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1. 发明申请

US20080011947A1 Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus 失效
标题翻译：半导体衬底，衬底检查方法，半导体器件制造方法和检查装置
公开(公告)号：US20080011947A1
公开(公告)日：2008-01-17
申请号：US11730818
申请日：2007-04-04
申请人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
发明人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
IPC分类号： G01N23/00 , H01L21/66
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor substrate inspection method includes: generating a charged particle beam, and irradiating the charged particle beam to a semiconductor substrate in which contact wiring lines are formed on a surface thereof, the contact wiring lines of the semiconductor substrate being designed to alternately repeat in a plane view so that one of the adjacent contact wiring lines is grounded to the semiconductor substrate and the other of the adjacent contact wiring lines is insulated from the semiconductor substrate; detecting at least one of a secondary charged particle, a reflected charged particle and a back scattering charged particle generated from the surface of the semiconductor substrate to acquire a signal; generating an inspection image with the signal, the inspection image showing a state of the surface of the semiconductor substrate; and judging whether the semiconductor substrate is good or bad from a difference of brightness in the inspection image obtained from the surfaces of the adjacent contact wiring lines.
摘要翻译：半导体衬底检查方法包括：产生带电粒子束，并将带电粒子束照射到其表面上形成有接触布线的半导体衬底，半导体衬底的接触布线被设计成在平面图，使得相邻的接触布线中的一个接地到半导体基板，并且相邻的接触布线中的另一个与半导体基板绝缘; 检测从半导体衬底的表面产生的二次带电粒子，反射带电粒子和反向散射带电粒子中的至少一个，以获得信号; 产生具有信号的检查图像，检查图像显示半导体基板的表面的状态; 以及从相邻接触布线的表面获得的检查图像中的亮度差来判断半导体基板是否良好。

2. 发明授权

US07973281B2 Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus 失效
标题翻译：半导体衬底，衬底检查方法，半导体器件制造方法和检查装置
公开(公告)号：US07973281B2
公开(公告)日：2011-07-05
申请号：US12458343
申请日：2009-07-08
申请人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
发明人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
IPC分类号： G01N23/00
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor substrate inspection method includes: generating a charged particle beam, and irradiating the charged particle beam to a semiconductor substrate in which contact wiring lines are formed on a surface thereof, the contact wiring lines of the semiconductor substrate being designed to alternately repeat in a plane view so that one of the adjacent contact wiring lines is grounded to the semiconductor substrate and the other of the adjacent contact wiring lines is insulated from the semiconductor substrate; detecting at least one of a secondary charged particle, a reflected charged particle and a back scattering charged particle generated from the surface of the semiconductor substrate to acquire a signal; generating an inspection image with the signal, the inspection image showing a state of the surface of the semiconductor substrate; and judging whether the semiconductor substrate is good or bad from a difference of brightness in the inspection image obtained from the surfaces of the adjacent contact wiring lines.
摘要翻译：半导体衬底检查方法包括：产生带电粒子束，并将带电粒子束照射到其表面上形成有接触布线的半导体衬底，半导体衬底的接触布线被设计成在平面图，使得相邻的接触布线中的一个接地到半导体基板，并且相邻的接触布线中的另一个与半导体基板绝缘; 检测从半导体衬底的表面产生的二次带电粒子，反射带电粒子和反向散射带电粒子中的至少一个，以获得信号; 产生具有信号的检查图像，检查图像显示半导体基板的表面的状态; 以及从相邻接触布线的表面获得的检查图像中的亮度差来判断半导体基板是否良好。

3. 发明授权

US07573066B2 Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus 失效
标题翻译：半导体衬底，衬底检查方法，半导体器件制造方法和检查装置
公开(公告)号：US07573066B2
公开(公告)日：2009-08-11
申请号：US11730818
申请日：2007-04-04
申请人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
发明人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
IPC分类号： H01L23/58
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor substrate inspection method includes: generating a charged particle beam, and irradiating the charged particle beam to a semiconductor substrate in which contact wiring lines are formed on a surface thereof, the contact wiring lines of the semiconductor substrate being designed to alternately repeat in a plane view so that one of the adjacent contact wiring lines is grounded to the semiconductor substrate and the other of the adjacent contact wiring lines is insulated from the semiconductor substrate; detecting at least one of a secondary charged particle, a reflected charged particle and a back scattering charged particle generated from the surface of the semiconductor substrate to acquire a signal; generating an inspection image with the signal, the inspection image showing a state of the surface of the semiconductor substrate; and judging whether the semiconductor substrate is good or bad from a difference of brightness in the inspection image obtained from the surfaces of the adjacent contact wiring lines.
摘要翻译：半导体衬底检查方法包括：产生带电粒子束，并将带电粒子束照射到其表面上形成有接触布线的半导体衬底，半导体衬底的接触布线被设计成在平面图，使得相邻的接触布线中的一个接地到半导体基板，并且相邻的接触布线中的另一个与半导体基板绝缘; 检测从半导体衬底的表面产生的二次带电粒子，反射带电粒子和反向散射带电粒子中的至少一个，以获得信号; 产生具有信号的检查图像，检查图像显示半导体基板的表面的状态; 以及从相邻接触布线的表面获得的检查图像中的亮度差来判断半导体基板是否良好。

4. 发明申请

US20090272901A1 Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus 失效
公开(公告)号：US20090272901A1
公开(公告)日：2009-11-05
申请号：US12458343
申请日：2009-07-08
申请人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
发明人： Hiroyuki Hayashi , Takamitsu Nagai , Tomonobu Noda , Kenichi Kadota , Hisaki Kozaki
IPC分类号： G01N23/203 , H01L21/66
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： A semiconductor substrate inspection method includes: generating a charged particle beam, and irradiating the charged particle beam to a semiconductor substrate in which contact wiring lines are formed on a surface thereof, the contact wiring lines of the semiconductor substrate being designed to alternately repeat in a plane view so that one of the adjacent contact wiring lines is grounded to the semiconductor substrate and the other of the adjacent contact wiring lines is insulated from the semiconductor substrate; detecting at least one of a secondary charged particle, a reflected charged particle and a back scattering charged particle generated from the surface of the semiconductor substrate to acquire a signal; generating an inspection image with the signal, the inspection image showing a state of the surface of the semiconductor substrate; and judging whether the semiconductor substrate is good or bad from a difference of brightness in the inspection image obtained from the surfaces of the adjacent contact wiring lines.

5. 发明授权

US09542131B2 Image forming apparatus for retrieving print data using an address of the stored print data 有权
标题翻译：图像形成装置，用于使用所存储的打印数据的地址来检索打印数据
公开(公告)号：US09542131B2
公开(公告)日：2017-01-10
申请号：US14038103
申请日：2013-09-26
申请人： Hiroyuki Hayashi
发明人： Hiroyuki Hayashi
IPC分类号： G06F3/12
CPC分类号： G06F3/122 , G06F3/1236 , G06F3/1271 , G06F3/1288
摘要： A printing apparatus which communicates with a data providing apparatus includes a printing mechanism which executes a printing operation. The printing apparatus receives a number of print copies, and acquires print data from the data providing apparatus by executing a request processing of transmitting to the data providing apparatus a data request of the print data, and a reception processing of receiving the print data from the data providing apparatus. When executing a printing operation of N copies (N is an integer of 2 or larger), the acquiring executes, for each copy, the request processing and the reception processing to acquire the print data from the data providing apparatus while executing the request processing of the print data of M-th copy (M is an integer of 2 or larger and N or smaller) after the reception processing of the print data of (M−1)-th copy is completed.
摘要翻译：与数据提供装置通信的打印装置包括执行打印操作的打印机构。打印装置接收多个打印副本，并通过执行向数据提供装置发送打印数据的数据请求的请求处理从数据提供装置获取打印数据，以及从打印数据接收打印数据的接收处理数据提供装置。当执行N个副本的打印操作（N是2或更大的整数）时，对于每个副本，获取执行请求处理和接收处理，以在执行请求处理的请求处理期间从数据提供装置获取打印数据第（M-1）次复印的打印数据的接收处理完成后，第M个拷贝的打印数据（M为2以上且N以下的整数）。

6. 发明授权

US08748437B2 Crystal of 2-(3,4 dichlorobenzyl)-5-methyl-4-oxo-3,4-dihydrothien[2,3-D]pyrimidine-6-carboxylic acid 有权
标题翻译： 2-（3,4-二氯苄基）-5-甲基-4-氧代-3,4-二氢噻吩并[2,3-D]嘧啶-6-甲酸
公开(公告)号：US08748437B2
公开(公告)日：2014-06-10
申请号：US13700935
申请日：2011-05-31
申请人： Hiroyuki Hayashi , Takayoshi Nakagawa , Koichi Miyazaki
发明人： Hiroyuki Hayashi , Takayoshi Nakagawa , Koichi Miyazaki
IPC分类号： A61K31/519
CPC分类号： C07D495/04 , A61K31/519
摘要： The invention provides a crystal of 2-(3,4-dichlorobenzyl)-5-methyl-4-oxo-3,4-dihydrothieno[2,3-d]pyrimidine-6-carboxylic acid (which has the chemical structure shown below) and a mixed crystal comprising such a crystal. The invention also provides methods of producing such crystals, pharmaceutical compositions comprising such crystals, and methods of modulating phosphodiesterase-9 activity and treating disorders such as overactive bladder syndrome by administration of an effective amount of the crystals.
摘要翻译：本发明提供2-（3,4-二氯苄基）-5-甲基-4-氧代-3,4-二氢噻吩并[2,3-d]嘧啶-6-甲酸（其化学结构如下所示））和包含这种晶体的混合晶体。本发明还提供了生产这种晶体的方法，包含这种晶体的药物组合物，以及通过施用有效量的晶体来调节磷酸二酯酶-9活性和治疗诸如膀胱过度活动症综合征的疾病的方法。

7. 发明授权

US08604432B2 Defect inspection apparatus and defect inspection method 有权
标题翻译：缺陷检查装置和缺陷检查方法
公开(公告)号：US08604432B2
公开(公告)日：2013-12-10
申请号：US13600980
申请日：2012-08-31
申请人： Hiroyuki Hayashi
发明人： Hiroyuki Hayashi
IPC分类号： H01J37/28
CPC分类号： H01J37/02 , H01J37/265 , H01J37/28 , H01J2237/2446 , H01J2237/24485 , H01J2237/24564
摘要： In accordance with an embodiment, a defect inspection apparatus includes a charged beam irradiation unit, a detection unit, an energy filter, and an inspection unit. The charged beam irradiation unit generates a charged beam and irradiates a sample including a pattern as an inspection target thereon with the generated charged beam. The detection unit detects secondary charged particles or reflected charged particles generated from the sample by irradiation of the charged beam and outputs a signal. The energy filter is arranged between the detection unit and the sample to selectively allow the secondary charged particles or the reflected charged particles with energy associated with an applied voltage to pass therethrough. The inspection unit applies voltages different from each other to the energy filter and outputs information concerning a defect of the pattern from an intensity difference between signals obtained under application voltage different from each other.
摘要翻译：根据实施例，缺陷检查装置包括带电束照射单元，检测单元，能量过滤器和检查单元。充电光束照射单元产生带电光束，并且利用所产生的带电束将包括作为检查对象的图案的样本照射。检测单元通过照射带电波束来检测从样品产生的二次带电粒子或反射带电粒子，并输出信号。能量过滤器布置在检测单元和样品之间，以选择性地允许具有与施加电压相关联的能量通过的二次带电粒子或反射带电粒子。检查单元向能量滤波器施加彼此不同的电压，并且从根据施加电压彼此不同获得的信号之间的强度差输出关于图案的缺陷的信息。

8. 发明申请

US20130123279A1 CRYSTAL OF THIENOPYRIMIDINE DERIVATIVE 有权
标题翻译：三苯甲基衍生物的晶体
公开(公告)号：US20130123279A1
公开(公告)日：2013-05-16
申请号：US13700935
申请日：2011-05-31
申请人： Hiroyuki Hayashi , Takayoshi Nakagawa , Koichi Miyazaki
发明人： Hiroyuki Hayashi , Takayoshi Nakagawa , Koichi Miyazaki
IPC分类号： A61K31/519 , C07D495/04
CPC分类号： C07D495/04 , A61K31/519
摘要： Crystals are obtained by heating an aqueous suspension of 2-(3,4-dichlorobenzyl)-5-methyl-4-oxo-3,4-dihydrothieno[2,3-d]pyrimidine-6-carboxylic acid. Novel crystals are obtained by adjusting the heating temperature and/or duration.
摘要翻译：通过加热2-（3,4-二氯苄基）-5-甲基-4-氧代-3,4-二氢噻吩并[2,3-d]嘧啶-6-甲酸的水悬浮液获得晶体。通过调节加热温度和/或持续时间获得新的晶体。

9. 发明授权

US08348529B2 Ink ribbon cassette and apparatus that uses the ink ribbon cassette 有权
标题翻译：墨带盒和使用色带盒的设备
公开(公告)号：US08348529B2
公开(公告)日：2013-01-08
申请号：US12128912
申请日：2008-05-29
申请人： Hiroyuki Hayashi
发明人： Hiroyuki Hayashi
IPC分类号： B41J35/28 , B41J32/00 , B41J32/02 , B41J33/26
CPC分类号： B41J33/10 , B41J32/02
摘要： An ink ribbon cassette includes first and second rotatable bodies that rotate with an ink ribbon held between the rotatable bodies in sandwiched relation. The second rotatable body includes a hole through which a shaft extends such that the second rotatable body is rotatably supported on the shaft. The shaft may have a circumferential surface conical toward the free end, and the hole may be a conical hole into which the conical shaft extends. The shaft may include a plurality of cylindrical shaft portions that are in line with one another and that have different diameters. The second rotatable body is formed with a plurality of cylindrical hole portions having different diameters corresponding to the cylindrical shaft portions such that the second rotatable body is rotatably supported on the shaft.
摘要翻译：墨带盒包括第一和第二可旋转体，其以夹持在可转动体之间的墨带旋转。第二旋转体包括孔，轴延伸穿过该孔，使得第二可旋转体可旋转地支撑在轴上。轴可以具有朝向自由端圆锥形的圆周表面，并且孔可以是锥形轴延伸到其中的锥形孔。轴可以包括彼此成直角且具有不同直径的多个圆柱形轴部。第二旋转体形成有多个圆柱形孔部分，其具有与圆柱形轴部分对应的不同直径的圆柱形孔部分，使得第二可旋转体可旋转地支撑在轴上。

10. 发明授权

US08040922B2 Apparatus and method of frame synchronization in broad band wireless communication systems 有权
标题翻译：宽带无线通信系统中帧同步的装置和方法
公开(公告)号：US08040922B2
公开(公告)日：2011-10-18
申请号：US12044122
申请日：2008-03-07
申请人： Xin Wang , Yuuta Nakaya , Syuusaku Suzuki , Michiharu Nakamura , JianMin Zhou , Hiroyuki Hayashi
发明人： Xin Wang , Yuuta Nakaya , Syuusaku Suzuki , Michiharu Nakamura , JianMin Zhou , Hiroyuki Hayashi
IPC分类号： H04J3/06
CPC分类号： H04L27/2656 , H04L27/2676
摘要： The present invention relates to an apparatus and method of frame synchronization in broad band wireless communication systems. In an apparatus of frame synchronization in a mobile station, a time variant phase rotation compensator eliminates time variant phase rotation carried in received signals by conjugated multiplication between adjacent signal samples. Then, the processed signal is fed into a delay correlator to calculate a plurality of correlations between two successive frames. A local power calculator acquires an average power of several symbols centered on delayed correlation values. A normalizer normalizes the delayed correlation values with a local average power corresponding to the delayed correlation values. A maximum value detector selects the maximum value from normalized correlation values to trigger frame synchronizing and timing signals.
摘要翻译：本发明涉及宽带无线通信系统中帧同步的装置和方法。在移动台中的帧同步装置中，时变相位旋转补偿器通过相邻信号样本之间的共轭乘法来消除接收信号中携带的时变相位旋转。然后，将经处理的信号馈送到延迟相关器中以计算两个连续帧之间的多个相关性。局部功率计算器以延迟相关值为中心获取几个符号的平均功率。归一化器用对应于延迟相关值的局部平均功率来对延迟的相关值进行归一化。最大值检测器从归一化相关值中选择最大值以触发帧同步和定时信号。

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