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1. 发明授权

US07106528B2 Method and apparatus for manufacturing large double-sided curved Fresnel lens 有权
标题翻译：制造大型双面弯曲菲涅耳透镜的方法和装置
公开(公告)号：US07106528B2
公开(公告)日：2006-09-12
申请号：US10496151
申请日：2002-12-03
申请人： Hitoshi Ohmori , Yoshihiro Uehara , Yoshiyuki Ueno , Yutaka Yamagata , Shinya Morita
发明人： Hitoshi Ohmori , Yoshihiro Uehara , Yoshiyuki Ueno , Yutaka Yamagata , Shinya Morita
IPC分类号： G02B3/08
CPC分类号： B29D11/00269 , B29C43/021 , B29C43/36 , B29C2043/5841 , B29L2011/005 , G02B3/08
摘要： A method of manufacturing a large double-sided curved Fresnel lens. The method includes a machining step (A) of performing ultra-precise three-dimensional machining on an upper mold and a lower mold to each have an upper transfer surface and a lower transfer surface engaging an upper surface and a lower surface of a thermoplastic resin plate, respectively. Further, the method includes a hot press molding step (B) of pressing the thermoplastic resin plate between the upper and lower molds by a predetermined pressure with the resin plate being held at a temperature higher than a softening temperature thereof and lower than a melting temperature thereof so that the thermoplastic resin plate is curved, and both lens surfaces for the double-sided Fresnel lens are respectively transferred to an upper surface and a lower surface of the thermoplastic resin plate.
摘要翻译：一种制造大型双面弯曲菲涅耳透镜的方法。该方法包括在上模和下模上执行超精密三维加工的加工步骤（A），每个加工步骤具有与热塑性树脂的上表面和下表面接合的上转印面和下转印面板。此外，该方法包括热塑性树脂板在上模和下模之间以预定压力挤压的热压成型步骤（B），树脂板保持在高于其软化温度的温度并低于熔融温度使得热塑性树脂板弯曲，并且双面菲涅尔透镜的两个透镜表面分别转印到热塑性树脂板的上表面和下表面。

2. 发明申请

US20050007682A1 METHOD AND APPARATUS FOR MANUFACTURING LARGE DOUBLE-SIDED CURVED FRESNEL LENS 有权
标题翻译：用于制造大型双面弯曲FRESNEL镜头的方法和装置
公开(公告)号：US20050007682A1
公开(公告)日：2005-01-13
申请号：US10496151
申请日：2002-12-03
申请人： Hitoshi Ohmori , Yoshihiro Uehara , Yoshiyuki Ueno , Yukata Yamagata , Shinya Morita
发明人： Hitoshi Ohmori , Yoshihiro Uehara , Yoshiyuki Ueno , Yukata Yamagata , Shinya Morita
IPC分类号： B29C43/02 , B29C43/36 , B29D11/00 , G02B3/08 , G02C5/02
CPC分类号： B29D11/00269 , B29C43/021 , B29C43/36 , B29C2043/5841 , B29L2011/005 , G02B3/08
摘要： A method of manufacturing a large double-sided curved Fresnel lens. The method includes a machining step (A) of performing ultra-precise three-dimensional machining on an upper mold and a lower mold to each have an upper transfer surface and a lower transfer surface engaging an upper surface and a lower surface of a thermoplastic resin plate, respectively. Further, the method includes a hot press molding step (B) of pressing the thermoplastic resin plate between the upper and lower molds by a predetermined pressure with the resin plate being held at a temperature higher than a softening temperature thereof and lower than a melting temperature thereof so that the thermoplastic resin plate is curved, and both lens surfaces for the double-sided Fresnel lens are respectively transferred to an upper surface and a lower surface of the thermoplastic resin plate.
摘要翻译：一种制造大型双面弯曲菲涅耳透镜的方法。该方法包括在上模和下模上执行超精密三维加工的加工步骤（A），每个加工步骤具有与热塑性树脂的上表面和下表面接合的上转印面和下转印面板。此外，该方法包括热塑性树脂板在上模和下模之间以预定压力挤压的热压成型步骤（B），树脂板保持在高于其软化温度的温度并低于熔融温度使得热塑性树脂板弯曲，并且双面菲涅尔透镜的两个透镜表面分别转印到热塑性树脂板的上表面和下表面。

3. 发明授权

US07685733B2 Micro force measurement device, micro force measurement method, and micro surface shape measurement probe 失效
标题翻译：微力测量装置，微力测量方法和微表面形状测量探头
公开(公告)号：US07685733B2
公开(公告)日：2010-03-30
申请号：US11566377
申请日：2006-12-04
申请人： Hitoshi Ohmori , Yutaka Watanabe , Shinya Morita , Yoshihiro Uehara , Weimin Lin , Kazutoshi Katahira
发明人： Hitoshi Ohmori , Yutaka Watanabe , Shinya Morita , Yoshihiro Uehara , Weimin Lin , Kazutoshi Katahira
IPC分类号： G01B7/00
CPC分类号： G01B7/012 , G01B3/008 , G01B5/012 , G01B11/007
摘要： There is disclosed a micro surface shape measurement probe including a probe shaft 4 having at a distant end thereof a probe member 2 for contacting an object 1 to be measured, a probe body 21 provided with support means for movably supporting the probe shaft 4 in a non-contact manner, a pressing device for pressing and moving the probe shaft 4 toward the object 1 to be measured, a piezoelectric sensor 8a incorporated in the probe body 21 so that a reactive force acts to a pressing force applied to the probe shaft by the pressing device, a load detecting device 8b to measure a load acting on the piezoelectric sensor, a control device 9 for adjusting the pressing force applied by the pressing device based on the load detected by the load detecting device, and a displacement amount measuring device for measuring a position of the probe member 2 in contact with the object 1 to be measured by the pressing force adjusted by the control device 9.
摘要翻译：公开了一种微型表面形状测量探针，其包括探针轴4，探针轴4的远端具有用于接触被测量物体1的探针构件2，探针体21，其设置有用于将探针轴4可移动地支撑在一起的支撑装置用于将探针轴4朝向要测量的物体1按压和移动的按压装置，结合在探针主体21中的压电传感器8a，使得反作用力作用于通过施加到探针轴的按压力按压装置，用于测量作用在压电传感器上的负载的负载检测装置8b，用于基于由负载检测装置检测到的负载来调节由加压装置施加的按压力的控制装置9和位移量测量装置用于通过由控制装置9调节的按压力来测量与被测量物体1接触的探针部件2的位置。

4. 发明申请

US20070126314A1 MICRO FORCE MEASUREMENT DEVICE, MICRO FORCE MEASUREMENT METHOD, AND MICRO SURFACE SHAPE MEASUREMENT PROBE 失效
标题翻译：微力测量装置，微力测量方法和微观表面形状测量探针
公开(公告)号：US20070126314A1
公开(公告)日：2007-06-07
申请号：US11566377
申请日：2006-12-04
申请人： Hitoshi Ohmori , Yutaka Watanabe , Shinya Morita , Yoshihiro Uehara , Weimin Lin , Kazutoshi Katahira
发明人： Hitoshi Ohmori , Yutaka Watanabe , Shinya Morita , Yoshihiro Uehara , Weimin Lin , Kazutoshi Katahira
IPC分类号： H01L41/00
CPC分类号： G01B7/012 , G01B3/008 , G01B5/012 , G01B11/007
摘要： There is disclosed a micro surface shape measurement probe including a probe shaft 4 having at a distant end thereof a probe member 2 for contacting an object 1 to be measured, a probe body 21 provided with support means for movably supporting the probe shaft 4 in a non-contact manner, a pressing device for pressing and moving the probe shaft 4 toward the object 1 to be measured, a piezoelectric sensor 8a incorporated in the probe body 21 so that a reactive force acts to a pressing force applied to the probe shaft by the pressing device, a load detecting device 8b to measure a load acting on the piezoelectric sensor, a control device 9 for adjusting the pressing force applied by the pressing device based on the load detected by the load detecting device, and a displacement amount measuring device for measuring a position of the probe member 2 in contact with the object 1 to be measured by the pressing force adjusted by the control device 9.
摘要翻译：公开了一种微型表面形状测量探针，其包括探针轴4，探针轴4的远端具有用于接触被测量物体1的探针构件2，探针体21，其设置有用于将探针轴4可移动地支撑在一起的支撑装置用于将探针轴4朝向待测量物体1按压并移动的按压装置，结合在探针体21中的压电传感器8，使得反作用力作用于施加到探针轴的压力通过按压装置，用于测量作用在压电传感器上的负载的负载检测装置8b，用于基于由负载检测装置检测到的负载来调整由加压装置施加的按压力的控制装置9和位移量测量装置，用于通过由控制装置9调节的按压力来测量与待测量物体1接触的探针构件2的位置。

5. 发明申请

US20080067704A1 Micro-Molding Equipment and Micro-Molding Method 审中-公开
标题翻译：微型成型设备和微型成型方法
公开(公告)号：US20080067704A1
公开(公告)日：2008-03-20
申请号：US11577214
申请日：2005-10-18
申请人： Hitoshi Ohmori , Yoshihiro Uehara , Weimin Lin , Hatsuichi Takeyasu , Masao Washio , Keizo Ikegami , Takeya Shoji , Tomoaki Ando , Yukihiro Shirataki
发明人： Hitoshi Ohmori , Yoshihiro Uehara , Weimin Lin , Hatsuichi Takeyasu , Masao Washio , Keizo Ikegami , Takeya Shoji , Tomoaki Ando , Yukihiro Shirataki
IPC分类号： B29C43/18
CPC分类号： B29C43/08 , B29B11/12 , B29C31/008 , B29C35/0266 , B29C35/16 , B29C43/021 , B29C43/34 , B29C59/022 , B29C2043/3433 , B29C2043/3444 , B29C2043/3618 , B29C2043/3634 , B29C2043/563 , B29C2059/023 , B29C2791/001 , B29K2105/251 , B29L2011/00 , B29L2011/0016
摘要： The micro-molding equipment contains a preform molding equipment 10 taking a single-cavity of a preform material 3 corresponding to a small precision optical component to be molded with a runnerless mold, and a precision compression molding equipment 40 for after molding the preform material 3 by primary compression molding in a vacuum state, cooling the preform material to a temperature near a glass transition point, and then re-softening a surface layer of the preform material and molding the same by secondary compression molding to transfer the small precision optical component thereto.
摘要翻译：微型成型设备包含预成型件成型设备10，该预制件成形设备10采用预成型材料3的单腔，对应于用无浇道模具成型的小型精密光学部件，以及用于模制预成型材料3之后的精密压缩成型设备40 通过在真空状态下的初级压缩成型，将预成型体材料冷却至接近玻璃化转变点的温度，然后对预成型体材料的表面层进行再软化，并通过二次压缩成型将其成型，将小型精密光学部件转印到。

6. 发明授权

US07758741B2 Method and apparatus for nozzle type ELID grinding 失效
标题翻译：喷嘴型ELID研磨方法和设备
公开(公告)号：US07758741B2
公开(公告)日：2010-07-20
申请号：US11297437
申请日：2005-12-09
申请人： Hitoshi Omori , Yoshihiro Uehara , Kazutoshi Katahira , Muneaki Asami , Norihide Mitsuishi , Souichi Ishikawa
发明人： Hitoshi Omori , Yoshihiro Uehara , Kazutoshi Katahira , Muneaki Asami , Norihide Mitsuishi , Souichi Ishikawa
IPC分类号： B23H3/00 , B23H5/00
CPC分类号： B24B57/02 , B23H5/08 , B24B53/001
摘要： There is here disclosed a nozzle type ELID grinding apparatus comprising a conductive grindstone 12 having a contact surface with a workpiece 1; and an ion supply nozzle 16 that supplies an electrolytic medium 2 containing hydroxyl ions (OH−) onto a surface of the conductive grindstone, the workpiece being ground while the surface of the grindstone is dressed by electrolysis or chemical reaction. Furthermore, the apparatus comprises a grindstone power source 14 for setting the conductive grindstone to be a positive potential (+).
摘要翻译：这里公开了一种喷嘴型ELID研磨装置，其包括具有与工件1的接触表面的导电磨石12; 以及离子供给喷嘴16，其将含有羟基离子（OH-）的电解介质2供给到导电性砂轮的表面上，在通过电解或化学反应对磨石的表面进行磨削的同时被研磨的工件。此外，该装置包括用于将导电磨石设置为正电位（+）的磨石电源14。

7. 发明申请

US20120301242A1 METHOD OF MANUFACTURING WORKPIECE 审中-公开
标题翻译：制造工作方法
公开(公告)号：US20120301242A1
公开(公告)日：2012-11-29
申请号：US13468153
申请日：2012-05-10
申请人： Yoshihiro Uehara
发明人： Yoshihiro Uehara
IPC分类号： B23Q11/00
CPC分类号： B24B1/00 , B24B13/00 , B24B19/08 , H01J2237/3114 , Y10T409/303752
摘要： Provided is a method of manufacturing a workpiece, which is capable of processing a workpiece in one processing with high precision. The method of manufacturing includes: changing a relative orientation of a unit removal shape and the workpiece; setting relative positions of a rotation shaft of a rotating polishing tool and the workpiece so as to have a relative orientation having a smallest difference among differences between a calculated removal shape and a target removal shape determined for each of the relative orientations; and processing the workpiece at a relative speed in accordance with a dwell-time distribution. The method of manufacturing is capable of processing the workpiece with little error in one scanning for processing, and hence it is possible to increase precision of a workpiece surface and improve processing efficiency by reducing the number of repetition of the processing.
摘要翻译：提供一种制造工件的方法，其能够以高精度在一个处理中处理工件。制造方法包括：改变单元去除形状和工件的相对取向; 设置旋转研磨工具的旋转轴和工件的相对位置，使得相对取向在针对每个相对取向确定的计算去除形状和目标去除形状之间的差异中具有最小差异; 并根据停留时间分布以相对速度处理工件。制造方法能够在一次扫描加工中几乎没有误差地加工工件，因此可以通过减少加工的重复次数来提高工件表面的精度并提高加工效率。

8. 发明申请

US20060124473A1 Method and apparatus for nozzle type ELID grinding 失效
标题翻译：喷嘴型ELID研磨方法和设备
公开(公告)号：US20060124473A1
公开(公告)日：2006-06-15
申请号：US11297437
申请日：2005-12-09
申请人： Hitoshi Omori , Yoshihiro Uehara , Kazutoshi Katahira , Muneaki Asami , Norihide Mitsuishi , Souichi Ishikawa
发明人： Hitoshi Omori , Yoshihiro Uehara , Kazutoshi Katahira , Muneaki Asami , Norihide Mitsuishi , Souichi Ishikawa
IPC分类号： B23H3/00
CPC分类号： B24B57/02 , B23H5/08 , B24B53/001
摘要： There is here disclosed a nozzle type ELID grinding apparatus comprising a conductive grindstone 12 having a contact surface with a workpiece 1; and an ion supply nozzle 16 that supplies an electrolytic medium 2 containing hydroxyl ions (OH−) onto a surface of the conductive grindstone, the workpiece being ground while the surface of the grindstone is dressed by electrolysis or chemical reaction. Furthermore, the apparatus comprises a grindstone power source 14 for setting the conductive grindstone to be a positive potential (+).
摘要翻译：这里公开了一种喷嘴型ELID研磨装置，其包括具有与工件1的接触表面的导电磨石12; 以及离子供给喷嘴16，其将含有羟基离子的电解介质2（OH - SUP）提供到导电性砂轮的表面上，在将磨石的表面通过电解或化学反应。此外，该装置包括用于将导电磨石设置为正电位（+）的磨石电源14。

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