专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2007225363A Magnetic sample inspection device 审中-公开
标题翻译：磁性样品检测装置
公开(公告)号：JP2007225363A
公开(公告)日：2007-09-06
申请号：JP2006044875
申请日：2006-02-22
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO , SHIMAKURA TOMOKAZU
IPC分类号： G01N23/225
CPC分类号： H01J37/29 , H01J2237/2067 , H01J2237/24557 , H01J2237/24564 , H01J2237/2538
摘要： PROBLEM TO BE SOLVED: To provide an inspection technique not developed heretofore, which allows a user to observing the shape of a magnetic domain formed on the surface of a magnetic sample at a high speed with high resolving power.
SOLUTION: This magnetic sample inspection device has: an SPLEEM observation part 200 equipped with a spin polarential election source, an irradiation optical system for irradiating the magnetic sample having a magnetic domain structure with the spin polarential electron beam emitted from the spin polarential electron source, a stage on which the magnetic sample is placed, and an image forming optical system for forming the electron beam reflected from the magnetic sample into an image to detect the same; cleaning means 208 and 216 for cleaning the surface of the magnetic sample to feed the magnetic sample to the SPLEEM observation part; and an image processing part for analyzing the image data obtained from the image forming optical system. The magnetic sample inspection device is characterized by inspecting the shape of the magnetic domain on the surface of the magnetic sample on the basis of the image data.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：为了提供迄今未开发的检查技术，其允许用户以高分辨率高速观察形成在磁性样品表面上的磁畴的形状。解决方案：该磁性样品检查装置具有：SPLEEM观察部200，配备有自旋主体选择源，照射光学系统，用于照射具有磁畴结构的磁性样品，其具有从旋转天体发射的自旋辐射电子束电子源，放置磁性样品的阶段，以及用于形成从磁性样品反射成电子束的图像形成光学系统进行图像检测的图像形成光学系统; 清洁装置208和216，用于清洁磁性样品的表面以将磁性样品供给到SPLEEM观察部分; 以及用于分析从图像形成光学系统获得的图像数据的图像处理部分。磁性样品检查装置的特征在于基于图像数据检查磁性样品表面上的磁畴的形状。版权所有（C）2007，JPO＆INPIT

2. 发明专利

JP2006127681A Magnetic recording medium and its manufacturing method, and magnetic recording and reproducing device 审中-公开
标题翻译：磁记录介质及其制造方法和磁记录和再现装置
公开(公告)号：JP2006127681A
公开(公告)日：2006-05-18
申请号：JP2004316616
申请日：2004-10-29
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TSUCHIYA HIROKO , MOCHIZUKI MASABUMI , TAKAHASHI TERUO , IKEGAME HIROSHI
IPC分类号： G11B5/667 , G11B5/64 , G11B5/65 , G11B5/738 , G11B5/84
CPC分类号： G11B5/855 , G11B5/667 , G11B5/7325 , G11B5/8404
摘要： PROBLEM TO BE SOLVED: To provide a discrete track type perpendicular magnetic recording medium which is excellent in crystal orientation and perpendicular magnetic anisotropy of a magnetic recording layer, obviates deterioration of the magnetic characteristics of the magnetic recording layer due to processing, is inexpensive in manufacturing cost, and does not require a complicated manufacturing process and to provide its manufacturing method. SOLUTION: The perpendicular magnetic recording medium has rugged pattern structure comprising projecting parts corresponding to the positions of data tracks 55 for recording magnetic information and recessed parts corresponding to the positions between the data tracks on the surface on a medium floating surface side of a soft magnetic backing layer 52 and is laminated with a base layer 53 and the magnetic recording layer 54 for crystal orientation control along the rugged pattern structure on the projecting parts and the recessed parts without omission. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了提供磁记录层的晶体取向和垂直磁各向异性优异的离散轨道型垂直磁记录介质，消除了由于处理而导致的磁记录层的磁特性的劣化，是制造成本低廉，并且不需要复杂的制造工艺并提供其制造方法。解决方案：垂直磁记录介质具有粗糙的图案结构，其包括对应于用于记录磁信息的数据轨道55的位置的突出部分和对应于在介质浮动表面侧的表面上的数据轨道之间的位置的凹部柔性磁性背衬层52，并且在突出部分和凹陷部分上沿着凹凸图案结构层叠有基底层53和用于晶体取向控制的磁记录层54，而没有遗漏。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2014127224A Analyzer 审中-公开
标题翻译：分析仪
公开(公告)号：JP2014127224A
公开(公告)日：2014-07-07
申请号：JP2012280491
申请日：2012-12-25
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO , HARADA KEN
IPC分类号： H01J37/256 , H01J37/05 , H01J37/252 , H01J37/285
摘要： PROBLEM TO BE SOLVED: To provide an apparatus for measuring magnetization distribution and composition distribution on the surface of a magnetic material sample, at a time, by the same electron beam scanning.SOLUTION: Two electron deflectors for separating electrons discharged from a sample by the energy thereof are mounted. In the first electron deflector, only the secondary electrons of low energy, out of the electrons discharged from the sample, are separated and transported to a spin detector, and used for magnetization analysis. High energy electrons transmitted through the first electron deflector impinge on the second electron deflector, and are subjected to Auger analysis before being used for composition analysis. Consequently, magnetization and composition can be measured simultaneously by the same electron beam scanning.
摘要翻译：要解决的问题：提供一种用于测量磁性材料样品的表面上的磁化分布和组成分布的装置，同时通过相同的电子束扫描。解决方案：用于分离由样品排出的电子的两个电子偏转器安装能量。在第一电子偏转器中，只有从样品排出的电子中的低能量的二次电子被分离并传送到自旋检测器，并用于磁化分析。通过第一电子偏转器传输的高能电子撞击第二电子偏转器，并在用于组成分析之前进行俄歇分析。因此，可以通过相同的电子束扫描同时测量磁化和组成。

4. 发明专利

JP2008251525A Charged particle spin polarimeter, microscope, and photoelectron spectroscopy device 有权
标题翻译：充电颗粒旋转极化子，微结构和光电子光谱仪
公开(公告)号：JP2008251525A
公开(公告)日：2008-10-16
申请号：JP2008002093
申请日：2008-01-09
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO
IPC分类号： H01J37/244 , H01J37/28
摘要： PROBLEM TO BE SOLVED: To provide a charged particle spin polarimeter capable of resolving the magnetic moment of charged particles with high efficiency.
SOLUTION: The charged particle spin polarimeter has a pair of convex and concave magnetic poles for applying a magnetic field with gradient to an incident charged particle and a pair of flat plate electrodes to apply an electric field to a charged particle to cancel the Lorentz force that the charged particle receives from the magnetic field. The magnetic moment of a charged particle in the direction of the magnetic field is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：解决的问题：提供能够高效率地分解带电粒子的磁矩的带电粒子旋转偏振计。解决方案：带电粒子旋转偏振计具有一对用于向入射带电粒子和一对平板电极施加具有梯度的磁场的凸极和磁极，以对带电粒子施加电场以抵消带电粒子从磁场接收的洛伦兹力。带电粒子在磁场方向上的磁矩通过磁场梯度与带电粒子的磁矩之间的相互作用来解决。版权所有（C）2009，JPO＆INPIT

5. 发明专利

JP2012209005A Magnetic head and magnetic storage device 有权
标题翻译：磁头和磁储存装置
公开(公告)号：JP2012209005A
公开(公告)日：2012-10-25
申请号：JP2011075721
申请日：2011-03-30
申请人： Hitachi Ltd , Japan Atomic Energy Agency , 株式会社日立製作所 , 独立行政法人日本原子力研究開発機構
发明人： ICHIMURA MASAHIKO , SUGANO KAZUKO , HAMADA TOMOYUKI , TAKAHASHI TERUO , MAEKAWA SADAMICHI
IPC分类号： G11B5/39 , G11B5/31 , H01L43/08
摘要： PROBLEM TO BE SOLVED: To provide a magnetic head able to detect a magnetic field leaking from a recording medium without causing a sensing current to flow and able to cope with a high recording density medium.SOLUTION: The magnetic head comprises: a magnetization fixed part 51 in which magnetization is fixed; a magnetization free part 52 joined to the magnetization fixed part and changed in magnetization by an external magnetic field; and a pair of output terminals 56 and 57 connected to the magnetization fixed part and magnetization free part, one for each. A joint part 53 joining the magnetization fixed part and the magnetization free part composes a magnetic wall trap. Using a spin electromotive force resulting from the movement of a magnetic wall in the magnetization free part, a change in the external magnetic field is detected.
摘要翻译：要解决的问题：提供一种能够检测从记录介质泄漏的磁场而不引起感测电流流动并能够应对高记录密度介质的磁头。解决方案：磁头包括：磁化固定部分51，其中磁化被固定; 接合到磁化固定部分并通过外部磁场改变磁化的无磁化部分52; 以及连接到磁化固定部分和无磁化部分的一对输出端子56和57，每个输出端子56和57分别为一个。接合磁化固定部和无磁化部的接合部53构成磁性壁陷波器。使用由无磁化部分中的磁性壁移动产生的自旋电动势，可以检测外部磁场的变化。版权所有（C）2013，JPO＆INPIT

6. 发明专利

JP2008243486A Spin polarized scanning electron microscope 审中-公开
标题翻译：旋转极化扫描电子显微镜
公开(公告)号：JP2008243486A
公开(公告)日：2008-10-09
申请号：JP2007080181
申请日：2007-03-26
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO
IPC分类号： H01J37/28 , G01N23/225 , H01J37/20
摘要： PROBLEM TO BE SOLVED: To provide a device capable of executing measurement while keeping secondary electron collection efficiency and the degree of spin polarization, and applying a high magnetic field having a level not smaller than 1 kOe to a sample, in a spin polarized scanning electron microscope.
SOLUTION: This spin polarized scanning electron microscope includes: an irradiation optical system irradiating a magnetic material sample 202 with a primary electron beam emitted from an electron gun; a sample mounting means for mounting the sample thereon; a transport optical system transporting secondary electrons emitted from the sample by the irradiation of the primary electron beam; and a spin detector detecting the degree of spin polarization of the transported secondary electrons as a signal; and used for observing a magnetic domain image of the sample based on the signal related to the degree of spin polarization. The spin polarized scanning electron microscope is characterized in that the sample mounting means has magnetic field application mechanisms 203, 206 and 207 each applying a magnetic field to the sample; the magnetic application mechanisms have a magnetic shield member 203 having an opening through which the primary electron beam and the secondary electrons 210 pass; and the magnetic shield member is arranged on an electron gun-side surface of the sample to shield a stray magnetic field on the sample surface.
COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：为了提供能够在保持二次电子收集效率和自旋极化程度的同时执行测量并且在旋转中施加具有不小于1kOe的高电平的高磁场的装置偏振扫描电子显微镜。该自旋极化扫描电子显微镜包括：照射光学系统，用从电子枪发射的一次电子束照射磁性材料样品202; 用于将样品安装在其上的样品安装装置; 通过一次电子束的照射传送从样品发射的二次电子的传输光学系统; 以及检测所传输的二次电子的自旋极化程度作为信号的自旋检测器; 并用于基于与自旋极化度相关的信号观察样品的磁畴图像。自旋偏振扫描电子显微镜的特征在于，样品安装装置具有各自向样品施加磁场的磁场施加机构203,206和207; 磁性施加机构具有一个具有一个电子束和二次电子210通过的开口的磁屏蔽件203; 并且磁屏蔽构件布置在样品的电子枪侧表面上以屏蔽样品表面上的杂散磁场。版权所有（C）2009，JPO＆INPIT

7. 发明专利

JP2008218063A Transmission electron microscope 有权
标题翻译：传输电子显微镜
公开(公告)号：JP2008218063A
公开(公告)日：2008-09-18
申请号：JP2007050921
申请日：2007-03-01
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO , OSHIMA TAKU , MATSUMOTO TAKAO , NISHIDA YOICHI
IPC分类号： H01J37/26
CPC分类号： H01J37/266 , H01J37/265 , H01J2237/06383 , H01J2237/1514 , H01J2237/24557 , H01J2237/2588 , H01J2237/2614
摘要： PROBLEM TO BE SOLVED: To analyze chirality distribution and magnetic domain structure in a molecular structure of a protein and the like at a high resolution of 10 nm or less.
SOLUTION: Holography observation is conducted by using a transmission electron microscope mounting a spin polarization electron source. Phase of transmitting spin polarization electron is changed by a chirality structure in a specimen and existence of magnetization and it is observed as phase shift of an interference pattern in a holography measurement.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：待解决的问题：以10nm以下的高分辨率来分析蛋白质等的分子结构中的手性分布和磁畴结构。解决方案：使用安装自旋极化电子源的透射电子显微镜进行全息术观察。透射自旋极化电子的相位通过样品中的手性结构和磁化的存在而改变，并且在全息测量中被观察为干涉图案的相移。版权所有（C）2008，JPO＆INPIT

8. 发明专利

JP2010146968A Electron spin detector, spin polarization scanning electron microscope using the same, and spin decomposed-light electron spectroscope 有权
标题翻译：电子旋转探测器，旋转偏振扫描电子显微镜，以及旋转分解光电子光谱仪
公开(公告)号：JP2010146968A
公开(公告)日：2010-07-01
申请号：JP2008325893
申请日：2008-12-22
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO
IPC分类号： H01J37/244 , G01T1/29 , G21K1/00
CPC分类号： G01R33/093 , B82Y25/00 , G01R33/1284 , G01T1/00
摘要： PROBLEM TO BE SOLVED: To provide an electron spin detector capable of decomposing spin of an electron at high efficiency and unnecessitating acceleration of an electron beam at a 100 kV level and manufacturing at a compact size and inexpensively.
SOLUTION: The electron spin detector includes a plurality of magnetic resistance elements 504 and a deceleration lens 505 of the electron beam, and respective magnetic resistance elements 504 are arranged being inclined so as to make the electron beam spread by the deceleration lens 505 vertically incident.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种电子自旋检测器，其能够以高效率分解电子的自旋，并且不需要在100kV电平下的电子束的加速度并且以小型化和廉价地制造。解决方案：电子自旋检测器包括电子束的多个磁阻元件504和减速透镜505，并且各个磁阻元件504被布置为使得电子束被减速透镜505扩展垂直事件。版权所有（C）2010，JPO＆INPIT

9. 发明专利

JP2007080327A Defect inspecting apparatus of recording medium and defect inspecting method 审中-公开
标题翻译：记录介质的缺陷检查装置和缺陷检查方法
公开(公告)号：JP2007080327A
公开(公告)日：2007-03-29
申请号：JP2005264700
申请日：2005-09-13
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： SHIMAKURA TOMOKAZU , TAKAHASHI TERUO , TAKAHASHI YOSHIO
IPC分类号： G11B5/84 , G11B7/26
CPC分类号： G01R33/1207 , G01B15/08 , G11B5/00 , G11B5/012 , G11B5/74 , G11B5/82 , G11B7/00375 , G11B11/10582 , G11B2005/001
摘要： PROBLEM TO BE SOLVED: To provide defect inspecting technology of a recording medium in which defect can be detected at high speed and with high resolution using electron rays.
SOLUTION: The recording medium 5 is rotated by a spindle motor 6 irradiating a recording medium 5 plane with electron rays 2, secondary electrons generated from the recording medium 5 are detected by a detector 8, and ruggedness information of the recording medium plane is obtained. After obtained ruggedness information of the recording medium plane is Fourier-converted, defect is detected. A component of vapor deposition gas is accumulated at the detected defect place of the recording medium plane by introducing vapor deposition gas to the recording medium plane by a gas introducing means 9 irradiating the recording medium with electron rays, and a mark is formed.
COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供可以使用电子束以高速和高分辨率检测缺陷的记录介质的缺陷检查技术。解决方案：通过用电子束2照射记录介质5面的主轴电动机6旋转记录介质5，由检测器8检测从记录介质5产生的二次电子，记录介质平面的粗糙度信息获得。在获得记录介质平面的坚固性信息被傅里叶变换之后，检测到缺陷。通过利用电子射线照射记录介质的气体引入装置9将气相沉积气体引入记录介质平面，在检测到的记录介质平面的缺陷位置积聚气相沉积气体的成分，形成标记。版权所有（C）2007，JPO＆INPIT

10. 发明专利

JP2010003450A Scanning electron microscope 审中-公开
标题翻译：扫描电子显微镜
公开(公告)号：JP2010003450A
公开(公告)日：2010-01-07
申请号：JP2008159251
申请日：2008-06-18
申请人： Hitachi Ltd , 株式会社日立製作所
发明人： TAKAHASHI TERUO , OSHIMA TAKU
IPC分类号： H01J37/28 , G01N23/203 , H01J37/073 , H01J37/244
摘要： PROBLEM TO BE SOLVED: To provide a scanning electron microscope capable of performing a chirality distribution in a polymer structure of protein and an analysis of a magnetic domain structure at high resolution.
SOLUTION: Upon using a scanning electron microscope which is loaded with a spin-polarized electron source having a laser 201 and a semiconductor 202, a chirality structure and magnetized vector of polymer inside a testpiece 208 can be visualized by measuring intensity and the degree of spin-polarization of reflected electrons 209 from the testpiece 208 which is irradiated by a spin-polarized electron beam 203 by using a reflected electron detector 210.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供能够在蛋白质的聚合物结构中进行手性分布的扫描电子显微镜和高分辨率的磁畴结构的分析。解决方案：在使用装载有具有激光201和半导体202的自旋极化电子源的扫描电子显微镜的情况下，通过测量强度可以观察到在试件208内的聚合物的手性结构和磁化载体，通过使用反射电子检测器210由自旋极化电子束203照射的来自测试件208的反射电子209的自旋极化程度。（C）2010，JPO＆INPIT

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式