淀物5被收集，而不作为气体（c）扩散。向分解液4中加入氨水使氯化银溶解，得到释放出氯离子的溶液（d）。将所得溶液6用作样品液体，并使用ICP发射分析仪分析氯。对于相同的溶液6（样品液体），可以一起进行另一元素的分析。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2011075537A Cell and instrument for measuring zeta potential 有权
标题翻译：用于测量ZETA电位的电池和仪器
公开(公告)号：JP2011075537A
公开(公告)日：2011-04-14
申请号：JP2009284978
申请日：2009-12-16
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , NAGURA MAKOTO , WATABE HITOSHI , SHIODA TAKESHI
IPC分类号： G01N27/26
摘要： PROBLEM TO BE SOLVED: To precisely measure a flow of particles by a cataphoresis by reducing an electroosmosis flow as much as possible. SOLUTION: A zeta potential measurement cell includes: a storage space S1 nearly in a columnar shape for storing a liquid sample; a cell body 21 including a sample introduction passage 201 which is open to a side peripheral face of the storage space S1 and introduces the liquid sample from the outside to the storage space S1; a pair of application electrodes 22 including an electrode surface 22A for forming a nearly entire surface of an opposing axial surface of the storage space S1; and a light introduction part 23 for introducing light L into the storage space S1 and a light leading part 24 for leading light S through the storage space S1 to the outside. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：通过尽可能减少电渗流精确地测量通过电泳的颗粒的流动。解决方案：ζ电位测量池包括：几乎为柱状的储存空间S1，用于储存液体样品; 电池体21，其具有与存储空间S1的侧面开口的导入通路201，并将液体试样从外部导入到收容空间S1; 一对施加电极22，包括用于形成存储空间S1的相对的轴向表面的几乎整个表面的电极表面22A; 以及用于将光L引入存储空间S1的光引入部23和通过存储空间S1将光引导到外部的光引导部24。版权所有（C）2011，JPO＆INPIT

4. 发明专利

JP2011053002A Particle measuring instrument using scattered light 有权
标题翻译：颗粒测量仪器使用散射光
公开(公告)号：JP2011053002A
公开(公告)日：2011-03-17
申请号：JP2009200045
申请日：2009-08-31
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： UMEZAWA MAKOTO , TANAKA SATORU
IPC分类号： G01N15/14 , G01N15/02
摘要： PROBLEM TO BE SOLVED: To provide a particle measuring instrument using scattered light having an excellent measuring accuracy for various particle physical properties such as zeta potential. SOLUTION: The particle measuring instrument includes a cell 2 for storing a sample solution in which particles are dispersed in a dispersant, a light source 3 for irradiating light to the particles in the cell, and a light receiving part 42 for receiving the scattered light emitted from the particles which are irradiated by the light from the light source 3. The particle measuring instrument further includes a refractive index data receiving part 61 for receiving dispersant refractive index data which represent the refractive index of the dispersant, and a scattered angle data calculation part 621 for calculating scattered angle data which represent the scattered angle of the particle by the scattered light based on the dispersant refractive index data. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种使用具有优异的测量精度的散射光的粒子测量仪器，用于各种粒子物理性质如ζ电位。＆lt; P＆gt;解决方案：粒子测量仪器包括用于存储分散在其中的颗粒分散在其中的样品溶液的单元2，用于向单元中的颗粒照射光的光源3和用于接收由来自光源3的光照射的颗粒发射的散射光。粒子测量仪器还包括折射率数据接收部分61，用于接收表示分散剂的折射率的分散剂折射率数据和散射角数据计算部621，用于基于分散剂折射率数据计算表示散射光的粒子的散射角的散射角数据。版权所有（C）2011，JPO＆INPIT

5. 发明专利

JP2008039607A Quantitative analyzing method, quantitative analyzer and program 有权
标题翻译：量化分析方法，量化分析仪和程序
公开(公告)号：JP2008039607A
公开(公告)日：2008-02-21
申请号：JP2006214826
申请日：2006-08-07
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , OKAYAMA JUNJI , BANDO ATSUSHI , HIRANO AKIHIRO , UCHIHARA HIROSHI
IPC分类号： G01N31/00 , G01N31/12
摘要： PROBLEM TO BE SOLVED: To perform a quantitative analysis using an HF furnace type carbon densitometor and to sharply enhance the treatment speed of quantitative analysis even if both of an ER furnace carbon densitometor and the HF furnace type carbon densitometor are used.
SOLUTION: The mass of silicon carbide containing free carbon is measured before heating and the silicon carbide containing free carbon is heated at a predetermined temperature using a muffle furnace for a predetermined time. Thereafter, the masses of the silicon carbide after heating and the mass of silicon oxide are measured and both of silicon carbide and silicon oxide are succeedingly charged in an HF furnace 51 and combusted to measure the concentration of carbon after combustion. The content of free carbon is calculated by substituting masses before and after measurement and the concentration of carbon for a model formula led out on the basis the first reaction equation obtained in the case where silicon carbide containing free carbon is heated and the second reaction equation obtained in the case where silicon carbide and silicon oxide after heating are combusted.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：要解决的问题：使用HF炉式碳密度计进行定量分析，并且即使使用ER炉碳密度计和HF炉型碳密度计两者，也能够显着提高定量分析的处理速度。解决方案：在加热之前测量含有碳化硅的游离碳的质量，并使用马弗炉将预定时间的碳化硅含碳游离碳在预定温度下加热。此后，测量加热后的碳化硅质量和氧化硅质量，并将碳化硅和氧化硅两者在HF炉51中继续充电，并燃烧以测量燃烧后的碳浓度。游离碳的含量是通过在测量之前和之后取代质量计算的，并且基于在加热含碳化硅的游离碳的情况下获得的第一反应方程式得到的模型公式的碳浓度，并且获得第二反应方程在加热后的碳化硅和氧化硅燃烧的情况下。版权所有（C）2008，JPO＆INPIT

6. 发明专利

JP2007155547A Analysis start time determination method and icp light emission analyzer 审中-公开
标题翻译：分析开始时间确定方法和ICP发光分析仪
公开(公告)号：JP2007155547A
公开(公告)日：2007-06-21
申请号：JP2005352372
申请日：2005-12-06
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , DAIDOJI HIDEHIRO , ISHIHARA SATOKO
IPC分类号： G01N21/68
摘要： PROBLEM TO BE SOLVED: To provide an analysis start time determination method capable of clearly obtaining a stable time in sample replacement and accurately obtaining the analysis start time of a sample, and an ICP (Inductively Coupled Plasma) light emission analyzer using the method.
SOLUTION: The light emission intensity of a solvent introduced prior to the introduction of the sample is measured. After introducing the solvent, the introduction of the sample to be measured is started. When the light emission intensity of the solvent exceeds a predetermined value during measurement, a flag indicating that air is mixed before the sample introduction is set after the solvent introduction. When the flag is set, a start permission signal outputting means outputs a signal indicating the analysis start permission of the sample.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种分析开始时间确定方法，其能够清楚地获得样品更换中的稳定时间并准确地获得样品的分析开始时间，以及ICP（电感耦合等离子体）发光分析仪，其使用方法。
解决方案：测量引入样品之前引入的溶剂的发光强度。引入溶剂后，开始引入待测样品。在测定时，当溶剂的发光强度超过规定值时，在引入溶剂之后，设定试样导入前空气混合的标志。当标志被置位时，启动许可信号输出装置输出指示样品的分析开始许可的信号。版权所有（C）2007，JPO＆INPIT

7. 发明专利

JP2006064536A Sample introduction device for icp emission analysis 审中-公开
标题翻译：用于ICP排放分析的样品介绍装置
公开(公告)号：JP2006064536A
公开(公告)日：2006-03-09
申请号：JP2004247390
申请日：2004-08-26
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , DAIDOJI HIDEHIRO , ISHIHARA SATOKO
IPC分类号： G01N21/73 , G01N1/00 , G01N1/28
摘要： PROBLEM TO BE SOLVED: To provide a sample introduction device for ICP emission analysis capable of generating together an atomized sample and a vaporized sample with simple configuration by utilizing for generating a hydride, drain liquid staying in a drain gathering place of a chamber to which sample liquid is sprayed from a nebulizer.
SOLUTION: This sample introduction device has configuration wherein the sample liquid S is sprayed to the inside of a cyclone chamber 1 by the nebulizer 2, and an atomized component is delivered through a delivery port 11 on the ceiling of the cyclone chamber 1, and the drain liquid is recovered in the drain reservoir 13 on a bottom part. In the device, an intermediate reservoir 16 for retaining once the drain liquid is provided on the upper position of the drain reservoir 13 inside the cyclone chamber 1, and hydrochloric acid is introduced into the intermediate reservoir 16 by a hydrochloric acid introduction tube 17, and a hydrogenating agent is introduced into the drain reservoir 13 by a hydrogenating agent introduction tube 19, and the hydride is generated by reacting mixed liquid of the drain liquid flowing down from the intermediate reservoir 16 and the hydrochloric acid with the hydrogenating agent inside the drain reservoir 13.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供一种用于ICP发射分析的样品引入装置，其能够以简单的结构一起生成雾化样品和汽化样品，用于产生氢化物，停留在室的排水集合位置的排出液体向喷雾器喷射样品液体。解决方案：该样品引入装置具有其中通过喷雾器2将样品液体S喷射到旋风室1的内部并且雾化部件通过旋风室1的顶部上的输送口11输送并且在底部部分的排水容器13中回收排出液。在该装置中，用于在旋风室1内的排水容器13的上部位置设置排水液体的中间容器16，盐酸通过盐酸导入管17被导入到中间容器16内，通过氢化剂引入管19将氢化剂引入排水储存器13，并且通过将从中间储存器16向下流动的排出液体的混合液与盐酸与排水储存器内的氢化剂反应而产生氢化物 13.版权所有（C）2006，JPO＆NCIPI

8. 发明专利

JP2004212164A Icp analyzer 有权
公开(公告)号：JP2004212164A
公开(公告)日：2004-07-29
申请号：JP2002380934
申请日：2002-12-27
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , DAIDOJI HIDEHIRO , ISHIHARA SATOKO
IPC分类号： G01N27/62 , G01N21/73 , H05H1/30 , H05H1/42
摘要： PROBLEM TO BE SOLVED: To provide an ICP (inductively coupled plasma) analyzer capable of keeping constant the pressure in a spray chamber when analyzing a sample, and thereby improving the measurement sensitivity of analysis. SOLUTION: In this ICP analyzer, a solution sample 5 atomized by a nebulizer 2 is introduced into a plasma torch through a spray chamber 1, and the component in the solution sample 5 is analyzed. The analyzer is provided with a check valve 17 capable of adjusting the pressure in the spray chamber 1, under the side face of the spray chamber 1. COPYRIGHT: (C)2004,JPO&NCIPI

9. 发明专利

JP2013238625A Zeta potential measurement cell and zeta potential measurement device 有权
标题翻译： ZETA潜在测量电池和ZETA电位测量装置
公开(公告)号：JP2013238625A
公开(公告)日：2013-11-28
申请号：JP2013184003
申请日：2013-09-05
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU , NAGURA MAKOTO , WATABE HITOSHI , SHIODA TAKESHI
IPC分类号： G01N27/26
摘要： PROBLEM TO BE SOLVED: To precisely measure a flow of particles by electrophoresis by making an electroosmotic flow as small as possible.SOLUTION: A zeta potential measurement device includes a substantially columnar housing space S1 which houses a liquid sample, a cell body 21 having a sample introduction path 201 which is open on a side peripheral surface of the housing space S1 and introduces the liquid sample into the housing space S1 from outside, a pair of application electrodes 22 which each have an electrode surface 22A forming a substantially entire axially opposite surface of the housing space S1, and a light introduction part 23 which is formed on a side peripheral surface different from the axially opposite surface of the housing space S1 and introduces light L into the housing space S1, and a light guide-out part 24 which guides the light S having passed through the housing space S1 to the outside.
摘要翻译：要解决的问题：通过使电渗流尽可能小地电泳来精确地测量颗粒的流动。解决方案：ζ电位测量装置包括容纳液体样品的基本上柱状的容纳空间S1，具有液体样品的电池体21 样品引入路径201，其在容纳空间S1的侧面开口，并将液体样品从外部引入到容纳空间S1中，一对施加电极22，每个施加电极22具有形成基本上整个轴向相对表面的电极表面22A 容纳空间S1的光导入部23以及形成在与容纳空间S1的轴向相反的面不同的侧面的导光部23，将光L导入容纳空间S1，以及导光部24，将通过容纳空间S1的光S引导到外部。

10. 发明专利

JP2009210487A Spectral ellipsometer 审中-公开
标题翻译：光谱仪
公开(公告)号：JP2009210487A
公开(公告)日：2009-09-17
申请号：JP2008055585
申请日：2008-03-05
申请人： Horiba Ltd , 株式会社堀場製作所
发明人： TANAKA SATORU
IPC分类号： G01N21/21 , G01B11/06
摘要： PROBLEM TO BE SOLVED: To provide a spectral ellipsometer that determines accurate analysis results while eliminating dead time by minimizing repetition of calculation, and is easily used by an operator in an operation process for determining the solution.
SOLUTION: The degree of coincidence of each fitting data with measuring data is listed and displayed selectively, and the fitting data and measuring data corresponding to the selected degree of coincidence are comparably displayed on the same graph.
COPYRIGHT: (C)2009,JPO&INPIT

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