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    • 5. 发明授权
    • Intake-air control system for engine
    • 发动机进气控制系统
    • US07100547B2
    • 2006-09-05
    • US10715371
    • 2003-11-19
    • Kensuke OsamuraHiroshi IwanoKenji Oota
    • Kensuke OsamuraHiroshi IwanoKenji Oota
    • F02B75/04
    • F02B75/048F02D11/10F02D13/0253F02D15/02F02D41/0002F02D2041/001Y02T10/18Y02T10/42
    • An intake-air control system for an engine enabling an intake-air quantity and a compression ratio to be variably controlled, includes sensors detecting engine operating conditions and the compression ratio, and a control unit electronically connected to the sensors for feedback-controlling the intake-air quantity based on the compression ratio as well as the engine operating conditions, while feedback-controlling the compression ratio based on the engine operating conditions. The control unit executes phase-matching between an intake-air quantity change occurring based on intake-air quantity control and a compression ratio change occurring based on compression ratio control, considering a relatively slower response in the compression ratio change than a response in the intake-air quantity change.
    • 能够使进气量和压缩比可变地控制的用于发动机的进气控制系统包括检测发动机工作条件和压缩比的传感器,以及电连接到传感器的控制单元,用于反馈控制进气口 基于压缩比和发动机工作条件的空气量,同时基于发动机工作条件反馈控制压缩比。 考虑到在压缩比变化中的反应相对较慢,在进气压力比的变化中,控制单元执行基于进气量控制而发生的进气量变化和基于压缩比控制的压缩比变化之间的相位匹配 - 空气量变化。
    • 7. 发明授权
    • Pressed-contact type semiconductor device
    • 压接式半导体器件
    • US07301178B2
    • 2007-11-27
    • US11212602
    • 2005-08-29
    • Yoshihiro YamaguchiKenji Oota
    • Yoshihiro YamaguchiKenji Oota
    • H01L29/74
    • H01L29/0661H01L24/72H01L29/0615H01L29/0657H01L29/32H01L29/74H01L2924/0102H01L2924/1301H01L2924/00
    • A P++-type first diffusion layer is formed by diffusing P-type impurities on a front side of an N−-type semiconductor substrate, and an N-type fourth diffusion layer which is shallower than the first diffusion layer is formed by diffusing N-type impurities on the front side, and a P-type second diffusion layer is locally formed in a ring-shape so as to be exposed on the lateral side by diffusing P-type impurities on the back side, and P-type impurities are diffused on the back side of the substrate and a P+-type third diffusion layer is locally formed so as to be distributed inward from the second diffusion layer and not to be exposed to the lateral side, and the P-type second diffusion layer and the P+-type third diffusion layer are formed in the two-stage structure, thereby various characteristics can be improved.
    • AP ++类型的第一扩散层是通过在N +型半导体衬底的正面扩散P型杂质形成的,N型第四扩散层 通过在前侧扩散N型杂质而形成比第一扩散层浅的层,并且P型第二扩散层局部形成为环状,以便通过扩散P而暴露在侧面 型杂质,P型杂质扩散到基板的背面,局部地形成P +型第三扩散层,以从第二层向内分布 扩散层并且不暴露于侧面,并且P型第二扩散层和P + +型第三扩散层形成在两级结构中,因此可以有各种特性 改进。